{"id":"https://openalex.org/W2520331352","doi":"https://doi.org/10.1007/s10836-016-5613-1","title":"A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors","display_name":"A Novel Compact Model for On-Chip Vertically-Coiled Spiral Inductors","publication_year":2016,"publication_date":"2016-09-15","ids":{"openalex":"https://openalex.org/W2520331352","doi":"https://doi.org/10.1007/s10836-016-5613-1","mag":"2520331352"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-016-5613-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5613-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080483622","display_name":"Bing Hou","orcid":null},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Hou","raw_affiliation_strings":["School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100392622","display_name":"Tong Liu","orcid":"https://orcid.org/0000-0001-8489-0466"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tong Liu","raw_affiliation_strings":["School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100361964","display_name":"Jun Liu","orcid":"https://orcid.org/0000-0002-8627-5085"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Liu","raw_affiliation_strings":["Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory for RF Circuits and Systems of Ministry of Education, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101455679","display_name":"Junli Chen","orcid":"https://orcid.org/0000-0002-0271-4408"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junli Chen","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100300214","display_name":"Faxin Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Faxin Yu","raw_affiliation_strings":["School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100350664","display_name":"Wenbo Wang","orcid":"https://orcid.org/0000-0002-0911-3189"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenbo Wang","raw_affiliation_strings":["School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100392622"],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08813333,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"32","issue":"5","first_page":"649","last_page":"652"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.8088645339012146},{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.7783697843551636},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6742787957191467},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.669357419013977},{"id":"https://openalex.org/keywords/spiral","display_name":"Spiral (railway)","score":0.5562548041343689},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.48753759264945984},{"id":"https://openalex.org/keywords/ideal","display_name":"Ideal (ethics)","score":0.4417390823364258},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.43461477756500244},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4191797971725464},{"id":"https://openalex.org/keywords/skin-effect","display_name":"Skin effect","score":0.41515424847602844},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38653185963630676},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36511462926864624},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3619083762168884},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3311789035797119},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.09998580813407898}],"concepts":[{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.8088645339012146},{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.7783697843551636},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6742787957191467},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.669357419013977},{"id":"https://openalex.org/C174128100","wikidata":"https://www.wikidata.org/wiki/Q846907","display_name":"Spiral (railway)","level":2,"score":0.5562548041343689},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.48753759264945984},{"id":"https://openalex.org/C2776639384","wikidata":"https://www.wikidata.org/wiki/Q840396","display_name":"Ideal (ethics)","level":2,"score":0.4417390823364258},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.43461477756500244},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4191797971725464},{"id":"https://openalex.org/C151482245","wikidata":"https://www.wikidata.org/wiki/Q664150","display_name":"Skin effect","level":2,"score":0.41515424847602844},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38653185963630676},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36511462926864624},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3619083762168884},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3311789035797119},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09998580813407898},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-016-5613-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5613-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5600000023841858,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G7245897165","display_name":null,"funder_award_id":"61372021 and 61331006","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1968107162","https://openalex.org/W2034424231","https://openalex.org/W2051808421","https://openalex.org/W2101269566","https://openalex.org/W2140624879","https://openalex.org/W2151585818","https://openalex.org/W2153600098","https://openalex.org/W2160428624","https://openalex.org/W2165970413"],"related_works":["https://openalex.org/W1905216755","https://openalex.org/W2117417104","https://openalex.org/W3200817179","https://openalex.org/W2534619547","https://openalex.org/W1923048618","https://openalex.org/W1960166976","https://openalex.org/W2104218257","https://openalex.org/W2789898315","https://openalex.org/W2546876865","https://openalex.org/W2544253272"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}