{"id":"https://openalex.org/W2139038023","doi":"https://doi.org/10.1007/s10836-009-5109-3","title":"Adaptive Debug and Diagnosis Without Fault Dictionaries","display_name":"Adaptive Debug and Diagnosis Without Fault Dictionaries","publication_year":2009,"publication_date":"2009-07-28","ids":{"openalex":"https://openalex.org/W2139038023","doi":"https://doi.org/10.1007/s10836-009-5109-3","mag":"2139038023"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-009-5109-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5109-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088238834","display_name":"Stefan Holst","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Stefan Holst","raw_affiliation_strings":["Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany","Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Stuttgart, Germany 70569"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Stuttgart, Germany 70569","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany","Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Stuttgart, Germany 70569"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Pfaffenwaldring 47, 70569, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institut f\u00fcr Technische Informatik, Universit\u00e4t Stuttgart, Stuttgart, Germany 70569","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5088238834"],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":10.0999,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.98151876,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"25","issue":"4-5","first_page":"259","last_page":"268"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9817000031471252,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.852613627910614},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.844109833240509},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7287358641624451},{"id":"https://openalex.org/keywords/pointer","display_name":"Pointer (user interface)","score":0.5822312831878662},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5519798994064331},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5097267031669617},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.48690903186798096},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.48167264461517334},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.45945316553115845},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4451971650123596},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.41901007294654846},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.41832372546195984},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3058657646179199},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2847164273262024},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.22337424755096436},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.1996634602546692},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07647380232810974},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06629776954650879}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.852613627910614},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.844109833240509},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7287358641624451},{"id":"https://openalex.org/C150202949","wikidata":"https://www.wikidata.org/wiki/Q107602","display_name":"Pointer (user interface)","level":2,"score":0.5822312831878662},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5519798994064331},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5097267031669617},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.48690903186798096},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.48167264461517334},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.45945316553115845},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4451971650123596},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.41901007294654846},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.41832372546195984},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3058657646179199},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2847164273262024},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.22337424755096436},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.1996634602546692},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07647380232810974},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06629776954650879},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-009-5109-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5109-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:informatik.uni-stuttgart.de:ART-2009-23","is_oa":false,"landing_page_url":"http://www2.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=ART-2009-23&engl=1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401306","display_name":"Fachbereich Informatik (University of Stuttgart)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100066346","host_organization_name":"University of Stuttgart","host_organization_lineage":["https://openalex.org/I100066346"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"\\n In: Journal of Electronic Testing - Theory and Applications (JETTA);\\n August 2009. Vol. 25(4-5), pp. 259-268\\n","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4699999988079071,"id":"https://metadata.un.org/sdg/4","display_name":"Quality Education"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1498052857","https://openalex.org/W1830318039","https://openalex.org/W1843392114","https://openalex.org/W1864256460","https://openalex.org/W1963105722","https://openalex.org/W2020616506","https://openalex.org/W2021463588","https://openalex.org/W2044741679","https://openalex.org/W2096366760","https://openalex.org/W2105498616","https://openalex.org/W2108914014","https://openalex.org/W2112423443","https://openalex.org/W2114024582","https://openalex.org/W2115882383","https://openalex.org/W2119444510","https://openalex.org/W2120231595","https://openalex.org/W2120312155","https://openalex.org/W2121440068","https://openalex.org/W2127346720","https://openalex.org/W2128069111","https://openalex.org/W2128382112","https://openalex.org/W2131095522","https://openalex.org/W2139730802","https://openalex.org/W2144483975","https://openalex.org/W2144963173","https://openalex.org/W2152489029","https://openalex.org/W2156162917","https://openalex.org/W2167012192","https://openalex.org/W2170593943","https://openalex.org/W2171039536","https://openalex.org/W2631276890","https://openalex.org/W3146581747","https://openalex.org/W4240026072","https://openalex.org/W4244360610","https://openalex.org/W4247982811"],"related_works":["https://openalex.org/W4283393949","https://openalex.org/W1988578416","https://openalex.org/W1599245032","https://openalex.org/W2053821262","https://openalex.org/W1904003763","https://openalex.org/W2110677206","https://openalex.org/W2127346720","https://openalex.org/W2112265472","https://openalex.org/W2139038023","https://openalex.org/W2126783999"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":5}],"updated_date":"2026-07-23T05:56:39.545243","created_date":"2025-10-10T00:00:00"}