{"id":"https://openalex.org/W4409229193","doi":"https://doi.org/10.1007/s10489-025-06488-0","title":"COFA: counterfactual attention framework for trustworthy wafer map failure classification","display_name":"COFA: counterfactual attention framework for trustworthy wafer map failure classification","publication_year":2025,"publication_date":"2025-03-29","ids":{"openalex":"https://openalex.org/W4409229193","doi":"https://doi.org/10.1007/s10489-025-06488-0"},"language":"en","primary_location":{"id":"doi:10.1007/s10489-025-06488-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10489-025-06488-0","pdf_url":null,"source":{"id":"https://openalex.org/S74726891","display_name":"Applied Intelligence","issn_l":"0924-669X","issn":["0924-669X","1573-7497"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008181304","display_name":"Kaiyue Feng","orcid":null},"institutions":[{"id":"https://openalex.org/I69356397","display_name":"Xi\u2019an Jiaotong-Liverpool University","ror":"https://ror.org/03zmrmn05","country_code":"CN","type":"education","lineage":["https://openalex.org/I69356397"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kaiyue Feng","raw_affiliation_strings":["School of Advanced Technology, Xian Jiaotong-Liverpool University, 215137, Suzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Advanced Technology, Xian Jiaotong-Liverpool University, 215137, Suzhou, China","institution_ids":["https://openalex.org/I69356397"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100404643","display_name":"Jia Wang","orcid":"https://orcid.org/0000-0002-3165-7051"},"institutions":[{"id":"https://openalex.org/I69356397","display_name":"Xi\u2019an Jiaotong-Liverpool University","ror":"https://ror.org/03zmrmn05","country_code":"CN","type":"education","lineage":["https://openalex.org/I69356397"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia Wang","raw_affiliation_strings":["School of Advanced Technology, Xian Jiaotong-Liverpool University, 215137, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3165-7051","affiliations":[{"raw_affiliation_string":"School of Advanced Technology, Xian Jiaotong-Liverpool University, 215137, Suzhou, China","institution_ids":["https://openalex.org/I69356397"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113400469","display_name":"Chenke Yin","orcid":"https://orcid.org/0009-0009-2176-3967"},"institutions":[{"id":"https://openalex.org/I69356397","display_name":"Xi\u2019an Jiaotong-Liverpool University","ror":"https://ror.org/03zmrmn05","country_code":"CN","type":"education","lineage":["https://openalex.org/I69356397"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenke Yin","raw_affiliation_strings":["School of Advanced Technology, Xian Jiaotong-Liverpool University, 215137, Suzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Advanced Technology, Xian Jiaotong-Liverpool University, 215137, Suzhou, China","institution_ids":["https://openalex.org/I69356397"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053757616","display_name":"Andong Li","orcid":"https://orcid.org/0000-0003-4094-8448"},"institutions":[{"id":"https://openalex.org/I4210140129","display_name":"Empowerment Program","ror":"https://ror.org/042qv2836","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210140129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andong Li","raw_affiliation_strings":["AI Empowerment Tech. Inc., 215137, Suzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AI Empowerment Tech. Inc., 215137, Suzhou, China","institution_ids":["https://openalex.org/I4210140129"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5008181304"],"corresponding_institution_ids":["https://openalex.org/I69356397"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":4.4503,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.93920986,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"55","issue":"7","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/counterfactual-thinking","display_name":"Counterfactual thinking","score":0.8996000289916992},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8676745295524597},{"id":"https://openalex.org/keywords/trustworthiness","display_name":"Trustworthiness","score":0.8148886561393738},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.35934746265411377},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34085148572921753},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.2794531285762787},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.06193065643310547},{"id":"https://openalex.org/keywords/social-psychology","display_name":"Social psychology","score":0.048089951276779175}],"concepts":[{"id":"https://openalex.org/C108650721","wikidata":"https://www.wikidata.org/wiki/Q1783253","display_name":"Counterfactual thinking","level":2,"score":0.8996000289916992},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8676745295524597},{"id":"https://openalex.org/C153701036","wikidata":"https://www.wikidata.org/wiki/Q659974","display_name":"Trustworthiness","level":2,"score":0.8148886561393738},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.35934746265411377},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34085148572921753},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.2794531285762787},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.06193065643310547},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.048089951276779175}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10489-025-06488-0","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10489-025-06488-0","pdf_url":null,"source":{"id":"https://openalex.org/S74726891","display_name":"Applied Intelligence","issn_l":"0924-669X","issn":["0924-669X","1573-7497"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Intelligence","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[{"id":"https://openalex.org/G3022099272","display_name":null,"funder_award_id":"72401232","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W2020286945","https://openalex.org/W2044855549","https://openalex.org/W2051434216","https://openalex.org/W2063046703","https://openalex.org/W2100556411","https://openalex.org/W2122825543","https://openalex.org/W2282821441","https://openalex.org/W2752782242","https://openalex.org/W2766296277","https://openalex.org/W2792944472","https://openalex.org/W2884585870","https://openalex.org/W2962772482","https://openalex.org/W2970409000","https://openalex.org/W2990584822","https://openalex.org/W3011969759","https://openalex.org/W3017220377","https://openalex.org/W3034552520","https://openalex.org/W3082906739","https://openalex.org/W3125997628","https://openalex.org/W3202810143","https://openalex.org/W3206048862","https://openalex.org/W4210680911","https://openalex.org/W4221117831","https://openalex.org/W4285798956","https://openalex.org/W4310494058","https://openalex.org/W4320009133","https://openalex.org/W4366667365","https://openalex.org/W4375928938","https://openalex.org/W4380894358","https://openalex.org/W4391288556","https://openalex.org/W4393405614","https://openalex.org/W6601104142"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W3201448254","https://openalex.org/W4286970243","https://openalex.org/W2066431708","https://openalex.org/W4384133558","https://openalex.org/W3025615835","https://openalex.org/W173210993","https://openalex.org/W2390660599"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}