{"id":"https://openalex.org/W2050826986","doi":"https://doi.org/10.1007/s10836-007-5038-y","title":"Substrate Testing on a Multi-Site/Multi-Probe ATE","display_name":"Substrate Testing on a Multi-Site/Multi-Probe ATE","publication_year":2008,"publication_date":"2008-01-07","ids":{"openalex":"https://openalex.org/W2050826986","doi":"https://doi.org/10.1007/s10836-007-5038-y","mag":"2050826986"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-007-5038-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5038-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062123396","display_name":"Xiaojun Ma","orcid":"https://orcid.org/0000-0001-6851-3644"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xiaojun Ma","raw_affiliation_strings":["ECE Department, Northeastern University, Boston, MA, 02115, USA","ECE Department, Northeastern University, Boston, USA 02115"],"affiliations":[{"raw_affiliation_string":"ECE Department, Northeastern University, Boston, MA, 02115, USA","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"ECE Department, Northeastern University, Boston, USA 02115","institution_ids":["https://openalex.org/I12912129"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fabrizio Lombardi","raw_affiliation_strings":["ECE Department, Northeastern University, Boston, MA, 02115, USA","ECE Department, Northeastern University, Boston, USA 02115"],"affiliations":[{"raw_affiliation_string":"ECE Department, Northeastern University, Boston, MA, 02115, USA","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"ECE Department, Northeastern University, Boston, USA 02115","institution_ids":["https://openalex.org/I12912129"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5062123396"],"corresponding_institution_ids":["https://openalex.org/I12912129"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.7088,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.75488103,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"24","issue":"1-3","first_page":"193","last_page":"201"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4663151204586029},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4463551938533783},{"id":"https://openalex.org/keywords/test-site","display_name":"Test site","score":0.44034281373023987},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34329742193222046},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.3308291733264923},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08538249135017395}],"concepts":[{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4663151204586029},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4463551938533783},{"id":"https://openalex.org/C2983696493","wikidata":"https://www.wikidata.org/wiki/Q7705730","display_name":"Test site","level":2,"score":0.44034281373023987},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34329742193222046},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3308291733264923},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08538249135017395},{"id":"https://openalex.org/C16674752","wikidata":"https://www.wikidata.org/wiki/Q1370637","display_name":"Mining engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-007-5038-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5038-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.550000011920929,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1566298939","https://openalex.org/W1886192363","https://openalex.org/W1906764766","https://openalex.org/W1966430082","https://openalex.org/W1968371401","https://openalex.org/W1979477906","https://openalex.org/W1979840878","https://openalex.org/W1986027887","https://openalex.org/W2034978802","https://openalex.org/W2041791922","https://openalex.org/W2093113615","https://openalex.org/W2104415993","https://openalex.org/W2106752233","https://openalex.org/W2109664674","https://openalex.org/W2110542770","https://openalex.org/W2111560049","https://openalex.org/W2126108161","https://openalex.org/W2128861023","https://openalex.org/W2128937890","https://openalex.org/W2133241273","https://openalex.org/W2136745187","https://openalex.org/W2162009815","https://openalex.org/W2167837882","https://openalex.org/W2168110065","https://openalex.org/W2172069438","https://openalex.org/W2180333551","https://openalex.org/W2567474316","https://openalex.org/W3148996927","https://openalex.org/W4248881643"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2130043461","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":null,"counts_by_year":[{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}