{"id":"https://openalex.org/W1983736918","doi":"https://doi.org/10.1007/s10836-007-5028-0","title":"Software and Hardware Techniques for SEU Detection in IP Processors","display_name":"Software and Hardware Techniques for SEU Detection in IP Processors","publication_year":2008,"publication_date":"2008-01-28","ids":{"openalex":"https://openalex.org/W1983736918","doi":"https://doi.org/10.1007/s10836-007-5028-0","mag":"1983736918"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-007-5028-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5028-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014159983","display_name":"Cristiana Bolchini","orcid":"https://orcid.org/0000-0001-5065-7906"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"C. Bolchini","raw_affiliation_strings":["Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031451381","display_name":"Antonio Miele","orcid":"https://orcid.org/0000-0003-3197-0723"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Miele","raw_affiliation_strings":["Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076102072","display_name":"Maurizio Rebaudengo","orcid":"https://orcid.org/0000-0002-7135-7694"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Rebaudengo","raw_affiliation_strings":["Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy","[Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"[Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy]","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090384946","display_name":"Fabio Salice","orcid":"https://orcid.org/0000-0002-0434-0446"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Salice","raw_affiliation_strings":["Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014181688","display_name":"Donatella Sciuto","orcid":"https://orcid.org/0000-0001-9030-6940"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Sciuto","raw_affiliation_strings":["Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Sterpone","raw_affiliation_strings":["Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy","[Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"[Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy]","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087219426","display_name":"M. Violante","orcid":"https://orcid.org/0000-0002-5821-3418"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Politecnico di Torino","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Violante","raw_affiliation_strings":["Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy","[Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"[Dip. di Automatica e Informatica, Politecnico di Torino, Turin, Italy]","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5014159983"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":2.4085,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.87828679,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"24","issue":"1-3","first_page":"35","last_page":"44"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7474240660667419},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.6457995176315308},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6159790754318237},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5780102014541626},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.49235284328460693},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4813036024570465},{"id":"https://openalex.org/keywords/hardware-architecture","display_name":"Hardware architecture","score":0.4559538662433624},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.44290944933891296},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4384463429450989},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.418956458568573},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.41293561458587646},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.373147189617157},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.25295543670654297},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2250702977180481}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7474240660667419},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.6457995176315308},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6159790754318237},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5780102014541626},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.49235284328460693},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4813036024570465},{"id":"https://openalex.org/C65232700","wikidata":"https://www.wikidata.org/wiki/Q5656403","display_name":"Hardware architecture","level":3,"score":0.4559538662433624},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.44290944933891296},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4384463429450989},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.418956458568573},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.41293561458587646},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.373147189617157},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.25295543670654297},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2250702977180481},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/s10836-007-5028-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5028-0","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:porto.polito.it:1741139","is_oa":false,"landing_page_url":"http://porto.polito.it/1741139/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN:0923-8174","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:re.public.polimi.it:11311/528820","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/528820","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1555374769","https://openalex.org/W2033346530","https://openalex.org/W2127697761","https://openalex.org/W2129254189","https://openalex.org/W2131132556","https://openalex.org/W2141068710","https://openalex.org/W2145930995","https://openalex.org/W2149771810","https://openalex.org/W2152513492","https://openalex.org/W2157158593","https://openalex.org/W2158729512","https://openalex.org/W2161244991"],"related_works":["https://openalex.org/W2359378376","https://openalex.org/W2085688425","https://openalex.org/W4210447066","https://openalex.org/W2092621316","https://openalex.org/W2086328257","https://openalex.org/W2024608029","https://openalex.org/W2905245489","https://openalex.org/W2167855946","https://openalex.org/W1916771750","https://openalex.org/W2040421909"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}