{"id":"https://openalex.org/W1988552265","doi":"https://doi.org/10.1007/s10836-005-6359-3","title":"Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs","display_name":"Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs","publication_year":2005,"publication_date":"2005-04-06","ids":{"openalex":"https://openalex.org/W1988552265","doi":"https://doi.org/10.1007/s10836-005-6359-3","mag":"1988552265"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-005-6359-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-6359-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082931379","display_name":"Carsten Wegener","orcid":null},"institutions":[{"id":"https://openalex.org/I27577105","display_name":"University College Cork","ror":"https://ror.org/03265fv13","country_code":"IE","type":"education","lineage":["https://openalex.org/I27577105"]}],"countries":["IE"],"is_corresponding":true,"raw_author_name":"Carsten Wegener","raw_affiliation_strings":["Department of Microelectronic Engineering, University College Cork, Ireland","Dept of Microelectronic Engineering, University College Cork, Ireland#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic Engineering, University College Cork, Ireland","institution_ids":["https://openalex.org/I27577105"]},{"raw_affiliation_string":"Dept of Microelectronic Engineering, University College Cork, Ireland#TAB#","institution_ids":["https://openalex.org/I27577105"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058028927","display_name":"Michael Peter Kennedy","orcid":"https://orcid.org/0000-0003-3242-1056"},"institutions":[{"id":"https://openalex.org/I27577105","display_name":"University College Cork","ror":"https://ror.org/03265fv13","country_code":"IE","type":"education","lineage":["https://openalex.org/I27577105"]}],"countries":["IE"],"is_corresponding":false,"raw_author_name":"Michael Peter Kennedy","raw_affiliation_strings":["Department of Microelectronic Engineering, University College Cork, Ireland","Dept of Microelectronic Engineering, University College Cork, Ireland#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronic Engineering, University College Cork, Ireland","institution_ids":["https://openalex.org/I27577105"]},{"raw_affiliation_string":"Dept of Microelectronic Engineering, University College Cork, Ireland#TAB#","institution_ids":["https://openalex.org/I27577105"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5082931379"],"corresponding_institution_ids":["https://openalex.org/I27577105"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.7949,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.73733817,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"21","issue":"3","first_page":"299","last_page":"310"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.7802109718322754},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6026191711425781},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.589314341545105},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5771834850311279},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5714151263237},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42029449343681335},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3893871307373047},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1524677276611328},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08935925364494324}],"concepts":[{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.7802109718322754},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6026191711425781},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.589314341545105},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5771834850311279},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5714151263237},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42029449343681335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3893871307373047},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1524677276611328},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08935925364494324},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10836-005-6359-3","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-6359-3","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320311521","display_name":"National University of Ireland","ror":"https://ror.org/00shsf120"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W570926324","https://openalex.org/W1569630884","https://openalex.org/W1592104913","https://openalex.org/W1594101521","https://openalex.org/W1677105051","https://openalex.org/W2084128131","https://openalex.org/W2099679337","https://openalex.org/W2116400283","https://openalex.org/W2134974905","https://openalex.org/W2150011256","https://openalex.org/W2172022127","https://openalex.org/W2183883265","https://openalex.org/W2798909945"],"related_works":["https://openalex.org/W1905216755","https://openalex.org/W2104218257","https://openalex.org/W2354856110","https://openalex.org/W2154984715","https://openalex.org/W2074272557","https://openalex.org/W171113498","https://openalex.org/W3043756176","https://openalex.org/W2124661899","https://openalex.org/W2169880147","https://openalex.org/W1663366791"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}