{"id":"https://openalex.org/W2063724383","doi":"https://doi.org/10.1007/s10836-009-5130-6","title":"ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method","display_name":"ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method","publication_year":2010,"publication_date":"2010-01-25","ids":{"openalex":"https://openalex.org/W2063724383","doi":"https://doi.org/10.1007/s10836-009-5130-6","mag":"2063724383"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-009-5130-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5130-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026093561","display_name":"Mar\u00eda \u00c1ngeles Jal\u00f3n","orcid":null},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I4210142936","display_name":"Centro de Investigaciones Cient\u00edficas Isla de la Cartuja","ror":"https://ror.org/05343aa75","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210142936"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. A. Jal\u00f3n","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, C. Am\u00e9rico Vespucio s/n, 41092, Seville, Spain","Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, Seville, Spain 41092#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, C. Am\u00e9rico Vespucio s/n, 41092, Seville, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I4210142936"]},{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, Seville, Spain 41092#TAB#","institution_ids":["https://openalex.org/I134820265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091600572","display_name":"E. Peral\u00edas","orcid":"https://orcid.org/0000-0003-0629-0785"},"institutions":[{"id":"https://openalex.org/I134820265","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","ror":"https://ror.org/02gfc7t72","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I4210142936","display_name":"Centro de Investigaciones Cient\u00edficas Isla de la Cartuja","ror":"https://ror.org/05343aa75","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210142936"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"E. Peral\u00edas","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, C. Am\u00e9rico Vespucio s/n, 41092, Seville, Spain","Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, Seville, Spain 41092#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, C. Am\u00e9rico Vespucio s/n, 41092, Seville, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I4210142936"]},{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla CNM-CSIC, Parque Tecnol\u00f3gico de La Cartuja, Seville, Spain 41092#TAB#","institution_ids":["https://openalex.org/I134820265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5091600572"],"corresponding_institution_ids":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210142936"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.8828,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.7756464,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"26","issue":"1","first_page":"47","last_page":"58"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7192623019218445},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.705720067024231},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.6534431576728821},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5684012770652771},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5008378028869629},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5001609325408936},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4967406392097473},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.4541536867618561},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.43859991431236267},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.4148273169994354},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28829705715179443},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2776716947555542},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.21656069159507751},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21019548177719116},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14244970679283142},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13645857572555542},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11775344610214233}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7192623019218445},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.705720067024231},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.6534431576728821},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5684012770652771},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5008378028869629},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5001609325408936},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4967406392097473},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.4541536867618561},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.43859991431236267},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.4148273169994354},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28829705715179443},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2776716947555542},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.21656069159507751},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21019548177719116},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14244970679283142},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13645857572555542},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11775344610214233},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-009-5130-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5130-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:digital.csic.es:10261/83168","is_oa":false,"landing_page_url":"http://hdl.handle.net/10261/83168","pdf_url":null,"source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"art\u00edculo"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1564170199","https://openalex.org/W1973758957","https://openalex.org/W2021095575","https://openalex.org/W2038372383","https://openalex.org/W2083193340","https://openalex.org/W2096636711","https://openalex.org/W2117768990","https://openalex.org/W2124674185","https://openalex.org/W2131477866","https://openalex.org/W2150395713","https://openalex.org/W2153119858","https://openalex.org/W2154271789","https://openalex.org/W2155116183","https://openalex.org/W2163817444","https://openalex.org/W2906422055","https://openalex.org/W2984086296","https://openalex.org/W2985106606"],"related_works":["https://openalex.org/W2759986866","https://openalex.org/W2316679782","https://openalex.org/W2551040039","https://openalex.org/W2260965739","https://openalex.org/W3152894281","https://openalex.org/W3027656099","https://openalex.org/W3170226631","https://openalex.org/W2489339234","https://openalex.org/W2762152268","https://openalex.org/W2072062814"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-16T07:32:37.131356","created_date":"2025-10-10T00:00:00"}