{"id":"https://openalex.org/W2295947403","doi":"https://doi.org/10.1007/s10836-016-5576-2","title":"Applications of Mixed-Signal Technology in Digital Testing","display_name":"Applications of Mixed-Signal Technology in Digital Testing","publication_year":2016,"publication_date":"2016-03-11","ids":{"openalex":"https://openalex.org/W2295947403","doi":"https://doi.org/10.1007/s10836-016-5576-2","mag":"2295947403"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-016-5576-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5576-2","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057604946","display_name":"Baohu Li","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Baohu Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vishwani D. Agrawal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5057604946"],"corresponding_institution_ids":["https://openalex.org/I82497590"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6434,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.65692223,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"32","issue":"2","first_page":"209","last_page":"225"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6895684003829956},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.6008524894714355},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5345157384872437},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.45878249406814575},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4578200578689575},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.45402342081069946},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4457458257675171},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.44228219985961914},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4305571913719177},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.42521989345550537},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.416370153427124},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38813620805740356},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.3514343202114105},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3497233986854553},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34594637155532837},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.25011277198791504},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.24079465866088867},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23029440641403198},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1422942876815796}],"concepts":[{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6895684003829956},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.6008524894714355},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5345157384872437},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.45878249406814575},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4578200578689575},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.45402342081069946},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4457458257675171},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.44228219985961914},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4305571913719177},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.42521989345550537},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.416370153427124},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38813620805740356},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.3514343202114105},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3497233986854553},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34594637155532837},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.25011277198791504},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.24079465866088867},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23029440641403198},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1422942876815796},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-016-5576-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-016-5576-2","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7369377914","display_name":null,"funder_award_id":"CCF-1116213","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1497660117","https://openalex.org/W1516448540","https://openalex.org/W1540425631","https://openalex.org/W1562306170","https://openalex.org/W1594382757","https://openalex.org/W1595368737","https://openalex.org/W1607330214","https://openalex.org/W1766560026","https://openalex.org/W1964172557","https://openalex.org/W1988362789","https://openalex.org/W1994637712","https://openalex.org/W2002579833","https://openalex.org/W2014759009","https://openalex.org/W2048968819","https://openalex.org/W2089253234","https://openalex.org/W2101900253","https://openalex.org/W2103274289","https://openalex.org/W2106186395","https://openalex.org/W2108281294","https://openalex.org/W2110267158","https://openalex.org/W2112041422","https://openalex.org/W2114584148","https://openalex.org/W2122868642","https://openalex.org/W2127184179","https://openalex.org/W2133241273","https://openalex.org/W2135547345","https://openalex.org/W2135627440","https://openalex.org/W2138645566","https://openalex.org/W2139528262","https://openalex.org/W3014325818","https://openalex.org/W4210799017"],"related_works":["https://openalex.org/W4245311057","https://openalex.org/W311918050","https://openalex.org/W2117789795","https://openalex.org/W2543176856","https://openalex.org/W2146381271","https://openalex.org/W2061326683","https://openalex.org/W2989178840","https://openalex.org/W565729072","https://openalex.org/W2273869358","https://openalex.org/W138400556"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}