{"id":"https://openalex.org/W2158898610","doi":"https://doi.org/10.1007/s10836-007-5014-6","title":"A System-layer Infrastructure for SoC Diagnosis","display_name":"A System-layer Infrastructure for SoC Diagnosis","publication_year":2007,"publication_date":"2007-09-12","ids":{"openalex":"https://openalex.org/W2158898610","doi":"https://doi.org/10.1007/s10836-007-5014-6","mag":"2158898610"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-007-5014-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5014-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049430681","display_name":"Paolo Bernardi","orcid":"https://orcid.org/0000-0002-0985-9327"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"P. Bernardi","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035251234","display_name":"Michelangelo Grosso","orcid":"https://orcid.org/0000-0002-9726-0356"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Grosso","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076102072","display_name":"Maurizio Rebaudengo","orcid":"https://orcid.org/0000-0002-7135-7694"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Rebaudengo","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5049430681"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.6293,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.73664234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"23","issue":"5","first_page":"389","last_page":"404"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6286565661430359},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5470314025878906},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5445197224617004},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5342572927474976},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.467218279838562},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.4603137671947479},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.458479642868042},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.45738735795021057},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.45153456926345825},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.42577752470970154},{"id":"https://openalex.org/keywords/personalization","display_name":"Personalization","score":0.4251036047935486},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.4180172085762024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33879244327545166},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1564832627773285}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6286565661430359},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5470314025878906},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5445197224617004},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5342572927474976},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.467218279838562},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.4603137671947479},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.458479642868042},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.45738735795021057},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45153456926345825},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.42577752470970154},{"id":"https://openalex.org/C183003079","wikidata":"https://www.wikidata.org/wiki/Q1000371","display_name":"Personalization","level":2,"score":0.4251036047935486},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.4180172085762024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33879244327545166},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1564832627773285},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-007-5014-6","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-007-5014-6","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:porto.polito.it:1498328","is_oa":false,"landing_page_url":"http://porto.polito.it/1498328/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISSN:0923-8174","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1515082873","https://openalex.org/W1519425523","https://openalex.org/W1529838256","https://openalex.org/W1905213452","https://openalex.org/W1924406256","https://openalex.org/W1968989269","https://openalex.org/W1983320508","https://openalex.org/W1994887588","https://openalex.org/W2021130660","https://openalex.org/W2054971791","https://openalex.org/W2099462896","https://openalex.org/W2102136494","https://openalex.org/W2106478410","https://openalex.org/W2106935654","https://openalex.org/W2108657959","https://openalex.org/W2109154609","https://openalex.org/W2110049876","https://openalex.org/W2110129459","https://openalex.org/W2110221285","https://openalex.org/W2111280238","https://openalex.org/W2114932664","https://openalex.org/W2115795793","https://openalex.org/W2115933959","https://openalex.org/W2120246395","https://openalex.org/W2128639656","https://openalex.org/W2129640538","https://openalex.org/W2131192688","https://openalex.org/W2132881562","https://openalex.org/W2133058970","https://openalex.org/W2139832610","https://openalex.org/W2140925871","https://openalex.org/W2142661102","https://openalex.org/W2146489916","https://openalex.org/W2154175125","https://openalex.org/W2156278309","https://openalex.org/W2161329778","https://openalex.org/W2165509751","https://openalex.org/W2169517241","https://openalex.org/W2171452343","https://openalex.org/W3136299071","https://openalex.org/W4229714877","https://openalex.org/W4233158255","https://openalex.org/W4248719367","https://openalex.org/W4252472882"],"related_works":["https://openalex.org/W2947266479","https://openalex.org/W2369589212","https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2151694129","https://openalex.org/W2157212570","https://openalex.org/W2169602749","https://openalex.org/W2114980936","https://openalex.org/W2141620082","https://openalex.org/W1579528621"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}