{"id":"https://openalex.org/W2084918274","doi":"https://doi.org/10.1007/s10836-013-5383-y","title":"Prognostics of Analog Filters Based on Particle Filters Using Frequency Features","display_name":"Prognostics of Analog Filters Based on Particle Filters Using Frequency Features","publication_year":2013,"publication_date":"2013-05-28","ids":{"openalex":"https://openalex.org/W2084918274","doi":"https://doi.org/10.1007/s10836-013-5383-y","mag":"2084918274"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-013-5383-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-013-5383-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089231704","display_name":"Min Li","orcid":"https://orcid.org/0000-0002-5308-7221"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Li","raw_affiliation_strings":["School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000116937","display_name":"Weiming Xian","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiming Xian","raw_affiliation_strings":["School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100451313","display_name":"Bing Long","orcid":"https://orcid.org/0000-0003-1876-9013"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bing Long","raw_affiliation_strings":["School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061739424","display_name":"Houjun Wang","orcid":"https://orcid.org/0000-0001-7110-717X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Houjun Wang","raw_affiliation_strings":["School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Automation, University of Electronic Science and Technology of China, Chengdu, China 611731#TAB#","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100451313"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":3.0105,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.9165012,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"29","issue":"4","first_page":"567","last_page":"584"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.6072528958320618},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.5791256427764893},{"id":"https://openalex.org/keywords/analogue-filter","display_name":"Analogue filter","score":0.5686085820198059},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5034264922142029},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.49039244651794434},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48251649737358093},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46454501152038574},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4425261616706848},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41015905141830444},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3989112377166748},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38891491293907166},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.2449578046798706},{"id":"https://openalex.org/keywords/digital-filter","display_name":"Digital filter","score":0.20401743054389954},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.17619603872299194},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14445534348487854},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11678475141525269}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.6072528958320618},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.5791256427764893},{"id":"https://openalex.org/C176046018","wikidata":"https://www.wikidata.org/wiki/Q359205","display_name":"Analogue filter","level":4,"score":0.5686085820198059},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5034264922142029},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.49039244651794434},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48251649737358093},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46454501152038574},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4425261616706848},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41015905141830444},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3989112377166748},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38891491293907166},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.2449578046798706},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.20401743054389954},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.17619603872299194},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14445534348487854},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11678475141525269},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-013-5383-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-013-5383-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1540596182","https://openalex.org/W1977051692","https://openalex.org/W1978654022","https://openalex.org/W1984204893","https://openalex.org/W1993058006","https://openalex.org/W1993220529","https://openalex.org/W2007655149","https://openalex.org/W2022121787","https://openalex.org/W2023379225","https://openalex.org/W2029230244","https://openalex.org/W2049175623","https://openalex.org/W2049693449","https://openalex.org/W2069197722","https://openalex.org/W2077773163","https://openalex.org/W2083930772","https://openalex.org/W2094982977","https://openalex.org/W2095196047","https://openalex.org/W2098292501","https://openalex.org/W2098613108","https://openalex.org/W2098729161","https://openalex.org/W2108921639","https://openalex.org/W2116870707","https://openalex.org/W2116928983","https://openalex.org/W2118936977","https://openalex.org/W2119539043","https://openalex.org/W2137300256","https://openalex.org/W2144331387","https://openalex.org/W2145585502","https://openalex.org/W2161406034","https://openalex.org/W2165594756","https://openalex.org/W2171360905","https://openalex.org/W2313953460","https://openalex.org/W2336829869","https://openalex.org/W2389578379","https://openalex.org/W2798058877","https://openalex.org/W2914073730","https://openalex.org/W2996059456","https://openalex.org/W4229680264","https://openalex.org/W4244152462","https://openalex.org/W4292483811"],"related_works":["https://openalex.org/W2030185406","https://openalex.org/W2375192119","https://openalex.org/W2111184325","https://openalex.org/W2383167751","https://openalex.org/W2254292019","https://openalex.org/W2079882736","https://openalex.org/W1842426551","https://openalex.org/W2063444727","https://openalex.org/W2134038874","https://openalex.org/W1959795843"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}