{"id":"https://openalex.org/W2111579177","doi":"https://doi.org/10.1007/s10836-012-5326-z","title":"Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients","display_name":"Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients","publication_year":2012,"publication_date":"2012-08-27","ids":{"openalex":"https://openalex.org/W2111579177","doi":"https://doi.org/10.1007/s10836-012-5326-z","mag":"2111579177"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-012-5326-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-012-5326-z","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074124067","display_name":"Suraj Sindia","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Suraj Sindia","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA","Auburn.University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Auburn.University","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vishwani D. Agrawal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA","Auburn.University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, 36849, USA","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Auburn.University","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073587430","display_name":"Virendra Singh","orcid":"https://orcid.org/0000-0002-7035-7844"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Virendra Singh","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, 400076, India","Indian Inst. of Technology, Bombay"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, 400076, India","institution_ids":["https://openalex.org/I162827531"]},{"raw_affiliation_string":"Indian Inst. of Technology, Bombay","institution_ids":["https://openalex.org/I162827531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5074124067"],"corresponding_institution_ids":["https://openalex.org/I82497590"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":1.8011,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.86348936,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"28","issue":"5","first_page":"757","last_page":"771"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6685143113136292},{"id":"https://openalex.org/keywords/polynomial","display_name":"Polynomial","score":0.62204909324646},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5238704085350037},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5083209872245789},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4808945655822754},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.42678719758987427},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.39006760716438293},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32137244939804077},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.292510449886322},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.24174731969833374},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1570451557636261},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1511434018611908}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6685143113136292},{"id":"https://openalex.org/C90119067","wikidata":"https://www.wikidata.org/wiki/Q43260","display_name":"Polynomial","level":2,"score":0.62204909324646},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5238704085350037},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5083209872245789},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4808945655822754},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.42678719758987427},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.39006760716438293},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32137244939804077},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.292510449886322},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.24174731969833374},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1570451557636261},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1511434018611908},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-012-5326-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-012-5326-z","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:dsapce.library.iitb.ac.in:100/14656","is_oa":false,"landing_page_url":"http://dspace.library.iitb.ac.in/jspui/handle/100/14656","pdf_url":null,"source":{"id":"https://openalex.org/S4306400899","display_name":"DSpace (IIT Bombay)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I162827531","host_organization_name":"Indian Institute of Technology Bombay","host_organization_lineage":["https://openalex.org/I162827531"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W134734380","https://openalex.org/W1538850614","https://openalex.org/W1576508568","https://openalex.org/W1667165204","https://openalex.org/W1893696632","https://openalex.org/W1993738882","https://openalex.org/W2036119205","https://openalex.org/W2059579836","https://openalex.org/W2102452715","https://openalex.org/W2103321164","https://openalex.org/W2109810511","https://openalex.org/W2127145135","https://openalex.org/W2129444872","https://openalex.org/W2155618863","https://openalex.org/W2155796482","https://openalex.org/W2156459628","https://openalex.org/W2163440282","https://openalex.org/W2987637758"],"related_works":["https://openalex.org/W1485630101","https://openalex.org/W2498017833","https://openalex.org/W112744582","https://openalex.org/W3081841992","https://openalex.org/W2002639203","https://openalex.org/W2355076486","https://openalex.org/W3152739545","https://openalex.org/W2612264875","https://openalex.org/W2312475334","https://openalex.org/W1509689634"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}