{"id":"https://openalex.org/W2029936968","doi":"https://doi.org/10.1007/s10836-008-5084-0","title":"How Many Test Vectors We Need to Detect a Bridging Fault?","display_name":"How Many Test Vectors We Need to Detect a Bridging Fault?","publication_year":2008,"publication_date":"2008-12-18","ids":{"openalex":"https://openalex.org/W2029936968","doi":"https://doi.org/10.1007/s10836-008-5084-0","mag":"2029936968"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-008-5084-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-008-5084-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090163630","display_name":"M. Favalli","orcid":"https://orcid.org/0000-0001-7374-2871"},"institutions":[{"id":"https://openalex.org/I201324441","display_name":"University of Ferrara","ror":"https://ror.org/041zkgm14","country_code":"IT","type":"education","lineage":["https://openalex.org/I201324441"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Michele Favalli","raw_affiliation_strings":["DI, University of Ferrara, Ferrara, Italy","DI\u2014University of Ferrara, Ferrara, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DI, University of Ferrara, Ferrara, Italy","institution_ids":["https://openalex.org/I201324441"]},{"raw_affiliation_string":"DI\u2014University of Ferrara, Ferrara, Italy","institution_ids":["https://openalex.org/I201324441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089037660","display_name":"Marcello Dalpasso","orcid":"https://orcid.org/0000-0002-9242-3435"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marcello Dalpasso","raw_affiliation_strings":["DEI, University of Padova, Padua, Italy","DEI\u2014University of Padova, Padua, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DEI, University of Padova, Padua, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"DEI\u2014University of Padova, Padua, Italy","institution_ids":["https://openalex.org/I138689650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5090163630"],"corresponding_institution_ids":["https://openalex.org/I201324441"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.0779319,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"25","issue":"1","first_page":"79","last_page":"95"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.8657090067863464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5362241864204407},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4762542247772217},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42242133617401123},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32610899209976196},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1964952051639557},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10793831944465637},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.09486600756645203}],"concepts":[{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.8657090067863464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5362241864204407},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4762542247772217},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42242133617401123},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32610899209976196},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1964952051639557},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10793831944465637},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.09486600756645203},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/s10836-008-5084-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-008-5084-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:iris.unife.it:11392/533665","is_oa":false,"landing_page_url":"http://hdl.handle.net/11392/533665","pdf_url":null,"source":{"id":"https://openalex.org/S4306400369","display_name":"Institutional Research Information System University of Ferrara (University of Ferrara)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I201324441","host_organization_name":"University of Ferrara","host_organization_lineage":["https://openalex.org/I201324441"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:www.research.unipd.it:11577/2377431","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/2377431","pdf_url":null,"source":{"id":"https://openalex.org/S4306402547","display_name":"Padua Research Archive (University of Padova)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1573827634","https://openalex.org/W1625402502","https://openalex.org/W1995945562","https://openalex.org/W2095189874","https://openalex.org/W2096551964","https://openalex.org/W2120094593","https://openalex.org/W2123021960","https://openalex.org/W2123124971","https://openalex.org/W2123181463","https://openalex.org/W2123957829","https://openalex.org/W2126693329","https://openalex.org/W2131924443","https://openalex.org/W2137641348","https://openalex.org/W2144016413","https://openalex.org/W2157210245","https://openalex.org/W2173124859","https://openalex.org/W2587271961","https://openalex.org/W3106889297"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4388870064","https://openalex.org/W2210139803","https://openalex.org/W4235186151","https://openalex.org/W2054685365","https://openalex.org/W2056057048","https://openalex.org/W2667588871","https://openalex.org/W2272354214","https://openalex.org/W2084768720","https://openalex.org/W2043010663"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2025-10-10T00:00:00"}