{"id":"https://openalex.org/W2011063547","doi":"https://doi.org/10.1007/s10836-005-5286-7","title":"Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs","display_name":"Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs","publication_year":2005,"publication_date":"2005-02-01","ids":{"openalex":"https://openalex.org/W2011063547","doi":"https://doi.org/10.1007/s10836-005-5286-7","mag":"2011063547"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-005-5286-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-5286-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["Laboratoire d\u2019Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), 161, rue Ada, 34392, Montpellier Cedex 05, France","Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire d\u2019Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), 161, rue Ada, 34392, Montpellier Cedex 05, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098064601","display_name":"Olivier H\ufffdron","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Olivier H\ufffdron","raw_affiliation_strings":["Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041515093","display_name":"S. Pravossoudovitch","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Serge Pravossoudovitch","raw_affiliation_strings":["Laboratoire d\u2019Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), 161, rue Ada, 34392, Montpellier Cedex 05, France","Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire d\u2019Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), 161, rue Ada, 34392, Montpellier Cedex 05, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069159925","display_name":"M. Renovell","orcid":"https://orcid.org/0000-0002-3896-8231"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Michel Renovell","raw_affiliation_strings":["Laboratoire d\u2019Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), 161, rue Ada, 34392, Montpellier Cedex 05, France","Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire d\u2019Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), 161, rue Ada, 34392, Montpellier Cedex 05, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Laboratoire d'Informatique de Robotique et de Micro\u00e9lectronique de Montpellier, Universit\u00e9 Montpellier II/CNRS (UMR 5506), Montpellier Cedex 05, France 34392#TAB#","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5005116115"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.5281,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.6775855,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"21","issue":"1","first_page":"43","last_page":"55"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7729424834251404},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7541949152946472},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5934436321258545},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5840837359428406},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.525503396987915},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5003695487976074},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4817926287651062},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4607542157173157},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4595474302768707},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4057878851890564},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3699166178703308},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2958894968032837},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10773897171020508},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09014734625816345},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07791900634765625}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7729424834251404},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7541949152946472},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5934436321258545},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5840837359428406},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.525503396987915},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5003695487976074},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4817926287651062},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4607542157173157},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4595474302768707},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4057878851890564},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3699166178703308},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2958894968032837},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10773897171020508},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09014734625816345},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07791900634765625},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-005-5286-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-5286-7","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-00105329v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105329","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2005, 21 (1), pp.43-55. ⟨10.1007/s10836-005-5286-7⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.6600000262260437}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1523051745","https://openalex.org/W1565706974","https://openalex.org/W1853233938","https://openalex.org/W1921192440","https://openalex.org/W2011456762","https://openalex.org/W2038380992","https://openalex.org/W2084641700","https://openalex.org/W2099137537","https://openalex.org/W2099329957","https://openalex.org/W2102105233","https://openalex.org/W2102927569","https://openalex.org/W2127936519","https://openalex.org/W2136658794","https://openalex.org/W2142982703","https://openalex.org/W2145084748","https://openalex.org/W2150107614","https://openalex.org/W2151271718","https://openalex.org/W2153887537","https://openalex.org/W2167334240","https://openalex.org/W2170564220"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W4308090481","https://openalex.org/W3192832106","https://openalex.org/W2383699822"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-16T07:32:37.131356","created_date":"2025-10-10T00:00:00"}