{"id":"https://openalex.org/W2045127363","doi":"https://doi.org/10.1007/s10836-005-5283-x","title":"A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters","display_name":"A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters","publication_year":2005,"publication_date":"2005-02-01","ids":{"openalex":"https://openalex.org/W2045127363","doi":"https://doi.org/10.1007/s10836-005-5283-x","mag":"2045127363"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-005-5283-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-5283-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5097006882","display_name":"F. Aza\ufffds","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Aza\ufffds","raw_affiliation_strings":["LIRMM \u2013 Univ. Montpellier / CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM \u2013 Univ. Montpellier / CNRS,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105973341","display_name":"Marcelo Lubaszewski","orcid":null},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"M. Lubaszewski","raw_affiliation_strings":["DELET/UFRGS, Porto Alegre, Brazil","DELET - UFRGS, Porto Alegre, Brazil#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DELET/UFRGS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"DELET - UFRGS, Porto Alegre, Brazil#TAB#","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054580128","display_name":"Pascal Nouet","orcid":"https://orcid.org/0000-0003-2137-2623"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Nouet","raw_affiliation_strings":["LIRMM, Univ. Montpellier/CNRS, Montpellier, France","LIRMM \u2013 Univ. Montpellier / CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM, Univ. Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM \u2013 Univ. Montpellier / CNRS,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069159925","display_name":"M. Renovell","orcid":"https://orcid.org/0000-0002-3896-8231"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Renovell","raw_affiliation_strings":["LIRMM, Univ. Montpellier/CNRS, Montpellier, France","LIRMM \u2013 Univ. Montpellier / CNRS,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LIRMM, Univ. Montpellier/CNRS, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM \u2013 Univ. Montpellier / CNRS,Montpellier,France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.14607783,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"21","issue":"1","first_page":"9","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11749","display_name":"Iterative Learning Control Systems","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8711163997650146},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6240677833557129},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5582990050315857},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5221443772315979},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5216201543807983},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5024621486663818},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.48308470845222473},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4476975202560425},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40356823801994324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35463690757751465},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3076179623603821},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13810890913009644},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.11041316390037537},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06337571144104004},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.057941317558288574}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8711163997650146},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6240677833557129},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5582990050315857},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5221443772315979},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5216201543807983},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5024621486663818},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.48308470845222473},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4476975202560425},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40356823801994324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35463690757751465},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3076179623603821},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13810890913009644},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.11041316390037537},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06337571144104004},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.057941317558288574},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-005-5283-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-5283-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-00105328v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105328","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2005, 21 (1), pp.9-16. ⟨10.1007/s10836-005-5283-x⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1925788181","https://openalex.org/W1978417474","https://openalex.org/W2050931712","https://openalex.org/W2080230903","https://openalex.org/W2100445335","https://openalex.org/W2115099700","https://openalex.org/W2131374318","https://openalex.org/W2139134478","https://openalex.org/W2147058628","https://openalex.org/W2151815468","https://openalex.org/W2163739362","https://openalex.org/W2165728972"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W4249526199","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2142405811","https://openalex.org/W2164349885"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-19T17:40:00.097472","created_date":"2025-10-10T00:00:00"}