{"id":"https://openalex.org/W1993058006","doi":"https://doi.org/10.1007/s10836-012-5301-8","title":"Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM","display_name":"Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM","publication_year":2012,"publication_date":"2012-05-07","ids":{"openalex":"https://openalex.org/W1993058006","doi":"https://doi.org/10.1007/s10836-012-5301-8","mag":"1993058006"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-012-5301-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-012-5301-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100451313","display_name":"Bing Long","orcid":"https://orcid.org/0000-0003-1876-9013"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bing Long","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","School of Automation Engineering University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Automation Engineering University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110366987","display_name":"Shulin Tian","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shulin Tian","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","School of Automation Engineering University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Automation Engineering University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061739424","display_name":"Houjun Wang","orcid":"https://orcid.org/0000-0001-7110-717X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Houjun Wang","raw_affiliation_strings":["School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","School of Automation Engineering University of Electronic Science and Technology of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"School of Automation Engineering University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100451313"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.2098,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.88229125,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"28","issue":"5","first_page":"745","last_page":"755"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.7294092774391174},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7109952569007874},{"id":"https://openalex.org/keywords/normalization","display_name":"Normalization (sociology)","score":0.6892827153205872},{"id":"https://openalex.org/keywords/mahalanobis-distance","display_name":"Mahalanobis distance","score":0.6426479816436768},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6220105290412903},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.60980623960495},{"id":"https://openalex.org/keywords/feature-selection","display_name":"Feature selection","score":0.5843151807785034},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.44436392188072205},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44273650646209717},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.4424518048763275},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.43399950861930847},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.33506882190704346},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07273459434509277}],"concepts":[{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.7294092774391174},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7109952569007874},{"id":"https://openalex.org/C136886441","wikidata":"https://www.wikidata.org/wiki/Q926129","display_name":"Normalization (sociology)","level":2,"score":0.6892827153205872},{"id":"https://openalex.org/C1921717","wikidata":"https://www.wikidata.org/wiki/Q1334846","display_name":"Mahalanobis distance","level":2,"score":0.6426479816436768},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6220105290412903},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.60980623960495},{"id":"https://openalex.org/C148483581","wikidata":"https://www.wikidata.org/wiki/Q446488","display_name":"Feature selection","level":2,"score":0.5843151807785034},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.44436392188072205},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44273650646209717},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4424518048763275},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.43399950861930847},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33506882190704346},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07273459434509277},{"id":"https://openalex.org/C19165224","wikidata":"https://www.wikidata.org/wiki/Q23404","display_name":"Anthropology","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-012-5301-8","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-012-5301-8","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W23546750","https://openalex.org/W352761140","https://openalex.org/W1496317909","https://openalex.org/W1540596182","https://openalex.org/W1571304415","https://openalex.org/W1976088919","https://openalex.org/W1980391127","https://openalex.org/W1984204893","https://openalex.org/W1985989326","https://openalex.org/W1992452233","https://openalex.org/W2049693449","https://openalex.org/W2056550357","https://openalex.org/W2077773163","https://openalex.org/W2078735512","https://openalex.org/W2088576840","https://openalex.org/W2098729161","https://openalex.org/W2099383324","https://openalex.org/W2132733568","https://openalex.org/W2137300256","https://openalex.org/W2154871109","https://openalex.org/W2165177979","https://openalex.org/W2169581350","https://openalex.org/W2171360905","https://openalex.org/W2172000360","https://openalex.org/W4253826874"],"related_works":["https://openalex.org/W4382795578","https://openalex.org/W2355463328","https://openalex.org/W2402648945","https://openalex.org/W939486154","https://openalex.org/W1431147547","https://openalex.org/W2771741613","https://openalex.org/W2055761197","https://openalex.org/W2157426608","https://openalex.org/W2420560403","https://openalex.org/W2778199868"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-16T07:32:37.131356","created_date":"2025-10-10T00:00:00"}