{"id":"https://openalex.org/W2120339354","doi":"https://doi.org/10.1007/s10836-009-5103-9","title":"Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion","display_name":"Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion","publication_year":2009,"publication_date":"2009-04-15","ids":{"openalex":"https://openalex.org/W2120339354","doi":"https://doi.org/10.1007/s10836-009-5103-9","mag":"2120339354"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-009-5103-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5103-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059471428","display_name":"Mihir Choudhury","orcid":null},"institutions":[{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mihir R. Choudhury","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA","Department of Electrical and Computer Engineering, Rice, University, Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA","institution_ids":["https://openalex.org/I74775410"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rice, University, Houston, USA","institution_ids":["https://openalex.org/I74775410"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111969793","display_name":"Quming Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I257179599","display_name":"Baker Hughes (United States)","ror":"https://ror.org/05ts6js78","country_code":"US","type":"company","lineage":["https://openalex.org/I257179599"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Quming Zhou","raw_affiliation_strings":["Baker Hughes Inc., Houston, TX, USA","Baker-Hughes Inc., Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Baker Hughes Inc., Houston, TX, USA","institution_ids":["https://openalex.org/I257179599"]},{"raw_affiliation_string":"Baker-Hughes Inc., Houston, USA","institution_ids":["https://openalex.org/I257179599"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021693439","display_name":"Kartik Mohanram","orcid":null},"institutions":[{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kartik Mohanram","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA","Department of Electrical and Computer Engineering, Rice, University, Houston, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rice University, Houston, TX, USA","institution_ids":["https://openalex.org/I74775410"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rice, University, Houston, USA","institution_ids":["https://openalex.org/I74775410"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5021693439"],"corresponding_institution_ids":["https://openalex.org/I74775410"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":1.3198,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.82347648,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"25","issue":"2-3","first_page":"197","last_page":"207"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8322333097457886},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7939629554748535},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6906880736351013},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.509199321269989},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.503720223903656},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.48392587900161743},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4737972617149353},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.44978511333465576},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3901347517967224},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3794509172439575},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36267268657684326},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23678657412528992},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20847934484481812},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1288219392299652}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8322333097457886},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7939629554748535},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6906880736351013},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.509199321269989},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.503720223903656},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.48392587900161743},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4737972617149353},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.44978511333465576},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3901347517967224},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3794509172439575},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36267268657684326},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23678657412528992},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20847934484481812},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1288219392299652},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-009-5103-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-009-5103-9","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.156.416","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.156.416","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ece.rice.edu/~kmram/publications/jetta09-proof.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1519198589","https://openalex.org/W1524791468","https://openalex.org/W1541483005","https://openalex.org/W1945306823","https://openalex.org/W1946611508","https://openalex.org/W1999638666","https://openalex.org/W2061566868","https://openalex.org/W2071068906","https://openalex.org/W2089559051","https://openalex.org/W2104122494","https://openalex.org/W2106672998","https://openalex.org/W2117984621","https://openalex.org/W2119652329","https://openalex.org/W2127997025","https://openalex.org/W2130715017","https://openalex.org/W2134374959","https://openalex.org/W2134490163","https://openalex.org/W2140687305","https://openalex.org/W2141068710","https://openalex.org/W2142358791","https://openalex.org/W2144931885","https://openalex.org/W2148327955","https://openalex.org/W2152652532","https://openalex.org/W2154207847","https://openalex.org/W2156843973","https://openalex.org/W2161828911","https://openalex.org/W2162465831","https://openalex.org/W2163863796","https://openalex.org/W2167002145","https://openalex.org/W2170408097","https://openalex.org/W2171048418","https://openalex.org/W2312538472","https://openalex.org/W3172772885"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W2066664769","https://openalex.org/W1993206924","https://openalex.org/W2036412341","https://openalex.org/W2154207847","https://openalex.org/W2168546702"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}