{"id":"https://openalex.org/W1969674925","doi":"https://doi.org/10.1007/s10836-006-0710-1","title":"Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits","display_name":"Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits","publication_year":2007,"publication_date":"2007-05-04","ids":{"openalex":"https://openalex.org/W1969674925","doi":"https://doi.org/10.1007/s10836-006-0710-1","mag":"1969674925"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-006-0710-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-006-0710-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037765083","display_name":"Mohamed Gamal El\u2010Din","orcid":"https://orcid.org/0000-0001-8443-476X"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"M. A. El-Gamal","raw_affiliation_strings":["Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, 12211, Giza, Egypt","Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, Giza, Egypt 12211#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, 12211, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, Giza, Egypt 12211#TAB#","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111783973","display_name":"M. D. A. Mohamed","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"M. D. A. Mohamed","raw_affiliation_strings":["Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, 12211, Giza, Egypt","Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, Giza, Egypt 12211#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, 12211, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Department of Engineering Mathematics & Physics, Faculty of Engineering, Cairo University, Giza, Egypt 12211#TAB#","institution_ids":["https://openalex.org/I145487455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5037765083"],"corresponding_institution_ids":["https://openalex.org/I145487455"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.7846,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.84365262,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"23","issue":"4","first_page":"323","last_page":"339"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7754117250442505},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6575704216957092},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5889671444892883},{"id":"https://openalex.org/keywords/neural-ensemble","display_name":"Neural ensemble","score":0.5830376148223877},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.5460477471351624},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5398601293563843},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5195674896240234},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4607059061527252},{"id":"https://openalex.org/keywords/ensemble-learning","display_name":"Ensemble learning","score":0.4464699625968933},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18452700972557068}],"concepts":[{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7754117250442505},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6575704216957092},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5889671444892883},{"id":"https://openalex.org/C187782996","wikidata":"https://www.wikidata.org/wiki/Q9390548","display_name":"Neural ensemble","level":2,"score":0.5830376148223877},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.5460477471351624},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5398601293563843},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5195674896240234},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4607059061527252},{"id":"https://openalex.org/C45942800","wikidata":"https://www.wikidata.org/wiki/Q245652","display_name":"Ensemble learning","level":2,"score":0.4464699625968933},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18452700972557068},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-006-0710-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-006-0710-1","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W140221739","https://openalex.org/W1498672627","https://openalex.org/W1538954065","https://openalex.org/W1540371141","https://openalex.org/W1967646346","https://openalex.org/W2003443969","https://openalex.org/W2020664233","https://openalex.org/W2025855399","https://openalex.org/W2034159182","https://openalex.org/W2067356596","https://openalex.org/W2076118331","https://openalex.org/W2083919449","https://openalex.org/W2091896150","https://openalex.org/W2100805904","https://openalex.org/W2101550795","https://openalex.org/W2108921639","https://openalex.org/W2121821621","https://openalex.org/W2124776405","https://openalex.org/W2128143822","https://openalex.org/W2131490916","https://openalex.org/W2132306241","https://openalex.org/W2145073242","https://openalex.org/W2152761983","https://openalex.org/W2154336645","https://openalex.org/W2169757786","https://openalex.org/W2799061466","https://openalex.org/W4234892472","https://openalex.org/W4244494905","https://openalex.org/W4254582343","https://openalex.org/W6678851513","https://openalex.org/W6681651645","https://openalex.org/W7014191107"],"related_works":["https://openalex.org/W3162204513","https://openalex.org/W2371138613","https://openalex.org/W2048963458","https://openalex.org/W43109613","https://openalex.org/W2359952343","https://openalex.org/W2080152487","https://openalex.org/W2239445980","https://openalex.org/W3083152911","https://openalex.org/W2120455979","https://openalex.org/W3022347918"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}