{"id":"https://openalex.org/W4392102822","doi":"https://doi.org/10.1007/s10664-023-10439-z","title":"LineFlowDP: A Deep Learning-Based Two-Phase Approach for Line-Level Defect Prediction","display_name":"LineFlowDP: A Deep Learning-Based Two-Phase Approach for Line-Level Defect Prediction","publication_year":2024,"publication_date":"2024-02-23","ids":{"openalex":"https://openalex.org/W4392102822","doi":"https://doi.org/10.1007/s10664-023-10439-z"},"language":"en","primary_location":{"id":"doi:10.1007/s10664-023-10439-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10664-023-10439-z","pdf_url":null,"source":{"id":"https://openalex.org/S109852484","display_name":"Empirical Software Engineering","issn_l":"1382-3256","issn":["1382-3256","1573-7616"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Empirical Software Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049263522","display_name":"Fengyu Yang","orcid":"https://orcid.org/0000-0003-4770-3857"},"institutions":[{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fengyu Yang","raw_affiliation_strings":["School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018443449","display_name":"Fa Zhong","orcid":"https://orcid.org/0009-0000-7364-4331"},"institutions":[{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fa Zhong","raw_affiliation_strings":["School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033881817","display_name":"Guangdong Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Guangdong Zeng","raw_affiliation_strings":["School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052316757","display_name":"Peng Xiao","orcid":"https://orcid.org/0000-0002-8717-8375"},"institutions":[{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Peng Xiao","raw_affiliation_strings":["School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China","institution_ids":["https://openalex.org/I927504317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023529874","display_name":"Wei Zheng","orcid":"https://orcid.org/0000-0002-1890-8186"},"institutions":[{"id":"https://openalex.org/I927504317","display_name":"Nanchang Hangkong University","ror":"https://ror.org/0369pvp92","country_code":"CN","type":"education","lineage":["https://openalex.org/I927504317"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Zheng","raw_affiliation_strings":["School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"School of Software, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People\u2019s Republic of China","institution_ids":["https://openalex.org/I927504317"]},{"raw_affiliation_string":"Software Testing and Evaluation Center, Nanchang Hangkong University, Nanchang, 330063, People's Republic of China","institution_ids":["https://openalex.org/I927504317"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5018443449","https://openalex.org/A5023529874","https://openalex.org/A5033881817","https://openalex.org/A5049263522","https://openalex.org/A5052316757"],"corresponding_institution_ids":["https://openalex.org/I927504317"],"apc_list":{"value":2290,"currency":"EUR","value_usd":2890},"apc_paid":null,"fwci":2.1665,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.87249708,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"29","issue":"2","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5340074300765991},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4684436619281769},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4650493860244751},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.44538795948028564},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.43402785062789917},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12938445806503296},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1020037829875946}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5340074300765991},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4684436619281769},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4650493860244751},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.44538795948028564},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.43402785062789917},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12938445806503296},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1020037829875946},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10664-023-10439-z","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10664-023-10439-z","pdf_url":null,"source":{"id":"https://openalex.org/S109852484","display_name":"Empirical Software Engineering","issn_l":"1382-3256","issn":["1382-3256","1573-7616"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Empirical Software Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":70,"referenced_works":["https://openalex.org/W1771830246","https://openalex.org/W1980948348","https://openalex.org/W1981276685","https://openalex.org/W1994616650","https://openalex.org/W2015001165","https://openalex.org/W2026417691","https://openalex.org/W2056944867","https://openalex.org/W2067436653","https://openalex.org/W2074218040","https://openalex.org/W2086464170","https://openalex.org/W2110591140","https://openalex.org/W2144344516","https://openalex.org/W2148143831","https://openalex.org/W2150113180","https://openalex.org/W2164627280","https://openalex.org/W2282821441","https://openalex.org/W2367798545","https://openalex.org/W2394841101","https://openalex.org/W2470673105","https://openalex.org/W2474835145","https://openalex.org/W2514538448","https://openalex.org/W2604314403","https://openalex.org/W2726443204","https://openalex.org/W2740130862","https://openalex.org/W2743316948","https://openalex.org/W2752746494","https://openalex.org/W2767894374","https://openalex.org/W2796215194","https://openalex.org/W2806718802","https://openalex.org/W2810453402","https://openalex.org/W2898124301","https://openalex.org/W2898435572","https://openalex.org/W2901941771","https://openalex.org/W2907492528","https://openalex.org/W2950635152","https://openalex.org/W2963499994","https://openalex.org/W2963520355","https://openalex.org/W2963548617","https://openalex.org/W2964121744","https://openalex.org/W2967780468","https://openalex.org/W2972317931","https://openalex.org/W3009761259","https://openalex.org/W3014339000","https://openalex.org/W3030391949","https://openalex.org/W3079499560","https://openalex.org/W3082994218","https://openalex.org/W3083954092","https://openalex.org/W3098278632","https://openalex.org/W3103717137","https://openalex.org/W3161071537","https://openalex.org/W3161743537","https://openalex.org/W3175995826","https://openalex.org/W3177116043","https://openalex.org/W3194346579","https://openalex.org/W3195442242","https://openalex.org/W4207068100","https://openalex.org/W4211259380","https://openalex.org/W4221033043","https://openalex.org/W4226161497","https://openalex.org/W4284667406","https://openalex.org/W4299627282","https://openalex.org/W4312856056","https://openalex.org/W4312969325","https://openalex.org/W4313563778","https://openalex.org/W4319587111","https://openalex.org/W4366327620","https://openalex.org/W4376606895","https://openalex.org/W4376652621","https://openalex.org/W4383816239","https://openalex.org/W4385245566"],"related_works":["https://openalex.org/W2731899572","https://openalex.org/W3215138031","https://openalex.org/W3009238340","https://openalex.org/W2939353110","https://openalex.org/W4321369474","https://openalex.org/W4360585206","https://openalex.org/W4285208911","https://openalex.org/W3082895349","https://openalex.org/W4213079790","https://openalex.org/W2248239756"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}