{"id":"https://openalex.org/W1998905608","doi":"https://doi.org/10.1007/s10836-010-5175-6","title":"Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture","display_name":"Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture","publication_year":2010,"publication_date":"2010-11-02","ids":{"openalex":"https://openalex.org/W1998905608","doi":"https://doi.org/10.1007/s10836-010-5175-6","mag":"1998905608"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-010-5175-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-010-5175-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014780493","display_name":"Jari Hannu","orcid":"https://orcid.org/0000-0002-4942-0482"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":true,"raw_author_name":"Jari Hannu","raw_affiliation_strings":["Microelectronics and Materials Physics Laboratories, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","Microelectronics and Materials Physics Laboratories, University of Oulu, Oulu, Finland FIN-90014#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics and Materials Physics Laboratories, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"Microelectronics and Materials Physics Laboratories, University of Oulu, Oulu, Finland FIN-90014#TAB#","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025309692","display_name":"Teuvo Saikkonen","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Teuvo Saikkonen","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Oulu, Finland FIN-90014"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Oulu, Finland FIN-90014","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054871443","display_name":"Juha H\u00e4kkinen","orcid":"https://orcid.org/0000-0003-2850-4414"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Juha H\u00e4kkinen","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Oulu, Finland FIN-90014"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Oulu, Finland FIN-90014","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051340725","display_name":"Juha Karttunen","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Juha Karttunen","raw_affiliation_strings":["Electronics Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","Electronics Laboratory, University of Oulu, Oulu, Finland FIN-90014"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"Electronics Laboratory, University of Oulu, Oulu, Finland FIN-90014","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082862323","display_name":"M. Moilanen","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Markku Moilanen","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Oulu, Finland FIN-90014"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Laboratory, University of Oulu, Oulu, Finland FIN-90014","institution_ids":["https://openalex.org/I98381234"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5014780493"],"corresponding_institution_ids":["https://openalex.org/I98381234"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.3634,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.69023869,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"26","issue":"6","first_page":"641","last_page":"658"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.7046190500259399},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6680519580841064},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5954748392105103},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.5895082354545593},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5597389936447144},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5416396856307983},{"id":"https://openalex.org/keywords/plan","display_name":"Plan (archaeology)","score":0.5026788711547852},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.49201032519340515},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.49067389965057373},{"id":"https://openalex.org/keywords/test-harness","display_name":"Test harness","score":0.467220664024353},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4665740728378296},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4662783145904541},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4610426127910614},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44719764590263367},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43171849846839905},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.4170593321323395},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4155113399028778},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4124709963798523},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09843569993972778},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08368575572967529},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07475981116294861},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06868106126785278}],"concepts":[{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.7046190500259399},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6680519580841064},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5954748392105103},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.5895082354545593},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5597389936447144},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5416396856307983},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.5026788711547852},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.49201032519340515},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.49067389965057373},{"id":"https://openalex.org/C109852812","wikidata":"https://www.wikidata.org/wiki/Q2406355","display_name":"Test harness","level":5,"score":0.467220664024353},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4665740728378296},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4662783145904541},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4610426127910614},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44719764590263367},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43171849846839905},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.4170593321323395},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4155113399028778},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4124709963798523},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09843569993972778},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08368575572967529},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07475981116294861},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06868106126785278},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C2776746162","wikidata":"https://www.wikidata.org/wiki/Q4508","display_name":"Navy","level":2,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-010-5175-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-010-5175-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321855","display_name":"Tekes","ror":"https://ror.org/02ag8cq23"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1660617473","https://openalex.org/W1985357785","https://openalex.org/W1993243435","https://openalex.org/W2009655452","https://openalex.org/W2040745271","https://openalex.org/W2062994073","https://openalex.org/W2069992924","https://openalex.org/W2099325073","https://openalex.org/W2125887454","https://openalex.org/W2126518591","https://openalex.org/W2132133743","https://openalex.org/W2161381755"],"related_works":["https://openalex.org/W2050287007","https://openalex.org/W2154529098","https://openalex.org/W2386704069","https://openalex.org/W2116424179","https://openalex.org/W2030910211","https://openalex.org/W2121694292","https://openalex.org/W2387607000","https://openalex.org/W2105858357","https://openalex.org/W2061326683","https://openalex.org/W2120106215"],"abstract_inverted_index":null,"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}