{"id":"https://openalex.org/W2151393758","doi":"https://doi.org/10.1007/s10836-005-0974-x","title":"Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability Evaluation","display_name":"Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability Evaluation","publication_year":2005,"publication_date":"2005-07-29","ids":{"openalex":"https://openalex.org/W2151393758","doi":"https://doi.org/10.1007/s10836-005-0974-x","mag":"2151393758"},"language":"en","primary_location":{"id":"doi:10.1007/s10836-005-0974-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-0974-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036137792","display_name":"A. Ammari","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"A. Ammari","raw_affiliation_strings":["TIMA Laboratory, Qualification Group, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Qualification Group, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039765492","display_name":"K. Hadjiat","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"K. Hadjiat","raw_affiliation_strings":["TIMA Laboratory, Qualification Group, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Qualification Group, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106281569","display_name":"R. Leveugle","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. Leveugle","raw_affiliation_strings":["TIMA Laboratory, Qualification Group, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)"],"affiliations":[{"raw_affiliation_string":"TIMA Laboratory, Qualification Group, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA - Techniques de l'Informatique et de la Micro\u00e9lectronique pour l'Architecture des syst\u00e8mes int\u00e9gr\u00e9s (46 avenue F\u00e9lix Viallet\r\n38031 GRENOBLE Cedex 1 - France)","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5036137792"],"corresponding_institution_ids":["https://openalex.org/I4210087012"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.20975345,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"21","issue":"4","first_page":"365","last_page":"376"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.8030992746353149},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.623981237411499},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5922321081161499},{"id":"https://openalex.org/keywords/vhdl","display_name":"VHDL","score":0.5911037921905518},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5490818023681641},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.5188766121864319},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.43450605869293213},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4259083569049835},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3245158791542053},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.32116425037384033},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.27475348114967346},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2130039632320404},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.17274346947669983},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.142686128616333}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.8030992746353149},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.623981237411499},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5922321081161499},{"id":"https://openalex.org/C36941000","wikidata":"https://www.wikidata.org/wiki/Q209455","display_name":"VHDL","level":3,"score":0.5911037921905518},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5490818023681641},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.5188766121864319},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.43450605869293213},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4259083569049835},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3245158791542053},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32116425037384033},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.27475348114967346},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2130039632320404},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.17274346947669983},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.142686128616333},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1007/s10836-005-0974-x","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10836-005-0974-x","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00083083v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00083083","pdf_url":null,"source":{"id":"https://openalex.org/S4406922466","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2005, Volume 21, Number 4, pp.365 - 376. ⟨10.1007/s10836-005-0974-x⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1603601577","https://openalex.org/W1912583643","https://openalex.org/W2097106306","https://openalex.org/W2108164303","https://openalex.org/W2108303679","https://openalex.org/W2129998589","https://openalex.org/W2135764108","https://openalex.org/W2138158344","https://openalex.org/W2154480584","https://openalex.org/W4233983565"],"related_works":["https://openalex.org/W3018727313","https://openalex.org/W2373958571","https://openalex.org/W1526253314","https://openalex.org/W1864358311","https://openalex.org/W2163463765","https://openalex.org/W4246700523","https://openalex.org/W2007562802","https://openalex.org/W1994651680","https://openalex.org/W1608921170","https://openalex.org/W4379620210"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}