{"id":"https://openalex.org/W2125189872","doi":"https://doi.org/10.1007/s10836-011-5215-x","title":"Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs","display_name":"Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs","publication_year":2011,"publication_date":"2011-04-08","ids":{"openalex":"https://openalex.org/W2125189872","doi":"https://doi.org/10.1007/s10836-011-5215-x","mag":"2125189872"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-011-5215-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5215-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004762106","display_name":"Deepa Mannath","orcid":null},"institutions":[{"id":"https://openalex.org/I78715868","display_name":"University of Arkansas at Fayetteville","ror":"https://ror.org/05jbt9m15","country_code":"US","type":"education","lineage":["https://openalex.org/I78715868"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Deepa Mannath","raw_affiliation_strings":["Texas Instruments, Dallas, TX, 75243, USA","The University of Arkansas, Fayetteville, AR, 72701, USA","The University of Arkansas, Fayetteville, USA 72701 and Texas Instruments, Dallas, USA 75243#TAB#"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Dallas, TX, 75243, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"The University of Arkansas, Fayetteville, AR, 72701, USA","institution_ids":["https://openalex.org/I78715868"]},{"raw_affiliation_string":"The University of Arkansas, Fayetteville, USA 72701 and Texas Instruments, Dallas, USA 75243#TAB#","institution_ids":["https://openalex.org/I78715868"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070162407","display_name":"David Cohen","orcid":"https://orcid.org/0000-0001-8263-6341"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Cohen","raw_affiliation_strings":["Texas Instruments, Ra\u2019anana, Israel","Texas Instrum., Ra'anana, Israel"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Ra\u2019anana, Israel","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instrum., Ra'anana, Israel","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077656102","display_name":"Victor Monta\u00f1o-Martinez","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Victor Monta\u00f1o-Martinez","raw_affiliation_strings":["Texas Instruments, Dallas, TX, 75243, USA","Texas Instruments, Dallas, USA 75243"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Dallas, TX, 75243, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments, Dallas, USA 75243","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066427918","display_name":"R.D. Hudgens","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rick Hudgens","raw_affiliation_strings":["Texas Instruments, Dallas, TX, 75243, USA","Texas Instruments, Dallas, USA 75243"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Dallas, TX, 75243, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments, Dallas, USA 75243","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009624456","display_name":"Elida de Obald\u00eda","orcid":"https://orcid.org/0000-0002-5690-8259"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Elida de-Obaldia","raw_affiliation_strings":["Texas Instruments, Dallas, TX, 75243, USA","Texas Instruments, Dallas, USA 75243"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Dallas, TX, 75243, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments, Dallas, USA 75243","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084261242","display_name":"Shai Kush","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shai Kush","raw_affiliation_strings":["Texas Instruments, Ra\u2019anana, Israel","Texas Instrum., Ra'anana, Israel"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Ra\u2019anana, Israel","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instrum., Ra'anana, Israel","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024557589","display_name":"Simon S. Ang","orcid":"https://orcid.org/0000-0002-6125-8086"},"institutions":[{"id":"https://openalex.org/I78715868","display_name":"University of Arkansas at Fayetteville","ror":"https://ror.org/05jbt9m15","country_code":"US","type":"education","lineage":["https://openalex.org/I78715868"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Simon S. Ang","raw_affiliation_strings":["The University of Arkansas, Fayetteville, AR, 72701, USA","The University of Arkansas, Fayetteville, USA 72701#TAB#"],"affiliations":[{"raw_affiliation_string":"The University of Arkansas, Fayetteville, AR, 72701, USA","institution_ids":["https://openalex.org/I78715868"]},{"raw_affiliation_string":"The University of Arkansas, Fayetteville, USA 72701#TAB#","institution_ids":["https://openalex.org/I78715868"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5004762106"],"corresponding_institution_ids":["https://openalex.org/I74760111","https://openalex.org/I78715868"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2588,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.59069379,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"27","issue":"3","first_page":"253","last_page":"266"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bluetooth","display_name":"Bluetooth","score":0.9438552856445312},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6231085658073425},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5019042491912842},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4727899730205536},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.4611629843711853},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.45937028527259827},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.43349871039390564},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4287897050380707},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40750518441200256},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3619242012500763},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3253009617328644},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2795097827911377},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.2654222249984741},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15559649467468262}],"concepts":[{"id":"https://openalex.org/C546215728","wikidata":"https://www.wikidata.org/wiki/Q39531","display_name":"Bluetooth","level":3,"score":0.9438552856445312},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6231085658073425},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5019042491912842},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4727899730205536},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.4611629843711853},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.45937028527259827},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.43349871039390564},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4287897050380707},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40750518441200256},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3619242012500763},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3253009617328644},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2795097827911377},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.2654222249984741},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15559649467468262},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-011-5215-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5215-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4699999988079071,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W10462991","https://openalex.org/W1495124085","https://openalex.org/W1766888123","https://openalex.org/W1966353364","https://openalex.org/W2062327827","https://openalex.org/W2070507767","https://openalex.org/W2106816366","https://openalex.org/W2113319198","https://openalex.org/W2124372352","https://openalex.org/W2159678334","https://openalex.org/W2164582257","https://openalex.org/W2188838890"],"related_works":["https://openalex.org/W4220926637","https://openalex.org/W2362681120","https://openalex.org/W4376643979","https://openalex.org/W2376320007","https://openalex.org/W4312465446","https://openalex.org/W2389079374","https://openalex.org/W2372429262","https://openalex.org/W2903653170","https://openalex.org/W2007798042","https://openalex.org/W2545858492"],"abstract_inverted_index":null,"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}