{"id":"https://openalex.org/W2009932470","doi":"https://doi.org/10.1007/s10836-011-5214-y","title":"Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor","display_name":"Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor","publication_year":2011,"publication_date":"2011-03-29","ids":{"openalex":"https://openalex.org/W2009932470","doi":"https://doi.org/10.1007/s10836-011-5214-y","mag":"2009932470"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-011-5214-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5214-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038405776","display_name":"R. Mozuelos","orcid":null},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Rom\u00e1n Mozuelos","raw_affiliation_strings":["Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#","institution_ids":["https://openalex.org/I13134134"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014908382","display_name":"Y. Lechuga","orcid":"https://orcid.org/0000-0002-1752-114X"},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Yolanda Lechuga","raw_affiliation_strings":["Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#","institution_ids":["https://openalex.org/I13134134"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079728472","display_name":"M. Mart\u00ednez","orcid":"https://orcid.org/0000-0001-5482-9242"},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Mar Mart\u00ednez","raw_affiliation_strings":["Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#","institution_ids":["https://openalex.org/I13134134"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103831882","display_name":"Salvador Bracho","orcid":null},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Salvador Bracho","raw_affiliation_strings":["Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Avda, Los Castros sn, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"Microelectronic Engineering Group, Department TEISA, University of Cantabria, Santander, Spain 39005#TAB#","institution_ids":["https://openalex.org/I13134134"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5038405776"],"corresponding_institution_ids":["https://openalex.org/I13134134"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":1.0379,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.81810052,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"27","issue":"2","first_page":"177","last_page":"192"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.6540346145629883},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5649750828742981},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5551822781562805},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5108351707458496},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5029000639915466},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4693639576435089},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46003565192222595},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4583297669887543},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.4534875750541687},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.43585720658302307},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41148149967193604},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.346946120262146},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.34416937828063965},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.23059812188148499}],"concepts":[{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.6540346145629883},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5649750828742981},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5551822781562805},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5108351707458496},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5029000639915466},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4693639576435089},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46003565192222595},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4583297669887543},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.4534875750541687},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.43585720658302307},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41148149967193604},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.346946120262146},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.34416937828063965},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.23059812188148499},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-011-5214-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-011-5214-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7300000190734863}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324278","display_name":"Comisi\u00f3n Interministerial de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W164528542","https://openalex.org/W1007778403","https://openalex.org/W1519290835","https://openalex.org/W1569571376","https://openalex.org/W1862469596","https://openalex.org/W1924227955","https://openalex.org/W2023677499","https://openalex.org/W2024087301","https://openalex.org/W2027773545","https://openalex.org/W2070691764","https://openalex.org/W2075964218","https://openalex.org/W2088817257","https://openalex.org/W2091501331","https://openalex.org/W2092526984","https://openalex.org/W2099807755","https://openalex.org/W2105290633","https://openalex.org/W2112372501","https://openalex.org/W2126385121","https://openalex.org/W2128342306","https://openalex.org/W2137948590","https://openalex.org/W2145235060","https://openalex.org/W2165749494","https://openalex.org/W2169294720","https://openalex.org/W2786312947","https://openalex.org/W4234217119","https://openalex.org/W4234651013"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2176409448","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2364769705","https://openalex.org/W2056136368","https://openalex.org/W1569351250","https://openalex.org/W2171636001","https://openalex.org/W1985049148","https://openalex.org/W92283468"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}