{"id":"https://openalex.org/W2067198933","doi":"https://doi.org/10.1007/s10836-011-5232-9","title":"An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation","display_name":"An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation","publication_year":2011,"publication_date":"2011-06-17","ids":{"openalex":"https://openalex.org/W2067198933","doi":"https://doi.org/10.1007/s10836-011-5232-9","mag":"2067198933"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-011-5232-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5232-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101361663","display_name":"Haijun Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I38877650","display_name":"Zhengzhou University","ror":"https://ror.org/04ypx8c21","country_code":"CN","type":"education","lineage":["https://openalex.org/I38877650"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haijun Sun","raw_affiliation_strings":["School of Information Engineering, Zhengzhou University, Zhengzhou, 450001, China","School of Information Engineering, Zhengzhou University, Zhengzhou, China 450001"],"affiliations":[{"raw_affiliation_string":"School of Information Engineering, Zhengzhou University, Zhengzhou, 450001, China","institution_ids":["https://openalex.org/I38877650"]},{"raw_affiliation_string":"School of Information Engineering, Zhengzhou University, Zhengzhou, China 450001","institution_ids":["https://openalex.org/I38877650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032198422","display_name":"Yongjia Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongjia Zeng","raw_affiliation_strings":["Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100457970","display_name":"Pu Li","orcid":"https://orcid.org/0000-0001-5395-4885"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pu Li","raw_affiliation_strings":["Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029535650","display_name":"Shaochong Lei","orcid":"https://orcid.org/0000-0002-4214-6863"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaochong Lei","raw_affiliation_strings":["Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101514317","display_name":"Zhibiao Shao","orcid":"https://orcid.org/0000-0003-1540-748X"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhibiao Shao","raw_affiliation_strings":["Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Xi\u2019an Jiao Tong University, Xi\u2019an, 710049, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"Department of Microelectronics, Xi'an Jiao Tong University, Xi'an, China 710049#TAB#","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101361663"],"corresponding_institution_ids":["https://openalex.org/I38877650"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.12389709,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"27","issue":"4","first_page":"477","last_page":"484"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6324324607849121},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6068664193153381},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5408329367637634},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5158206820487976},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.514218807220459},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5077692270278931},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5037421584129333},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.49019962549209595},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42264193296432495},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.41594961285591125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3976791203022003},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3775395452976227},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3439732789993286},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17577892541885376},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1585867702960968}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6324324607849121},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6068664193153381},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5408329367637634},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5158206820487976},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.514218807220459},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5077692270278931},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5037421584129333},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.49019962549209595},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42264193296432495},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.41594961285591125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3976791203022003},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3775395452976227},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3439732789993286},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17577892541885376},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1585867702960968},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-011-5232-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5232-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1485328666","https://openalex.org/W1548499928","https://openalex.org/W1554885925","https://openalex.org/W1806107097","https://openalex.org/W1927520408","https://openalex.org/W1998408990","https://openalex.org/W2029903266","https://openalex.org/W2073042086","https://openalex.org/W2080434313","https://openalex.org/W2097117126","https://openalex.org/W2101254886","https://openalex.org/W2103810183","https://openalex.org/W2105101572","https://openalex.org/W2108500347","https://openalex.org/W2111411160","https://openalex.org/W2114400099","https://openalex.org/W2114980975","https://openalex.org/W2123878291","https://openalex.org/W2125054260","https://openalex.org/W2129851282","https://openalex.org/W2133456190","https://openalex.org/W2133640956","https://openalex.org/W2133769728","https://openalex.org/W2134329962","https://openalex.org/W2137045371","https://openalex.org/W2137179556","https://openalex.org/W2138055192","https://openalex.org/W2141866079","https://openalex.org/W2149690470","https://openalex.org/W2151094122","https://openalex.org/W2154421641","https://openalex.org/W2162874773","https://openalex.org/W2166101227","https://openalex.org/W2166599556","https://openalex.org/W6628956649","https://openalex.org/W6677296522"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W1991935474","https://openalex.org/W2147400189","https://openalex.org/W2154529098","https://openalex.org/W2109319621"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}