{"id":"https://openalex.org/W2042512025","doi":"https://doi.org/10.1007/s10836-009-5131-5","title":"Qualifying Serial Interface Jitter Rapidly and Cost-effectively","display_name":"Qualifying Serial Interface Jitter Rapidly and Cost-effectively","publication_year":2010,"publication_date":"2010-01-05","ids":{"openalex":"https://openalex.org/W2042512025","doi":"https://doi.org/10.1007/s10836-009-5131-5","mag":"2042512025"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-009-5131-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5131-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101632967","display_name":"Yongquan Fan","orcid":"https://orcid.org/0000-0001-8854-2557"},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Yongquan Fan","raw_affiliation_strings":["Department of ECE, McGill University, Montreal, Quebec, Canada","[Department of ECE, McGill University, Montreal, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, McGill University, Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"[Department of ECE, McGill University, Montreal, Canada]","institution_ids":["https://openalex.org/I5023651"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062514163","display_name":"\u017deljko \u017dili\u0107","orcid":"https://orcid.org/0000-0002-6887-3911"},"institutions":[{"id":"https://openalex.org/I5023651","display_name":"McGill University","ror":"https://ror.org/01pxwe438","country_code":"CA","type":"education","lineage":["https://openalex.org/I5023651"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Zeljko Zilic","raw_affiliation_strings":["Department of ECE, McGill University, Montreal, Quebec, Canada","[Department of ECE, McGill University, Montreal, Canada]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, McGill University, Montreal, Quebec, Canada","institution_ids":["https://openalex.org/I5023651"]},{"raw_affiliation_string":"[Department of ECE, McGill University, Montreal, Canada]","institution_ids":["https://openalex.org/I5023651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5101632967"],"corresponding_institution_ids":["https://openalex.org/I5023651"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":1.0947,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.8179328,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"26","issue":"2","first_page":"177","last_page":"193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9535149335861206},{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.7688596248626709},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6542840600013733},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.5950362682342529},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4889644384384155},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4595019817352295},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4383867084980011},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4334029257297516},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3494828939437866},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21893197298049927},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10768628120422363},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.08158093690872192},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.07558456063270569}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9535149335861206},{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.7688596248626709},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6542840600013733},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.5950362682342529},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4889644384384155},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4595019817352295},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4383867084980011},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4334029257297516},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3494828939437866},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21893197298049927},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10768628120422363},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.08158093690872192},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.07558456063270569},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-009-5131-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5131-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1597062741","https://openalex.org/W2020584063","https://openalex.org/W2098928979","https://openalex.org/W2108528814","https://openalex.org/W2113944873","https://openalex.org/W2124283149","https://openalex.org/W2132713456","https://openalex.org/W2136631773","https://openalex.org/W2141753131","https://openalex.org/W2147586450","https://openalex.org/W2155068431","https://openalex.org/W2164668819","https://openalex.org/W2798333393"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W2113302467","https://openalex.org/W1979131826","https://openalex.org/W2370066713","https://openalex.org/W1984979050","https://openalex.org/W2978161533","https://openalex.org/W2379338802"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}