{"id":"https://openalex.org/W2462720649","doi":"https://doi.org/10.1007/s10836-016-5599-8","title":"A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs","display_name":"A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs","publication_year":2016,"publication_date":"2016-07-11","ids":{"openalex":"https://openalex.org/W2462720649","doi":"https://doi.org/10.1007/s10836-016-5599-8","mag":"2462720649"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-016-5599-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5599-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-01447813/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Guillaume Renaud","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Guillaume Renaud","raw_affiliation_strings":["Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085204712","display_name":"Manuel J. Barrag\u00e1n","orcid":"https://orcid.org/0000-0003-0187-604X"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Manuel J. Barragan","raw_affiliation_strings":["Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111137737","display_name":"Asma Laraba","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Asma Laraba","raw_affiliation_strings":["Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091734149","display_name":"Haralampos\u2010G. Stratigopoulos","orcid":"https://orcid.org/0000-0002-9943-5607"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Haralampos-G. Stratigopoulos","raw_affiliation_strings":["Sorbonne Universit\u00e9s, UPMC Univ. Paris 06 CNRS, LIP6, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sorbonne Universit\u00e9s, UPMC Univ. Paris 06 CNRS, LIP6, Paris, France","institution_ids":["https://openalex.org/I39804081","https://openalex.org/I204730241","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061963866","display_name":"Salvador Mir","orcid":"https://orcid.org/0000-0001-9911-8946"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Salvador Mir","raw_affiliation_strings":["Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Grenoble-Alpes, CNRS, TIMA, Grenoble, France","institution_ids":["https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112180508","display_name":"Herv\u00e9 Le-Gall","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Herv\u00e9 Le-Gall","raw_affiliation_strings":["STMicroelectronics, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Grenoble, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083393285","display_name":"Herv\u00e9 Naudet","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Herv\u00e9 Naudet","raw_affiliation_strings":["STMicroelectronics, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Grenoble, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I899635006"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.5617,"has_fulltext":true,"cited_by_count":14,"citation_normalized_percentile":{"value":0.88980967,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"32","issue":"4","first_page":"407","last_page":"421"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6259147524833679},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5818008780479431},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.5750126838684082},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5563282370567322},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5366086363792419},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4891207814216614},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.44350698590278625},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.432882159948349},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4016282260417938},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3986906111240387},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1955738365650177},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0933971107006073}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6259147524833679},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5818008780479431},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.5750126838684082},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5563282370567322},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5366086363792419},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4891207814216614},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44350698590278625},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.432882159948349},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4016282260417938},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3986906111240387},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1955738365650177},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0933971107006073},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-016-5599-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5599-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01447813v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01447813","pdf_url":"https://hal.science/hal-01447813/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2016, pp.407-421. ⟨10.1007/s10836-016-5599-8⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-01447813v1","is_oa":true,"landing_page_url":"https://hal.science/hal-01447813","pdf_url":"https://hal.science/hal-01447813/document","source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2016, pp.407-421. ⟨10.1007/s10836-016-5599-8⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.46000000834465027,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2462720649.pdf","grobid_xml":"https://content.openalex.org/works/W2462720649.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1497125726","https://openalex.org/W1930963782","https://openalex.org/W1998816746","https://openalex.org/W2003534122","https://openalex.org/W2004016279","https://openalex.org/W2014022260","https://openalex.org/W2034467026","https://openalex.org/W2056737996","https://openalex.org/W2065670053","https://openalex.org/W2083193340","https://openalex.org/W2111032961","https://openalex.org/W2112611349","https://openalex.org/W2119385576","https://openalex.org/W2124912253","https://openalex.org/W2128726980","https://openalex.org/W2129523661","https://openalex.org/W2131477866","https://openalex.org/W2134404631","https://openalex.org/W2137446533","https://openalex.org/W2138745870","https://openalex.org/W2167873176","https://openalex.org/W2170274989","https://openalex.org/W2187548090","https://openalex.org/W2578010358","https://openalex.org/W4245334825"],"related_works":["https://openalex.org/W2366352762","https://openalex.org/W2613964090","https://openalex.org/W2380425739","https://openalex.org/W2081322886","https://openalex.org/W2349324463","https://openalex.org/W1988313539","https://openalex.org/W2029980887","https://openalex.org/W2027541371","https://openalex.org/W2380535488","https://openalex.org/W2168668096"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3}],"updated_date":"2026-05-08T15:41:06.802602","created_date":"2025-10-10T00:00:00"}