{"id":"https://openalex.org/W2035764712","doi":"https://doi.org/10.1007/s10836-009-5113-7","title":"On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction","display_name":"On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction","publication_year":2009,"publication_date":"2009-09-09","ids":{"openalex":"https://openalex.org/W2035764712","doi":"https://doi.org/10.1007/s10836-009-5113-7","mag":"2035764712"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-009-5113-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5113-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023142218","display_name":"Nathan Kupp","orcid":null},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nathan Kupp","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT, 06520, USA","Department of Electrical Engineering, Yale University, New Haven, USA 06520#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT, 06520, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Haven, USA 06520#TAB#","institution_ids":["https://openalex.org/I32971472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081378199","display_name":"Petros Drineas","orcid":"https://orcid.org/0000-0003-1994-8670"},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Petros Drineas","raw_affiliation_strings":["Department of Computer Science, Rensselaer Polytechnic Institute, 110 8th Street, Troy, NY, 12180, USA","Department of Computer Science, Rensselaer Polytechnic Institute, Troy, USA 12180#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Rensselaer Polytechnic Institute, 110 8th Street, Troy, NY, 12180, USA","institution_ids":["https://openalex.org/I165799507"]},{"raw_affiliation_string":"Department of Computer Science, Rensselaer Polytechnic Institute, Troy, USA 12180#TAB#","institution_ids":["https://openalex.org/I165799507"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109415484","display_name":"Mustapha Slamani","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mustapha Slamani","raw_affiliation_strings":["IBM, Wireless Test Development Group, 1000 River Street 863G, Essex Junction, VT, 05452, USA","IBM, Wireless Test Development Group, Essex Junction, USA 05452"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, Wireless Test Development Group, 1000 River Street 863G, Essex Junction, VT, 05452, USA","institution_ids":[]},{"raw_affiliation_string":"IBM, Wireless Test Development Group, Essex Junction, USA 05452","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I32971472","display_name":"Yale University","ror":"https://ror.org/03v76x132","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yiorgos Makris","raw_affiliation_strings":["Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT, 06520, USA","Department of Electrical Engineering, Yale University, New Haven, USA 06520#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, 10 Hillhouse Avenue, New Haven, CT, 06520, USA","institution_ids":["https://openalex.org/I32971472"]},{"raw_affiliation_string":"Department of Electrical Engineering, Yale University, New Haven, USA 06520#TAB#","institution_ids":["https://openalex.org/I32971472"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5078818440"],"corresponding_institution_ids":["https://openalex.org/I32971472"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":2.3295,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.8852489,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"25","issue":"6","first_page":"309","last_page":"321"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boosting","display_name":"Boosting (machine learning)","score":0.769656777381897},{"id":"https://openalex.org/keywords/compaction","display_name":"Compaction","score":0.6678000092506409},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.548134982585907},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.4722675085067749},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3769642114639282},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3365088403224945},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3082585632801056},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2686960697174072},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24195927381515503},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20526540279388428},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.12237286567687988}],"concepts":[{"id":"https://openalex.org/C46686674","wikidata":"https://www.wikidata.org/wiki/Q466303","display_name":"Boosting (machine learning)","level":2,"score":0.769656777381897},{"id":"https://openalex.org/C196715460","wikidata":"https://www.wikidata.org/wiki/Q1414356","display_name":"Compaction","level":2,"score":0.6678000092506409},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.548134982585907},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.4722675085067749},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3769642114639282},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3365088403224945},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3082585632801056},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2686960697174072},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24195927381515503},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20526540279388428},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.12237286567687988},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-009-5113-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5113-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1491682257","https://openalex.org/W1563088657","https://openalex.org/W1986402568","https://openalex.org/W2102041666","https://openalex.org/W2102201073","https://openalex.org/W2106646092","https://openalex.org/W2116080338","https://openalex.org/W2126105956","https://openalex.org/W2126949806","https://openalex.org/W2129690060","https://openalex.org/W2133229660","https://openalex.org/W2136007135","https://openalex.org/W2139497890","https://openalex.org/W2147018104","https://openalex.org/W2151360632","https://openalex.org/W2488758846","https://openalex.org/W2950090773"],"related_works":["https://openalex.org/W3013719031","https://openalex.org/W2125652721","https://openalex.org/W1540371141","https://openalex.org/W1549363203","https://openalex.org/W3140187064","https://openalex.org/W4231274751","https://openalex.org/W2028550458","https://openalex.org/W2154063878","https://openalex.org/W2378755530","https://openalex.org/W2556012038"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}