{"id":"https://openalex.org/W876178424","doi":"https://doi.org/10.1007/s10836-015-5524-6","title":"Contactless Testing of Circuit Interconnects","display_name":"Contactless Testing of Circuit Interconnects","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W876178424","doi":"https://doi.org/10.1007/s10836-015-5524-6","mag":"876178424"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-015-5524-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-015-5524-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-10452","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052902990","display_name":"Abdelghani Renbi","orcid":null},"institutions":[{"id":"https://openalex.org/I190632392","display_name":"Lule\u00e5 University of Technology","ror":"https://ror.org/016st3p78","country_code":"SE","type":"education","lineage":["https://openalex.org/I190632392"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"Abdelghani Renbi","raw_affiliation_strings":["Dept of Computer Science, Electrical, & Space Engineering, Lule\u00e5 University of Technology, Lule\u00e5, Sweden","Department of Computer Science, Electrical and Space engineering Lule\u00e5 University of Technology Lule\u00e5 Sweden"],"affiliations":[{"raw_affiliation_string":"Dept of Computer Science, Electrical, & Space Engineering, Lule\u00e5 University of Technology, Lule\u00e5, Sweden","institution_ids":["https://openalex.org/I190632392"]},{"raw_affiliation_string":"Department of Computer Science, Electrical and Space engineering Lule\u00e5 University of Technology Lule\u00e5 Sweden","institution_ids":["https://openalex.org/I190632392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009803618","display_name":"Jerker Delsing","orcid":"https://orcid.org/0000-0002-4133-3317"},"institutions":[{"id":"https://openalex.org/I190632392","display_name":"Lule\u00e5 University of Technology","ror":"https://ror.org/016st3p78","country_code":"SE","type":"education","lineage":["https://openalex.org/I190632392"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Jerker Delsing","raw_affiliation_strings":["Dept of Computer Science, Electrical, & Space Engineering, Lule\u00e5 University of Technology, Lule\u00e5, Sweden","Department of Computer Science, Electrical and Space engineering Lule\u00e5 University of Technology Lule\u00e5 Sweden"],"affiliations":[{"raw_affiliation_string":"Dept of Computer Science, Electrical, & Space Engineering, Lule\u00e5 University of Technology, Lule\u00e5, Sweden","institution_ids":["https://openalex.org/I190632392"]},{"raw_affiliation_string":"Department of Computer Science, Electrical and Space engineering Lule\u00e5 University of Technology Lule\u00e5 Sweden","institution_ids":["https://openalex.org/I190632392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5052902990"],"corresponding_institution_ids":["https://openalex.org/I190632392"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6625,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.6732249,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"31","issue":"3","first_page":"229","last_page":"253"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.7101976871490479},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6158976554870605},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6113322973251343},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5983848571777344},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5816829800605774},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5375930666923523},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.4676603376865387},{"id":"https://openalex.org/keywords/physical-design","display_name":"Physical design","score":0.4541589021682739},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4467947781085968},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4387929439544678},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4313011169433594},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41805756092071533},{"id":"https://openalex.org/keywords/electronic-component","display_name":"Electronic component","score":0.41341519355773926},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.3715391457080841},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.29852932691574097},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24212706089019775},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09143206477165222}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7101976871490479},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6158976554870605},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6113322973251343},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5983848571777344},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5816829800605774},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5375930666923523},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.4676603376865387},{"id":"https://openalex.org/C188817802","wikidata":"https://www.wikidata.org/wiki/Q13426855","display_name":"Physical design","level":3,"score":0.4541589021682739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4467947781085968},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4387929439544678},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4313011169433594},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41805756092071533},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.41341519355773926},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.3715391457080841},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.29852932691574097},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24212706089019775},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09143206477165222},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-015-5524-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-015-5524-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:DiVA.org:ltu-10452","is_oa":true,"landing_page_url":"http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-10452","pdf_url":null,"source":{"id":"https://openalex.org/S4306401559","display_name":"KTH Publication Database DiVA (KTH Royal Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:DiVA.org:ltu-10452","is_oa":true,"landing_page_url":"http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-10452","pdf_url":null,"source":{"id":"https://openalex.org/S4306401559","display_name":"KTH Publication Database DiVA (KTH Royal Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[{"score":0.4699999988079071,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W10143836","https://openalex.org/W104673254","https://openalex.org/W1519471010","https://openalex.org/W1558745090","https://openalex.org/W1978918547","https://openalex.org/W1985041852","https://openalex.org/W2015859336","https://openalex.org/W2022669299","https://openalex.org/W2030698666","https://openalex.org/W2095445361","https://openalex.org/W2095709610","https://openalex.org/W2106555816","https://openalex.org/W2112025713","https://openalex.org/W2122716162","https://openalex.org/W2125863200","https://openalex.org/W2128487266","https://openalex.org/W2143621442","https://openalex.org/W2151468369","https://openalex.org/W2152700904","https://openalex.org/W2158284484","https://openalex.org/W2159078649","https://openalex.org/W2164193327","https://openalex.org/W2499452261","https://openalex.org/W2549280196","https://openalex.org/W2889571065","https://openalex.org/W4205492715","https://openalex.org/W4231021813","https://openalex.org/W4248451031"],"related_works":["https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2153086993","https://openalex.org/W2114980936","https://openalex.org/W2118697956","https://openalex.org/W4249526199","https://openalex.org/W2128920253","https://openalex.org/W1723240183"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}