{"id":"https://openalex.org/W2073094150","doi":"https://doi.org/10.1007/s10836-013-5408-6","title":"Multi-bit Sigma-Delta TDC Architecture with Improved Linearity","display_name":"Multi-bit Sigma-Delta TDC Architecture with Improved Linearity","publication_year":2013,"publication_date":"2013-10-03","ids":{"openalex":"https://openalex.org/W2073094150","doi":"https://doi.org/10.1007/s10836-013-5408-6","mag":"2073094150"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-013-5408-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-013-5408-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010998471","display_name":"Satoshi Uemori","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Satoshi Uemori","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050113044","display_name":"Masamichi Ishii","orcid":"https://orcid.org/0000-0002-4228-1723"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masamichi Ishii","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031069725","display_name":"Daiki Hirabayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daiki Hirabayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045042548","display_name":"Yuta Arakawa","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta Arakawa","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055657530","display_name":"Yuta Doi","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta Doi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019563893","display_name":"Osamu Kobayashi","orcid":"https://orcid.org/0000-0001-8037-4624"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Osamu Kobayashi","raw_affiliation_strings":["Semiconductor Technology Academic Research Center (STARC), Yokohama, 222-0033, Japan","Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan 222-0033#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Yokohama, 222-0033, Japan","institution_ids":[]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan 222-0033#TAB#","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057155001","display_name":"Tatsuji Matsuura","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuji Matsuura","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056677721","display_name":"Kiichi Niitsu","orcid":"https://orcid.org/0000-0002-3813-3955"},"institutions":[{"id":"https://openalex.org/I60134161","display_name":"Nagoya University","ror":"https://ror.org/04chrp450","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kiichi Niitsu","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Nagoya, 464-8603, Japan","Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Nagoya, Japan 464-8603#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Nagoya, 464-8603, Japan","institution_ids":["https://openalex.org/I60134161"]},{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Nagoya, Japan 464-8603#TAB#","institution_ids":["https://openalex.org/I60134161"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112240133","display_name":"Yuji Yano","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuji Yano","raw_affiliation_strings":["Semiconductor Technology Academic Research Center (STARC), Yokohama, 222-0033, Japan","Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan 222-0033#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Yokohama, 222-0033, Japan","institution_ids":[]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan 222-0033#TAB#","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033518713","display_name":"Tatsuhiro Gake","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tatsuhiro Gake","raw_affiliation_strings":["Semiconductor Technology Academic Research Center (STARC), Yokohama, 222-0033, Japan","Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan 222-0033#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Yokohama, 222-0033, Japan","institution_ids":[]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Yokohama, Japan 222-0033#TAB#","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010763159","display_name":"Takahiro Yamaguchi","orcid":"https://orcid.org/0000-0003-0325-8878"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro J. Yamaguchi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054795734","display_name":"Nobukazu Takai","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobukazu Takai","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, 1-5-1 Tenjin-cho Kiryu, Gunma, 376-8515, Japan","institution_ids":["https://openalex.org/I165735259"]},{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Gunma, Japan 376-8515#TAB#","institution_ids":["https://openalex.org/I165735259"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5010998471"],"corresponding_institution_ids":["https://openalex.org/I165735259"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.6407,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.83264769,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"29","issue":"6","first_page":"879","last_page":"892"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8500396013259888},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.6676730513572693},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.6282762289047241},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6269282102584839},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.5662853121757507},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5098718404769897},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.44753503799438477},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4443252980709076},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.42942869663238525},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.36940330266952515},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.26547712087631226},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25748294591903687},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17275112867355347},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1063818633556366},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08327814936637878}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8500396013259888},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.6676730513572693},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.6282762289047241},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6269282102584839},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.5662853121757507},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5098718404769897},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.44753503799438477},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4443252980709076},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.42942869663238525},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.36940330266952515},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.26547712087631226},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25748294591903687},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17275112867355347},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1063818633556366},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08327814936637878},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-013-5408-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-013-5408-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W282702537","https://openalex.org/W605564925","https://openalex.org/W606099112","https://openalex.org/W1558221883","https://openalex.org/W1595368737","https://openalex.org/W1979778078","https://openalex.org/W2007346651","https://openalex.org/W2061475693","https://openalex.org/W2102198362","https://openalex.org/W2116742609","https://openalex.org/W2117743193","https://openalex.org/W2163980632","https://openalex.org/W2169898783","https://openalex.org/W2212877209","https://openalex.org/W2596075070","https://openalex.org/W4299973078"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2103861456","https://openalex.org/W3183433566","https://openalex.org/W1541346708","https://openalex.org/W2354856110","https://openalex.org/W4240663242","https://openalex.org/W580081827","https://openalex.org/W4233608695"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}