{"id":"https://openalex.org/W2037846656","doi":"https://doi.org/10.1007/s10836-010-5162-y","title":"Test Generation Algorithm for Linear Systems Based on Genetic Algorithm","display_name":"Test Generation Algorithm for Linear Systems Based on Genetic Algorithm","publication_year":2010,"publication_date":"2010-06-07","ids":{"openalex":"https://openalex.org/W2037846656","doi":"https://doi.org/10.1007/s10836-010-5162-y","mag":"2037846656"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-010-5162-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-010-5162-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021129173","display_name":"Ting Long","orcid":"https://orcid.org/0000-0001-5817-6875"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ting Long","raw_affiliation_strings":["Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061739424","display_name":"Houjun Wang","orcid":"https://orcid.org/0000-0001-7110-717X"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Houjun Wang","raw_affiliation_strings":["Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110366987","display_name":"Shulin Tian","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shulin Tian","raw_affiliation_strings":["Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100651268","display_name":"Jianguo Huang","orcid":"https://orcid.org/0000-0003-0825-3056"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianguo Huang","raw_affiliation_strings":["Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100451313","display_name":"Bing Long","orcid":"https://orcid.org/0000-0003-1876-9013"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Long","raw_affiliation_strings":["Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, 610054, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Automation Engineering, University of Electronic Science and Technology, Chengdu, China 610054#TAB#","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5021129173"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.499,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.66004562,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"26","issue":"4","first_page":"419","last_page":"428"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.8242884874343872},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.712101936340332},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6199535727500916},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6085420250892639},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47027188539505005},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.43909499049186707},{"id":"https://openalex.org/keywords/population-based-incremental-learning","display_name":"Population-based incremental learning","score":0.4331662058830261},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26381421089172363},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07599914073944092},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.06305226683616638}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.8242884874343872},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.712101936340332},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6199535727500916},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6085420250892639},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47027188539505005},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.43909499049186707},{"id":"https://openalex.org/C184497298","wikidata":"https://www.wikidata.org/wiki/Q7229773","display_name":"Population-based incremental learning","level":3,"score":0.4331662058830261},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26381421089172363},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07599914073944092},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.06305226683616638},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-010-5162-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-010-5162-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321106","display_name":"Ministry of Education of the People's Republic of China","ror":"https://ror.org/01mv9t934"},{"id":"https://openalex.org/F4320322701","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1508749740","https://openalex.org/W1533561803","https://openalex.org/W1711057136","https://openalex.org/W1924227955","https://openalex.org/W1966190965","https://openalex.org/W2042256779","https://openalex.org/W2097571405","https://openalex.org/W2102378583","https://openalex.org/W2103576593","https://openalex.org/W2120514720","https://openalex.org/W2131693096","https://openalex.org/W2137285106","https://openalex.org/W2155238908","https://openalex.org/W2155796482","https://openalex.org/W2165352122","https://openalex.org/W2367455359","https://openalex.org/W4249210749"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W1991935474","https://openalex.org/W2786111245"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}