{"id":"https://openalex.org/W2306125761","doi":"https://doi.org/10.1007/s10836-016-5579-z","title":"Exploration of Noise Impact on Integrated Bulk Current Sensors","display_name":"Exploration of Noise Impact on Integrated Bulk Current Sensors","publication_year":2016,"publication_date":"2016-03-16","ids":{"openalex":"https://openalex.org/W2306125761","doi":"https://doi.org/10.1007/s10836-016-5579-z","mag":"2306125761"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-016-5579-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5579-z","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111472853","display_name":"Jo\u00e3o Guilherme Mour\u00e3o Melo","orcid":null},"institutions":[{"id":"https://openalex.org/I110200422","display_name":"Universidade Federal de Minas Gerais","ror":"https://ror.org/0176yjw32","country_code":"BR","type":"education","lineage":["https://openalex.org/I110200422"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jo\u00e3o Guilherme Mour\u00e3o Melo","raw_affiliation_strings":["School of Engineering, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil"],"affiliations":[{"raw_affiliation_string":"School of Engineering, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil","institution_ids":["https://openalex.org/I110200422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056538809","display_name":"Frank Sill Torres","orcid":"https://orcid.org/0000-0002-4028-455X"},"institutions":[{"id":"https://openalex.org/I110200422","display_name":"Universidade Federal de Minas Gerais","ror":"https://ror.org/0176yjw32","country_code":"BR","type":"education","lineage":["https://openalex.org/I110200422"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Frank Sill Torres","raw_affiliation_strings":["Department of Electronic Engineering, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Universidade Federal de Minas Gerais, Belo Horizonte, MG, Brazil","institution_ids":["https://openalex.org/I110200422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5056538809"],"corresponding_institution_ids":["https://openalex.org/I110200422"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.6764,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.85141437,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"32","issue":"2","first_page":"163","last_page":"173"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.7920732498168945},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6592745184898376},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5765982866287231},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5345904231071472},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5008463859558105},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4922708570957184},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.4712769389152527},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.43775659799575806},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3687368333339691},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2922326326370239},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.22897088527679443},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06981092691421509}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.7920732498168945},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6592745184898376},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5765982866287231},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5345904231071472},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5008463859558105},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4922708570957184},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.4712769389152527},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.43775659799575806},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3687368333339691},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2922326326370239},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.22897088527679443},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06981092691421509},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-016-5579-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5579-z","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6899999976158142}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321091","display_name":"Coordena\u00e7\u00e3o de Aperfei\u00e7oamento de Pessoal de N\u00edvel Superior","ror":"https://ror.org/00x0ma614"},{"id":"https://openalex.org/F4320322025","display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","ror":"https://ror.org/03swz6y49"},{"id":"https://openalex.org/F4320322980","display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de Minas Gerais","ror":"https://ror.org/00nc55f03"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W186958027","https://openalex.org/W1502390497","https://openalex.org/W1506104247","https://openalex.org/W1588072761","https://openalex.org/W1975436932","https://openalex.org/W1999630800","https://openalex.org/W2023669931","https://openalex.org/W2025761671","https://openalex.org/W2031040566","https://openalex.org/W2032888474","https://openalex.org/W2034077488","https://openalex.org/W2073772173","https://openalex.org/W2096912695","https://openalex.org/W2096927458","https://openalex.org/W2098098175","https://openalex.org/W2098339315","https://openalex.org/W2099569658","https://openalex.org/W2101838114","https://openalex.org/W2104086123","https://openalex.org/W2104415993","https://openalex.org/W2105192091","https://openalex.org/W2111748847","https://openalex.org/W2120185818","https://openalex.org/W2128202365","https://openalex.org/W2133179629","https://openalex.org/W2140298169","https://openalex.org/W2140961038","https://openalex.org/W2145724084","https://openalex.org/W2159098377","https://openalex.org/W2160988214","https://openalex.org/W2163493261","https://openalex.org/W2164034450","https://openalex.org/W2165682645","https://openalex.org/W2171479573","https://openalex.org/W2322884897","https://openalex.org/W2344479570","https://openalex.org/W2904652968","https://openalex.org/W3149410719","https://openalex.org/W4235378497","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W3215142653","https://openalex.org/W1487051936"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":5},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}