{"id":"https://openalex.org/W2223630583","doi":"https://doi.org/10.1007/s10836-015-5534-4","title":"Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors","display_name":"Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors","publication_year":2015,"publication_date":"2015-08-01","ids":{"openalex":"https://openalex.org/W2223630583","doi":"https://doi.org/10.1007/s10836-015-5534-4","mag":"2223630583"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-015-5534-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-015-5534-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031947523","display_name":"Athanasios Dimakos","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Athanasios Dimakos","raw_affiliation_strings":["CNRS, TIMA, 38000, Grenoble, France","Universit\u00e9 Grenoble Alpes, TIMA, 38000, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, TIMA, 38000, Grenoble, France","institution_ids":["https://openalex.org/I4210087012","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Universit\u00e9 Grenoble Alpes, TIMA, 38000, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091734149","display_name":"Haralampos\u2010G. Stratigopoulos","orcid":"https://orcid.org/0000-0002-9943-5607"},"institutions":[{"id":"https://openalex.org/I204730241","display_name":"Universit\u00e9 Paris Cit\u00e9","ror":"https://ror.org/05f82e368","country_code":"FR","type":"education","lineage":["https://openalex.org/I204730241"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I39804081","display_name":"Sorbonne Universit\u00e9","ror":"https://ror.org/02en5vm52","country_code":"FR","type":"education","lineage":["https://openalex.org/I39804081"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Haralampos-G. Stratigopoulos","raw_affiliation_strings":["Sorbonne Universit\u00e9s, UPMC University Paris 06, CNRS, LIP6, 4 place Jussieu, 75005, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sorbonne Universit\u00e9s, UPMC University Paris 06, CNRS, LIP6, 4 place Jussieu, 75005, Paris, France","institution_ids":["https://openalex.org/I39804081","https://openalex.org/I204730241","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068317001","display_name":"Alexandre Siligaris","orcid":"https://orcid.org/0000-0001-7529-4582"},"institutions":[{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alexandre Siligaris","raw_affiliation_strings":["CEA-LETI, MINATEC Campus, 17 Rue des Martyrs, 38054, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA-LETI, MINATEC Campus, 17 Rue des Martyrs, 38054, Grenoble, France","institution_ids":["https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I2738703131","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061963866","display_name":"Salvador Mir","orcid":"https://orcid.org/0000-0001-9911-8946"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Salvador Mir","raw_affiliation_strings":["CNRS, TIMA, 38000, Grenoble, France","Universit\u00e9 Grenoble Alpes, TIMA, 38000, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNRS, TIMA, 38000, Grenoble, France","institution_ids":["https://openalex.org/I4210087012","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Universit\u00e9 Grenoble Alpes, TIMA, 38000, Grenoble, France","institution_ids":["https://openalex.org/I899635006"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009392678","display_name":"Emeric de Foucauld","orcid":"https://orcid.org/0000-0001-8710-941X"},"institutions":[{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Emeric De Foucauld","raw_affiliation_strings":["CEA-LETI, MINATEC Campus, 17 Rue des Martyrs, 38054, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CEA-LETI, MINATEC Campus, 17 Rue des Martyrs, 38054, Grenoble, France","institution_ids":["https://openalex.org/I3020098449","https://openalex.org/I4210150049","https://openalex.org/I2738703131","https://openalex.org/I106785703"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5091734149"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I204730241","https://openalex.org/I39804081"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.3295,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.62317589,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"31","issue":"4","first_page":"381","last_page":"394"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5954449772834778},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.536185085773468},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5291754603385925},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.5181878209114075},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.517340362071991},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5108189582824707},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5096402168273926},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4651091694831848},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4599520266056061},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.43994778394699097},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.43429797887802124},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.43289902806282043},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.43221038579940796},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4298918843269348},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4271664023399353},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3172837495803833},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3033123016357422},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11560246348381042}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5954449772834778},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.536185085773468},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5291754603385925},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5181878209114075},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.517340362071991},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5108189582824707},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5096402168273926},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4651091694831848},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4599520266056061},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.43994778394699097},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.43429797887802124},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.43289902806282043},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.43221038579940796},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4298918843269348},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4271664023399353},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3172837495803833},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3033123016357422},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11560246348381042},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-015-5534-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-015-5534-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-01224425v1","is_oa":false,"landing_page_url":"https://hal.sorbonne-universite.fr/hal-01224425","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2015, 31 (4), pp.381-394. ⟨10.1007/s10836-015-5534-4⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1480376833","https://openalex.org/W1524267774","https://openalex.org/W1554663460","https://openalex.org/W1554944419","https://openalex.org/W1597918288","https://openalex.org/W1988733033","https://openalex.org/W1993214446","https://openalex.org/W2020497502","https://openalex.org/W2043199570","https://openalex.org/W2044617956","https://openalex.org/W2053829770","https://openalex.org/W2058060992","https://openalex.org/W2075890078","https://openalex.org/W2078096397","https://openalex.org/W2082974344","https://openalex.org/W2098549513","https://openalex.org/W2102741949","https://openalex.org/W2104047485","https://openalex.org/W2112058282","https://openalex.org/W2114482684","https://openalex.org/W2115248055","https://openalex.org/W2116915114","https://openalex.org/W2121692978","https://openalex.org/W2129979971","https://openalex.org/W2136660238","https://openalex.org/W2138209105","https://openalex.org/W2145403171","https://openalex.org/W2153292994","https://openalex.org/W2155636448","https://openalex.org/W2156530889","https://openalex.org/W2160939840","https://openalex.org/W2165015944","https://openalex.org/W2168249927","https://openalex.org/W2539443691","https://openalex.org/W3002443069","https://openalex.org/W4205686602","https://openalex.org/W4230445077","https://openalex.org/W4241361977","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2080140894","https://openalex.org/W2142462517","https://openalex.org/W4385556635","https://openalex.org/W1485942900","https://openalex.org/W1826635240","https://openalex.org/W2538846502","https://openalex.org/W2142592902","https://openalex.org/W3209221379","https://openalex.org/W1551597150","https://openalex.org/W907984460"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}