{"id":"https://openalex.org/W2293212301","doi":"https://doi.org/10.1007/s10836-015-5551-3","title":"Double Node Upsets Hardened Latch Circuits","display_name":"Double Node Upsets Hardened Latch Circuits","publication_year":2015,"publication_date":"2015-11-17","ids":{"openalex":"https://openalex.org/W2293212301","doi":"https://doi.org/10.1007/s10836-015-5551-3","mag":"2293212301"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-015-5551-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-015-5551-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100672528","display_name":"Yuan\u2010Qing Li","orcid":"https://orcid.org/0000-0002-0478-0177"},"institutions":[{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Yuanqing Li","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100408835","display_name":"Haibin Wang","orcid":"https://orcid.org/0000-0002-9269-1229"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]},{"id":"https://openalex.org/I32625721","display_name":"University of Saskatchewan","ror":"https://ror.org/010x8gc63","country_code":"CA","type":"education","lineage":["https://openalex.org/I32625721"]}],"countries":["CA","CN"],"is_corresponding":false,"raw_author_name":"Haibin Wang","raw_affiliation_strings":["College of IOT Engineering, Hohai University, Changzhou, China","Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada"],"affiliations":[{"raw_affiliation_string":"College of IOT Engineering, Hohai University, Changzhou, China","institution_ids":["https://openalex.org/I163340411"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Saskatchewan, Saskatoon, Canada","institution_ids":["https://openalex.org/I32625721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075062667","display_name":"Suying Yao","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Suying Yao","raw_affiliation_strings":["School of Electronic Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015450464","display_name":"Xi Long Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Yan","raw_affiliation_strings":["School of Electronic Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018662039","display_name":"Zhiyuan Gao","orcid":"https://orcid.org/0000-0001-6708-6222"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyuan Gao","raw_affiliation_strings":["School of Electronic Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051428047","display_name":"Jiangtao Xu","orcid":"https://orcid.org/0000-0003-1162-6562"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiangtao Xu","raw_affiliation_strings":["School of Electronic Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100672528"],"corresponding_institution_ids":["https://openalex.org/I32625721"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.6022,"has_fulltext":false,"cited_by_count":75,"citation_normalized_percentile":{"value":0.9080084,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"31","issue":"5-6","first_page":"537","last_page":"548"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.7866861820220947},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.76450514793396},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.61396324634552},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5246603488922119},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.45452749729156494},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4543076157569885},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4521676301956177},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39341118931770325},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32046815752983093},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.25151586532592773},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2462921440601349}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7866861820220947},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.76450514793396},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.61396324634552},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5246603488922119},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.45452749729156494},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4543076157569885},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4521676301956177},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39341118931770325},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32046815752983093},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.25151586532592773},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2462921440601349},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-015-5551-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-015-5551-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8870083359","display_name":null,"funder_award_id":"61504038","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320310709","display_name":"CMC Microsystems","ror":"https://ror.org/03k70ea39"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1518236483","https://openalex.org/W1559826639","https://openalex.org/W1968055202","https://openalex.org/W1981970801","https://openalex.org/W1986059861","https://openalex.org/W2015524290","https://openalex.org/W2056721615","https://openalex.org/W2062980181","https://openalex.org/W2071068906","https://openalex.org/W2074083468","https://openalex.org/W2083664225","https://openalex.org/W2100843674","https://openalex.org/W2101863316","https://openalex.org/W2122954231","https://openalex.org/W2122995125","https://openalex.org/W2129040085","https://openalex.org/W2131171880","https://openalex.org/W2143328585","https://openalex.org/W2151104031","https://openalex.org/W2154691889","https://openalex.org/W2159575344","https://openalex.org/W2159674660","https://openalex.org/W2161549238","https://openalex.org/W2166752839"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W1523508240","https://openalex.org/W2622269177","https://openalex.org/W2086616086","https://openalex.org/W2978528242","https://openalex.org/W2165400042","https://openalex.org/W2160088500","https://openalex.org/W3208260600","https://openalex.org/W2012451149","https://openalex.org/W3097930358"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":14},{"year":2020,"cited_by_count":11},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}