{"id":"https://openalex.org/W2094268079","doi":"https://doi.org/10.1007/s10836-014-5463-7","title":"Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAs","display_name":"Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAs","publication_year":2014,"publication_date":"2014-07-11","ids":{"openalex":"https://openalex.org/W2094268079","doi":"https://doi.org/10.1007/s10836-014-5463-7","mag":"2094268079"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-014-5463-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5463-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042340641","display_name":"Anees Ullah","orcid":"https://orcid.org/0000-0002-4770-4967"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Anees Ullah","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, 24-10129, Italy","Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, Italy 24-10129#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, 24-10129, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, Italy 24-10129#TAB#","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Sterpone","raw_affiliation_strings":["Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, 24-10129, Italy","Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, Italy 24-10129#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, 24-10129, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Department of Control and Computer Engineering, Politecnico di Torino, Corso Duca degli Abruzzi, Torino, Italy 24-10129#TAB#","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5042340641"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.4259,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.69761571,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"30","issue":"4","first_page":"425","last_page":"442"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8071728944778442},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7379686832427979},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5896062850952148},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5830304026603699},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5283646583557129},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5256220698356628},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.36369144916534424},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34130629897117615},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2987654209136963},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25239646434783936},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20775115489959717},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1257646679878235}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8071728944778442},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7379686832427979},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5896062850952148},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5830304026603699},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5283646583557129},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5256220698356628},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.36369144916534424},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34130629897117615},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2987654209136963},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25239646434783936},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20775115489959717},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1257646679878235}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-014-5463-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-014-5463-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W85593233","https://openalex.org/W611078108","https://openalex.org/W2015769541","https://openalex.org/W2041252144","https://openalex.org/W2077625146","https://openalex.org/W2084581976","https://openalex.org/W2084982468","https://openalex.org/W2099760530","https://openalex.org/W2102841035","https://openalex.org/W2108903236","https://openalex.org/W2122512228","https://openalex.org/W2145897936","https://openalex.org/W2153079001","https://openalex.org/W2165010547","https://openalex.org/W2242440101","https://openalex.org/W3187317723","https://openalex.org/W4236794678"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W4308090481","https://openalex.org/W3211992815","https://openalex.org/W179354024"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-16T07:32:37.131356","created_date":"2025-10-10T00:00:00"}