{"id":"https://openalex.org/W2066022425","doi":"https://doi.org/10.1007/s10836-006-4835-z","title":"Scaling of iDDT Test Methods for Random Logic Circuits","display_name":"Scaling of iDDT Test Methods for Random Logic Circuits","publication_year":2006,"publication_date":"2006-02-01","ids":{"openalex":"https://openalex.org/W2066022425","doi":"https://doi.org/10.1007/s10836-006-4835-z","mag":"2066022425"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-006-4835-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-006-4835-z","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060737319","display_name":"Ali Chehab","orcid":"https://orcid.org/0000-0002-1939-2740"},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":true,"raw_author_name":"Ali Chehab","raw_affiliation_strings":["American University of Beirut, Beirut, Lebanon","American University of Beirut, Beirut Lebanon"],"affiliations":[{"raw_affiliation_string":"American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]},{"raw_affiliation_string":"American University of Beirut, Beirut Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110648494","display_name":"Saurabh M. Patel","orcid":null},"institutions":[{"id":"https://openalex.org/I102149020","display_name":"University of North Carolina at Charlotte","ror":"https://ror.org/04dawnj30","country_code":"US","type":"education","lineage":["https://openalex.org/I102149020"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saurabh Patel","raw_affiliation_strings":["University of North Carolina at Charlotte, Charlotte, NC, 28223, USA","University of North Carolina at Charlotte, Charlotte, USA 28223"],"affiliations":[{"raw_affiliation_string":"University of North Carolina at Charlotte, Charlotte, NC, 28223, USA","institution_ids":["https://openalex.org/I102149020"]},{"raw_affiliation_string":"University of North Carolina at Charlotte, Charlotte, USA 28223","institution_ids":["https://openalex.org/I102149020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052917077","display_name":"R.Z. Makki","orcid":null},"institutions":[{"id":"https://openalex.org/I201726411","display_name":"United Arab Emirates University","ror":"https://ror.org/01km6p862","country_code":"AE","type":"education","lineage":["https://openalex.org/I201726411"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Rafic Makki","raw_affiliation_strings":["College of Information Technology, UAE University, AL-Ain, UAE","[College of Information Technology, UAE University, Al Ain, UAE]"],"affiliations":[{"raw_affiliation_string":"College of Information Technology, UAE University, AL-Ain, UAE","institution_ids":[]},{"raw_affiliation_string":"[College of Information Technology, UAE University, Al Ain, UAE]","institution_ids":["https://openalex.org/I201726411"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060737319"],"corresponding_institution_ids":["https://openalex.org/I98635879"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.2857,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55674894,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"1","first_page":"11","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.7543723583221436},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.7038111686706543},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5006096363067627},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4851751923561096},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48195311427116394},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47228747606277466},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.44903329014778137},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42137137055397034},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4192919433116913},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.41772907972335815},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3695014715194702},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.33664149045944214},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.29574689269065857},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23035764694213867},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09166419506072998}],"concepts":[{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.7543723583221436},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.7038111686706543},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5006096363067627},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4851751923561096},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48195311427116394},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47228747606277466},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.44903329014778137},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42137137055397034},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4192919433116913},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41772907972335815},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3695014715194702},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.33664149045944214},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.29574689269065857},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23035764694213867},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09166419506072998},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-006-4835-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-006-4835-z","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5299999713897705,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320337370","display_name":"Office of International Science and Engineering","ror":"https://ror.org/01k638r21"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W148516285","https://openalex.org/W198384940","https://openalex.org/W1496640557","https://openalex.org/W1569571376","https://openalex.org/W1571744156","https://openalex.org/W1711678899","https://openalex.org/W1750005981","https://openalex.org/W1771943441","https://openalex.org/W1951648706","https://openalex.org/W1958909498","https://openalex.org/W2008871958","https://openalex.org/W2010647901","https://openalex.org/W2061946964","https://openalex.org/W2071631770","https://openalex.org/W2086978559","https://openalex.org/W2088998566","https://openalex.org/W2096110076","https://openalex.org/W2106585148","https://openalex.org/W2112062619","https://openalex.org/W2114560874","https://openalex.org/W2119130057","https://openalex.org/W2125726759","https://openalex.org/W2130007799","https://openalex.org/W2138708698","https://openalex.org/W2149754874","https://openalex.org/W2161796077","https://openalex.org/W2789002725","https://openalex.org/W2874053519","https://openalex.org/W4251681912","https://openalex.org/W6675690327","https://openalex.org/W6678242351"],"related_works":["https://openalex.org/W141820298","https://openalex.org/W4378770497","https://openalex.org/W2049584446","https://openalex.org/W2079781215","https://openalex.org/W2064404759","https://openalex.org/W4308245303","https://openalex.org/W2014033564","https://openalex.org/W2910573937","https://openalex.org/W4385571583","https://openalex.org/W2383699822"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}