{"id":"https://openalex.org/W1983366148","doi":"https://doi.org/10.1007/s10836-006-9457-y","title":"Test Development Through Defect and Test Escape Level Estimation for Data Converters","display_name":"Test Development Through Defect and Test Escape Level Estimation for Data Converters","publication_year":2006,"publication_date":"2006-11-22","ids":{"openalex":"https://openalex.org/W1983366148","doi":"https://doi.org/10.1007/s10836-006-9457-y","mag":"1983366148"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-006-9457-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-006-9457-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082931379","display_name":"Carsten Wegener","orcid":null},"institutions":[{"id":"https://openalex.org/I27577105","display_name":"University College Cork","ror":"https://ror.org/03265fv13","country_code":"IE","type":"education","lineage":["https://openalex.org/I27577105"]}],"countries":["IE"],"is_corresponding":true,"raw_author_name":"Carsten Wegener","raw_affiliation_strings":["Department of Microelectronic Engineering, University College Cork, Cork, Ireland"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic Engineering, University College Cork, Cork, Ireland","institution_ids":["https://openalex.org/I27577105"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058028927","display_name":"Michael Peter Kennedy","orcid":"https://orcid.org/0000-0003-3242-1056"},"institutions":[{"id":"https://openalex.org/I27577105","display_name":"University College Cork","ror":"https://ror.org/03265fv13","country_code":"IE","type":"education","lineage":["https://openalex.org/I27577105"]}],"countries":["IE"],"is_corresponding":false,"raw_author_name":"Michael Peter Kennedy","raw_affiliation_strings":["Department of Microelectronic Engineering, University College Cork, Cork, Ireland"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic Engineering, University College Cork, Cork, Ireland","institution_ids":["https://openalex.org/I27577105"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5082931379"],"corresponding_institution_ids":["https://openalex.org/I27577105"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.9997,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.85469379,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"22","issue":"4-6","first_page":"313","last_page":"324"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6708342432975769},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6210880875587463},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5292419791221619},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.5244048833847046},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5152993202209473},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4914039373397827},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.45326775312423706},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.42935553193092346},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4279308021068573},{"id":"https://openalex.org/keywords/manufacturing-cost","display_name":"Manufacturing cost","score":0.4187273383140564},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41789448261260986},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4162241816520691},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36771851778030396},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33661019802093506},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.25645703077316284},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15648317337036133},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.14003810286521912},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12704375386238098},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.084259033203125}],"concepts":[{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6708342432975769},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6210880875587463},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5292419791221619},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.5244048833847046},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5152993202209473},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4914039373397827},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.45326775312423706},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.42935553193092346},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4279308021068573},{"id":"https://openalex.org/C2778337023","wikidata":"https://www.wikidata.org/wiki/Q6753108","display_name":"Manufacturing cost","level":2,"score":0.4187273383140564},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41789448261260986},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4162241816520691},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36771851778030396},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33661019802093506},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.25645703077316284},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15648317337036133},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.14003810286521912},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12704375386238098},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.084259033203125},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-006-9457-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-006-9457-y","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320834","display_name":"Enterprise Ireland","ror":"https://ror.org/023z51242"},{"id":"https://openalex.org/F4320320847","display_name":"Science Foundation Ireland","ror":"https://ror.org/0271asj38"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1586776267","https://openalex.org/W1686846969","https://openalex.org/W2049961362","https://openalex.org/W2056099894","https://openalex.org/W2084128131","https://openalex.org/W2099649328","https://openalex.org/W2101299408","https://openalex.org/W2116400283","https://openalex.org/W2134974905","https://openalex.org/W2135331669","https://openalex.org/W2161325091","https://openalex.org/W2185703560","https://openalex.org/W2256388608","https://openalex.org/W2798909945"],"related_works":["https://openalex.org/W4285708951","https://openalex.org/W2147986372","https://openalex.org/W2786111245","https://openalex.org/W1979305473","https://openalex.org/W1606802855","https://openalex.org/W1895064253","https://openalex.org/W2035832568","https://openalex.org/W3121464923","https://openalex.org/W2170365398","https://openalex.org/W4233031093"],"abstract_inverted_index":null,"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}