{"id":"https://openalex.org/W2049008683","doi":"https://doi.org/10.1007/s10836-014-5475-3","title":"Estiamtion and Correction of Mismatch Errors in Time-Interleaved ADCs","display_name":"Estiamtion and Correction of Mismatch Errors in Time-Interleaved ADCs","publication_year":2014,"publication_date":"2014-09-06","ids":{"openalex":"https://openalex.org/W2049008683","doi":"https://doi.org/10.1007/s10836-014-5475-3","mag":"2049008683"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-014-5475-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5475-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100414822","display_name":"Zhigang Wang","orcid":"https://orcid.org/0000-0001-8309-7888"},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhigang Wang","raw_affiliation_strings":["Chengdu, Sichuan, China",", Chengdu, China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chengdu, Sichuan, China","institution_ids":[]},{"raw_affiliation_string":", Chengdu, China#TAB#","institution_ids":["https://openalex.org/I4210125143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101553479","display_name":"Lianping Guo","orcid":"https://orcid.org/0000-0002-0058-8305"},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lianping Guo","raw_affiliation_strings":["Chengdu, Sichuan, China",", Chengdu, China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chengdu, Sichuan, China","institution_ids":[]},{"raw_affiliation_string":", Chengdu, China#TAB#","institution_ids":["https://openalex.org/I4210125143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110366987","display_name":"Shulin Tian","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shulin Tian","raw_affiliation_strings":["Chengdu, Sichuan, China",", Chengdu, China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chengdu, Sichuan, China","institution_ids":[]},{"raw_affiliation_string":", Chengdu, China#TAB#","institution_ids":["https://openalex.org/I4210125143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100338125","display_name":"Tao Liu","orcid":"https://orcid.org/0000-0001-9529-6550"},"institutions":[{"id":"https://openalex.org/I4210125143","display_name":"Chengdu University","ror":"https://ror.org/034z67559","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210125143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tao Liu","raw_affiliation_strings":["Chengdu, Sichuan, China",", Chengdu, China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chengdu, Sichuan, China","institution_ids":[]},{"raw_affiliation_string":", Chengdu, China#TAB#","institution_ids":["https://openalex.org/I4210125143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100338125"],"corresponding_institution_ids":["https://openalex.org/I4210125143"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.1644,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.53436037,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"30","issue":"5","first_page":"629","last_page":"635"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.7248685359954834},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6682807207107544},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.5294548869132996},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4860156178474426},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4720883071422577},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44664838910102844},{"id":"https://openalex.org/keywords/sampling-time","display_name":"Sampling time","score":0.4459899365901947},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3585769832134247},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18108832836151123},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1492442786693573},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10499894618988037},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0721052885055542}],"concepts":[{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.7248685359954834},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6682807207107544},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5294548869132996},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4860156178474426},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4720883071422577},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44664838910102844},{"id":"https://openalex.org/C2987691683","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling time","level":2,"score":0.4459899365901947},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3585769832134247},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18108832836151123},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1492442786693573},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10499894618988037},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0721052885055542},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-014-5475-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5475-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1492455225","https://openalex.org/W1900249129","https://openalex.org/W2051606634","https://openalex.org/W2095564918","https://openalex.org/W2104040946","https://openalex.org/W2113333016","https://openalex.org/W2118246755","https://openalex.org/W2118524348","https://openalex.org/W2119119508","https://openalex.org/W2122365245","https://openalex.org/W2129271363","https://openalex.org/W2136908302","https://openalex.org/W2143326453","https://openalex.org/W2149439928","https://openalex.org/W2156305369","https://openalex.org/W2169289334","https://openalex.org/W4232498893","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W1976070455","https://openalex.org/W2353563481","https://openalex.org/W2335441444","https://openalex.org/W2895556209","https://openalex.org/W3119399328","https://openalex.org/W2107002004","https://openalex.org/W2917424592","https://openalex.org/W2062297611","https://openalex.org/W1974783491","https://openalex.org/W2089080921"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}