{"id":"https://openalex.org/W2017807298","doi":"https://doi.org/10.1007/s10836-012-5297-0","title":"Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits","display_name":"Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits","publication_year":2012,"publication_date":"2012-04-30","ids":{"openalex":"https://openalex.org/W2017807298","doi":"https://doi.org/10.1007/s10836-012-5297-0","mag":"2017807298"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-012-5297-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-012-5297-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014518141","display_name":"J. Freijedo","orcid":"https://orcid.org/0000-0002-5462-173X"},"institutions":[{"id":"https://openalex.org/I6289922","display_name":"Universidade de Vigo","ror":"https://ror.org/05rdf8595","country_code":"ES","type":"education","lineage":["https://openalex.org/I6289922"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Judit F. Freijedo","raw_affiliation_strings":["Department of Electronic Technology, University of Vigo, Campus Universitario, 36310, Vigo, Spain","Department of Electronic Technology, University of Vigo, Vigo, Spain 36310#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Technology, University of Vigo, Campus Universitario, 36310, Vigo, Spain","institution_ids":["https://openalex.org/I6289922"]},{"raw_affiliation_string":"Department of Electronic Technology, University of Vigo, Vigo, Spain 36310#TAB#","institution_ids":["https://openalex.org/I6289922"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018531470","display_name":"J. Semi\u00e3o","orcid":"https://orcid.org/0000-0002-7667-7910"},"institutions":[{"id":"https://openalex.org/I71503853","display_name":"University of Algarve","ror":"https://ror.org/014g34x36","country_code":"PT","type":"education","lineage":["https://openalex.org/I71503853"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Jorge Semi\u00e3o","raw_affiliation_strings":["Engineering Institute, Univ. of Algarve, Campus da Penha, 8005-139, Faro, Portugal","Engineering Institute, Univ. of Algarve, Faro, Portugal 8005-139#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Institute, Univ. of Algarve, Campus da Penha, 8005-139, Faro, Portugal","institution_ids":["https://openalex.org/I71503853"]},{"raw_affiliation_string":"Engineering Institute, Univ. of Algarve, Faro, Portugal 8005-139#TAB#","institution_ids":["https://openalex.org/I71503853"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057597956","display_name":"Juan J. Rodr\u00edguez-Andina","orcid":"https://orcid.org/0000-0002-0919-1793"},"institutions":[{"id":"https://openalex.org/I6289922","display_name":"Universidade de Vigo","ror":"https://ror.org/05rdf8595","country_code":"ES","type":"education","lineage":["https://openalex.org/I6289922"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Juan J. Rodriguez-Andina","raw_affiliation_strings":["Department of Electronic Technology, University of Vigo, Campus Universitario, 36310, Vigo, Spain","Department of Electronic Technology, University of Vigo, Vigo, Spain 36310#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Technology, University of Vigo, Campus Universitario, 36310, Vigo, Spain","institution_ids":["https://openalex.org/I6289922"]},{"raw_affiliation_string":"Department of Electronic Technology, University of Vigo, Vigo, Spain 36310#TAB#","institution_ids":["https://openalex.org/I6289922"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056273734","display_name":"Fabian Vargas","orcid":"https://orcid.org/0000-0002-3871-6464"},"institutions":[{"id":"https://openalex.org/I45643870","display_name":"Pontif\u00edcia Universidade Cat\u00f3lica do Rio Grande do Sul","ror":"https://ror.org/025vmq686","country_code":"BR","type":"education","lineage":["https://openalex.org/I45643870"]},{"id":"https://openalex.org/I84470341","display_name":"Catholic University of America","ror":"https://ror.org/047yk3s18","country_code":"US","type":"education","lineage":["https://openalex.org/I84470341"]}],"countries":["BR","US"],"is_corresponding":false,"raw_author_name":"Fabian Vargas","raw_affiliation_strings":["Electrical Engineering Department, Catholic University \u2013 PUCRS, Av. Ipiranga, 6681, 90619-900, Porto Alegre, Brazil","Electrical Engineering Department, Catholic University --- PUCRS, Porto Alegre, Brazil 90619-900#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Catholic University \u2013 PUCRS, Av. Ipiranga, 6681, 90619-900, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I45643870"]},{"raw_affiliation_string":"Electrical Engineering Department, Catholic University --- PUCRS, Porto Alegre, Brazil 90619-900#TAB#","institution_ids":["https://openalex.org/I84470341"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Isabel C. Teixeira","orcid":null},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"Isabel C. Teixeira","raw_affiliation_strings":["IST, Technical University of Lisbon/INESC-ID, Rua Alves Redol, 9, 1000-029, Lisbon, Portugal","IST, Technical University of Lisbon/INESC-ID, Lisbon, Portugal 1000-029#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IST, Technical University of Lisbon/INESC-ID, Rua Alves Redol, 9, 1000-029, Lisbon, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"IST, Technical University of Lisbon/INESC-ID, Lisbon, Portugal 1000-029#TAB#","institution_ids":["https://openalex.org/I141596103"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058862498","display_name":"J.P. Teixeira","orcid":"https://orcid.org/0000-0002-0379-6257"},"institutions":[{"id":"https://openalex.org/I121345201","display_name":"Instituto de Engenharia de Sistemas e Computadores Investiga\u00e7\u00e3o e Desenvolvimento","ror":"https://ror.org/04mqy3p58","country_code":"PT","type":"nonprofit","lineage":["https://openalex.org/I121345201","https://openalex.org/I4210125590"]},{"id":"https://openalex.org/I141596103","display_name":"University of Lisbon","ror":"https://ror.org/01c27hj86","country_code":"PT","type":"education","lineage":["https://openalex.org/I141596103"]}],"countries":["PT"],"is_corresponding":false,"raw_author_name":"J. Paulo Teixeira","raw_affiliation_strings":["IST, Technical University of Lisbon/INESC-ID, Rua Alves Redol, 9, 1000-029, Lisbon, Portugal","IST, Technical University of Lisbon/INESC-ID, Lisbon, Portugal 1000-029#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IST, Technical University of Lisbon/INESC-ID, Rua Alves Redol, 9, 1000-029, Lisbon, Portugal","institution_ids":["https://openalex.org/I121345201"]},{"raw_affiliation_string":"IST, Technical University of Lisbon/INESC-ID, Lisbon, Portugal 1000-029#TAB#","institution_ids":["https://openalex.org/I141596103"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5057597956"],"corresponding_institution_ids":["https://openalex.org/I6289922"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.8491,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.76410449,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"28","issue":"4","first_page":"421","last_page":"434"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7335256338119507},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6957345008850098},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6759141683578491},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5982328653335571},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.595070481300354},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5782460570335388},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5496295094490051},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5358285903930664},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4440738260746002},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4212290942668915},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41640886664390564},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.4109562039375305},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32671958208084106},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27555161714553833},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.17853981256484985}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7335256338119507},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6957345008850098},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6759141683578491},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5982328653335571},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.595070481300354},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5782460570335388},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5496295094490051},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5358285903930664},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4440738260746002},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4212290942668915},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41640886664390564},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.4109562039375305},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32671958208084106},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27555161714553833},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.17853981256484985},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-012-5297-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-012-5297-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1529382436","https://openalex.org/W1963963615","https://openalex.org/W1977055509","https://openalex.org/W1981981034","https://openalex.org/W1989768118","https://openalex.org/W1994210188","https://openalex.org/W2034581684","https://openalex.org/W2053804250","https://openalex.org/W2075086017","https://openalex.org/W2094813825","https://openalex.org/W2097819249","https://openalex.org/W2103156522","https://openalex.org/W2105407012","https://openalex.org/W2110283673","https://openalex.org/W2114834460","https://openalex.org/W2132816157","https://openalex.org/W2134067926","https://openalex.org/W2138724413","https://openalex.org/W2140654045","https://openalex.org/W2145522570","https://openalex.org/W2148071590","https://openalex.org/W2149447807","https://openalex.org/W2152425016","https://openalex.org/W2153299515","https://openalex.org/W2156667996","https://openalex.org/W2161344439","https://openalex.org/W2162547872","https://openalex.org/W2170918065","https://openalex.org/W2545932957","https://openalex.org/W3145643822","https://openalex.org/W4253814782"],"related_works":["https://openalex.org/W3121230237","https://openalex.org/W2381855323","https://openalex.org/W2151763159","https://openalex.org/W2941936807","https://openalex.org/W2113924398","https://openalex.org/W2127658067","https://openalex.org/W3023943545","https://openalex.org/W1526186977","https://openalex.org/W1547245164","https://openalex.org/W962052505"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}