{"id":"https://openalex.org/W2108072749","doi":"https://doi.org/10.1007/s10836-007-5023-5","title":"Defect Analysis and Defect Tolerant Design of Multi-port SRAMs","display_name":"Defect Analysis and Defect Tolerant Design of Multi-port SRAMs","publication_year":2008,"publication_date":"2008-01-16","ids":{"openalex":"https://openalex.org/W2108072749","doi":"https://doi.org/10.1007/s10836-007-5023-5","mag":"2108072749"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-007-5023-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5023-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039905441","display_name":"Lushan Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lushan Liu","raw_affiliation_strings":["Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007830708","display_name":"Pradeep Nagaraj","orcid":null},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pradeep Nagaraj","raw_affiliation_strings":["Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031947971","display_name":"Shambhu Upadhyaya","orcid":"https://orcid.org/0000-0002-0596-1703"},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shambhu Upadhyaya","raw_affiliation_strings":["Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#","institution_ids":["https://openalex.org/I63190737"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108456717","display_name":"Ramalingam Sridhar","orcid":null},"institutions":[{"id":"https://openalex.org/I63190737","display_name":"University at Buffalo, State University of New York","ror":"https://ror.org/01y64my43","country_code":"US","type":"education","lineage":["https://openalex.org/I63190737"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ramalingam Sridhar","raw_affiliation_strings":["Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, 14260, Buffalo, NY, USA","institution_ids":["https://openalex.org/I63190737"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, State University of New York at Buffalo, Buffalo, USA 14260#TAB#","institution_ids":["https://openalex.org/I63190737"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5039905441"],"corresponding_institution_ids":["https://openalex.org/I63190737"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.9032,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.78565827,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"24","issue":"1-3","first_page":"165","last_page":"179"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8204755783081055},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.5717574954032898},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5561502575874329},{"id":"https://openalex.org/keywords/sense-amplifier","display_name":"Sense amplifier","score":0.5272722840309143},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5029358267784119},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.485027015209198},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.47841984033584595},{"id":"https://openalex.org/keywords/memory-cell","display_name":"Memory cell","score":0.448981374502182},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41966933012008667},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3730863034725189},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3313702940940857},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2987150549888611},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.27885955572128296},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2740103304386139}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8204755783081055},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.5717574954032898},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5561502575874329},{"id":"https://openalex.org/C32666082","wikidata":"https://www.wikidata.org/wiki/Q7450979","display_name":"Sense amplifier","level":3,"score":0.5272722840309143},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5029358267784119},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.485027015209198},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.47841984033584595},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.448981374502182},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41966933012008667},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3730863034725189},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3313702940940857},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2987150549888611},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.27885955572128296},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2740103304386139},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-007-5023-5","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5023-5","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W196877078","https://openalex.org/W1515587081","https://openalex.org/W1527137186","https://openalex.org/W1604482631","https://openalex.org/W1726161144","https://openalex.org/W1798884210","https://openalex.org/W1916738526","https://openalex.org/W1931961525","https://openalex.org/W1958909498","https://openalex.org/W2103344295","https://openalex.org/W2106935654","https://openalex.org/W2110263160","https://openalex.org/W2112902961","https://openalex.org/W2124229291","https://openalex.org/W2126771492","https://openalex.org/W2129212061","https://openalex.org/W2133690084","https://openalex.org/W2153808309","https://openalex.org/W2161390709","https://openalex.org/W2599786132","https://openalex.org/W3103339143","https://openalex.org/W4240958371","https://openalex.org/W4243298546","https://openalex.org/W4244495268"],"related_works":["https://openalex.org/W1835913819","https://openalex.org/W2051363901","https://openalex.org/W2127348582","https://openalex.org/W2373152541","https://openalex.org/W2174410816","https://openalex.org/W3200702775","https://openalex.org/W3209598999","https://openalex.org/W2159817233","https://openalex.org/W2351439697","https://openalex.org/W3010128671"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}