{"id":"https://openalex.org/W2105094812","doi":"https://doi.org/10.1007/s10836-011-5271-2","title":"Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors","display_name":"Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors","publication_year":2011,"publication_date":"2011-12-24","ids":{"openalex":"https://openalex.org/W2105094812","doi":"https://doi.org/10.1007/s10836-011-5271-2","mag":"2105094812"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-011-5271-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5271-2","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065451135","display_name":"Claude Thibeault","orcid":"https://orcid.org/0000-0003-1765-9170"},"institutions":[{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"C. Thibeault","raw_affiliation_strings":["Department of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, QC, Canada","[Dept. of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, Canada]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, QC, Canada","institution_ids":["https://openalex.org/I9736820"]},{"raw_affiliation_string":"[Dept. of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, Canada]","institution_ids":["https://openalex.org/I9736820"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008841082","display_name":"Y. Hariri","orcid":null},"institutions":[{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Y. Hariri","raw_affiliation_strings":["Department of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, QC, Canada","[Dept. of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, Canada]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, QC, Canada","institution_ids":["https://openalex.org/I9736820"]},{"raw_affiliation_string":"[Dept. of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, Canada]","institution_ids":["https://openalex.org/I9736820"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060786659","display_name":"Christelle Hobeika","orcid":null},"institutions":[{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"C. Hobeika","raw_affiliation_strings":["Department of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, QC, Canada","[Dept. of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, Canada]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, QC, Canada","institution_ids":["https://openalex.org/I9736820"]},{"raw_affiliation_string":"[Dept. of Electrical Engineering, \u00c9cole de Technologie Sup\u00e9rieure, Montreal, Canada]","institution_ids":["https://openalex.org/I9736820"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5065451135"],"corresponding_institution_ids":["https://openalex.org/I9736820"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14702331,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"28","issue":"2","first_page":"229","last_page":"242"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6938610076904297},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6224050521850586},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.594909131526947},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5782972574234009},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4739256799221039},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.45844340324401855},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4554131329059601},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.43670156598091125},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.43652892112731934},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.3444382846355438},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2749597430229187},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08871886134147644},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08749788999557495}],"concepts":[{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6938610076904297},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6224050521850586},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.594909131526947},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5782972574234009},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4739256799221039},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.45844340324401855},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4554131329059601},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.43670156598091125},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.43652892112731934},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.3444382846355438},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2749597430229187},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08871886134147644},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08749788999557495},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-011-5271-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5271-2","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:espace2.etsmtl.ca:3524","is_oa":false,"landing_page_url":"https://espace2.etsmtl.ca/id/eprint/3524/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402392","display_name":"Espace \u00c9TS (ETS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1341030882","host_organization_name":"Educational Testing Service","host_organization_lineage":["https://openalex.org/I1341030882"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article publi\u00e9 dans une revue, r\u00e9vis\u00e9 par les pairs"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1531696936","https://openalex.org/W1581327216","https://openalex.org/W1905213452","https://openalex.org/W1953724919","https://openalex.org/W2007068450","https://openalex.org/W2025145240","https://openalex.org/W2043860543","https://openalex.org/W2066805492","https://openalex.org/W2085073472","https://openalex.org/W2088597164","https://openalex.org/W2098946331","https://openalex.org/W2103815719","https://openalex.org/W2106884550","https://openalex.org/W2112187634","https://openalex.org/W2116874325","https://openalex.org/W2126281568","https://openalex.org/W2130429991","https://openalex.org/W2131235069","https://openalex.org/W2133812334","https://openalex.org/W2135627440","https://openalex.org/W2139377754","https://openalex.org/W2141565132","https://openalex.org/W2142308491","https://openalex.org/W2143299987","https://openalex.org/W2144503280","https://openalex.org/W2150617736","https://openalex.org/W2150895785","https://openalex.org/W2152321821","https://openalex.org/W2154665706","https://openalex.org/W2161093075","https://openalex.org/W2161329778","https://openalex.org/W2161651212","https://openalex.org/W2162091502","https://openalex.org/W2169632679","https://openalex.org/W2203205958","https://openalex.org/W4235243288","https://openalex.org/W4247318036"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2786111245","https://openalex.org/W1979305473","https://openalex.org/W3009953521","https://openalex.org/W4234763172","https://openalex.org/W2125317684","https://openalex.org/W2323083271","https://openalex.org/W2992024382","https://openalex.org/W1588361197"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}