{"id":"https://openalex.org/W2082514680","doi":"https://doi.org/10.1007/s10836-014-5482-4","title":"Efficient LFSR Reseeding Based on Internal-Response Feedback","display_name":"Efficient LFSR Reseeding Based on Internal-Response Feedback","publication_year":2014,"publication_date":"2014-09-29","ids":{"openalex":"https://openalex.org/W2082514680","doi":"https://doi.org/10.1007/s10836-014-5482-4","mag":"2082514680"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-014-5482-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5482-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057721515","display_name":"Wei-Cheng Lien","orcid":"https://orcid.org/0000-0001-6180-7148"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Cheng Lien","raw_affiliation_strings":["Department of EE, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of EE, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Department of EE, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of EE, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028476747","display_name":"Tong-Yu Hsieh","orcid":"https://orcid.org/0000-0002-7954-5569"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Tong-Yu Hsieh","raw_affiliation_strings":["Department of EE, National Sun Yat-sen University, Kaohsiung, Taiwan","Department of EE, National Sun Yat-sen University, Kaohsiung, Taiwan#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of EE, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of EE, National Sun Yat-sen University, Kaohsiung, Taiwan#TAB#","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Department of ECE, Duke University, Durham, NC, 27708, USA","Department of ECE, Duke University, Durham, USA 27708#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, Duke University, Durham, NC, 27708, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Department of ECE, Duke University, Durham, USA 27708#TAB#","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5028476747"],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6303,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.71073042,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"30","issue":"6","first_page":"673","last_page":"685"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.68788743019104},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5669328570365906},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5392774939537048},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5026423931121826},{"id":"https://openalex.org/keywords/control-logic","display_name":"Control logic","score":0.5015285015106201},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.4756850004196167},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4458259344100952},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33134812116622925},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3074711263179779},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10772109031677246}],"concepts":[{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.68788743019104},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5669328570365906},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5392774939537048},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5026423931121826},{"id":"https://openalex.org/C2776350369","wikidata":"https://www.wikidata.org/wiki/Q843479","display_name":"Control logic","level":2,"score":0.5015285015106201},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.4756850004196167},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4458259344100952},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33134812116622925},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3074711263179779},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10772109031677246},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-014-5482-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5482-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W156271197","https://openalex.org/W1517866781","https://openalex.org/W1523104994","https://openalex.org/W1565298707","https://openalex.org/W1849928240","https://openalex.org/W1982183843","https://openalex.org/W2103535888","https://openalex.org/W2108719777","https://openalex.org/W2111151532","https://openalex.org/W2118236186","https://openalex.org/W2127343408","https://openalex.org/W2128232480","https://openalex.org/W2138530143","https://openalex.org/W2138686808","https://openalex.org/W2144033909","https://openalex.org/W2152408903","https://openalex.org/W2154325327","https://openalex.org/W2165584164","https://openalex.org/W2168089245","https://openalex.org/W2171003579","https://openalex.org/W4251073495"],"related_works":["https://openalex.org/W2623444083","https://openalex.org/W2146643791","https://openalex.org/W75082849","https://openalex.org/W3157572643","https://openalex.org/W2391979783","https://openalex.org/W2375911758","https://openalex.org/W2119351822","https://openalex.org/W2340052325","https://openalex.org/W1498635933","https://openalex.org/W201235458"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":2}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}