{"id":"https://openalex.org/W1990989733","doi":"https://doi.org/10.1007/s10836-014-5466-4","title":"Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal Classifiers","display_name":"Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal Classifiers","publication_year":2014,"publication_date":"2014-08-01","ids":{"openalex":"https://openalex.org/W1990989733","doi":"https://doi.org/10.1007/s10836-014-5466-4","mag":"1990989733"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-014-5466-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5466-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037765083","display_name":"Mohamed Gamal El\u2010Din","orcid":"https://orcid.org/0000-0001-8443-476X"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Mohamed A. El-Gamal","raw_affiliation_strings":["Engineering Mathematics and Physics Department, Faculty of Engineering, Cairo University, Giza, Egypt","Engineering Mathematics and Physics Department, Faculty of Engineering Cairo University Giza Egypt"],"affiliations":[{"raw_affiliation_string":"Engineering Mathematics and Physics Department, Faculty of Engineering, Cairo University, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Engineering Mathematics and Physics Department, Faculty of Engineering Cairo University Giza Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110732989","display_name":"Abdel\u2010Karim S. O. Hassan","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Abdel-Karim S. O. Hassan","raw_affiliation_strings":["Engineering Mathematics and Physics Department, Faculty of Engineering, Cairo University, Giza, Egypt","Engineering Mathematics and Physics Department, Faculty of Engineering Cairo University Giza Egypt"],"affiliations":[{"raw_affiliation_string":"Engineering Mathematics and Physics Department, Faculty of Engineering, Cairo University, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Engineering Mathematics and Physics Department, Faculty of Engineering Cairo University Giza Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078357335","display_name":"Ahmad Asrul Ibrahim","orcid":"https://orcid.org/0000-0003-4997-3578"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ahmad A. I. Ibrahim","raw_affiliation_strings":["Engineering Mathematics and Physics Department, Faculty of Engineering, Cairo University, Giza, Egypt","Engineering Mathematics and Physics Department, Faculty of Engineering Cairo University Giza Egypt"],"affiliations":[{"raw_affiliation_string":"Engineering Mathematics and Physics Department, Faculty of Engineering, Cairo University, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Engineering Mathematics and Physics Department, Faculty of Engineering Cairo University Giza Egypt","institution_ids":["https://openalex.org/I145487455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5037765083"],"corresponding_institution_ids":["https://openalex.org/I145487455"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.4102,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.6732692,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"30","issue":"4","first_page":"443","last_page":"455"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/conic-section","display_name":"Conic section","score":0.804627537727356},{"id":"https://openalex.org/keywords/ellipsoid","display_name":"Ellipsoid","score":0.7168123126029968},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6488466858863831},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5431851148605347},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5189009308815002},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4949175715446472},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2626267969608307},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.13247758150100708},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.07157987356185913},{"id":"https://openalex.org/keywords/geodesy","display_name":"Geodesy","score":0.049038857221603394}],"concepts":[{"id":"https://openalex.org/C108598597","wikidata":"https://www.wikidata.org/wiki/Q124255","display_name":"Conic section","level":2,"score":0.804627537727356},{"id":"https://openalex.org/C57489055","wikidata":"https://www.wikidata.org/wiki/Q190046","display_name":"Ellipsoid","level":2,"score":0.7168123126029968},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6488466858863831},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5431851148605347},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5189009308815002},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4949175715446472},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2626267969608307},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.13247758150100708},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07157987356185913},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.049038857221603394},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-014-5466-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5466-4","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7599999904632568,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1498672627","https://openalex.org/W1969674925","https://openalex.org/W2003443969","https://openalex.org/W2025855399","https://openalex.org/W2067356596","https://openalex.org/W2083930772","https://openalex.org/W2091896150","https://openalex.org/W2101550795","https://openalex.org/W2106578604","https://openalex.org/W2108921639","https://openalex.org/W2141381813","https://openalex.org/W2165594756","https://openalex.org/W2169757786","https://openalex.org/W3029645440"],"related_works":["https://openalex.org/W4300566153","https://openalex.org/W2795378890","https://openalex.org/W2804689728","https://openalex.org/W2946724620","https://openalex.org/W2012685253","https://openalex.org/W2037437483","https://openalex.org/W3100053256","https://openalex.org/W2373292822","https://openalex.org/W2033914206","https://openalex.org/W2042327336"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-04-17T18:11:37.981687","created_date":"2025-10-10T00:00:00"}