{"id":"https://openalex.org/W2023084735","doi":"https://doi.org/10.1007/s10489-009-0168-9","title":"Rule-based data mining for yield improvement in\u00a0semiconductor\u00a0manufacturing","display_name":"Rule-based data mining for yield improvement in\u00a0semiconductor\u00a0manufacturing","publication_year":2009,"publication_date":"2009-02-14","ids":{"openalex":"https://openalex.org/W2023084735","doi":"https://doi.org/10.1007/s10489-009-0168-9","mag":"2023084735"},"language":"en","primary_location":{"id":"doi:10.1007/s10489-009-0168-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10489-009-0168-9","pdf_url":null,"source":{"id":"https://openalex.org/S74726891","display_name":"Applied Intelligence","issn_l":"0924-669X","issn":["0924-669X","1573-7497"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101163155","display_name":"Sholom M. Weiss","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sholom M. Weiss","raw_affiliation_strings":["IBM, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY, 10598, USA","IBM T.J. Watson Research Center, Yorktown Heights, USA 10598#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY, 10598, USA","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Heights, USA 10598#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016967530","display_name":"Robert J. Baseman","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert J. Baseman","raw_affiliation_strings":["IBM, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY, 10598, USA","IBM T.J. Watson Research Center, Yorktown Heights, USA 10598#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY, 10598, USA","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Heights, USA 10598#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Fateh Tipu","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fateh Tipu","raw_affiliation_strings":["IBM, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY, 10598, USA","IBM T.J. Watson Research Center, Yorktown Heights, USA 10598#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY, 10598, USA","institution_ids":[]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Heights, USA 10598#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067078806","display_name":"C. Collins","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christopher N. Collins","raw_affiliation_strings":["IBM Systems and Technology Group, Hopewell Junction, NY, 12533, USA","IBM Systems and Technology Group, Hopewell Junction, USA 12533#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Hopewell Junction, NY, 12533, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Systems and Technology Group, Hopewell Junction, USA 12533#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110470089","display_name":"William A. Davies","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William A. Davies","raw_affiliation_strings":["IBM Systems and Technology Group, Hopewell Junction, NY, 12533, USA","IBM Systems and Technology Group, Hopewell Junction, USA 12533#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Hopewell Junction, NY, 12533, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Systems and Technology Group, Hopewell Junction, USA 12533#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111551325","display_name":"Raminderpal Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raminderpal Singh","raw_affiliation_strings":["IBM Systems and Technology Group, Hopewell Junction, NY, 12533, USA","IBM Systems and Technology Group, Hopewell Junction, USA 12533#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Hopewell Junction, NY, 12533, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Systems and Technology Group, Hopewell Junction, USA 12533#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007860049","display_name":"John W. Hopkins","orcid":"https://orcid.org/0000-0003-3156-5023"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John W. Hopkins","raw_affiliation_strings":["IBM Systems and Technology Group, Essex Junction, VT, 05452, USA","IBM Systems and Technology Group, Essex Junction, USA 05452"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Systems and Technology Group, Essex Junction, VT, 05452, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Systems and Technology Group, Essex Junction, USA 05452","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.9059,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.80168221,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"33","issue":"3","first_page":"318","last_page":"329"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11975","display_name":"Evolutionary Algorithms and Applications","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11975","display_name":"Evolutionary Algorithms and Applications","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9814000129699707,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8100306987762451},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.6891480684280396},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.6421822309494019},{"id":"https://openalex.org/keywords/dimension","display_name":"Dimension (graph theory)","score":0.5581708550453186},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.5487325191497803},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.4798790514469147},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.4725857973098755},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4549320936203003},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.42310112714767456},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.4206990599632263},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.40370139479637146},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.30926671624183655},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2726060748100281},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08190175890922546}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8100306987762451},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.6891480684280396},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.6421822309494019},{"id":"https://openalex.org/C33676613","wikidata":"https://www.wikidata.org/wiki/Q13415176","display_name":"Dimension (graph theory)","level":2,"score":0.5581708550453186},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.5487325191497803},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4798790514469147},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.4725857973098755},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4549320936203003},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.42310112714767456},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.4206990599632263},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.40370139479637146},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.30926671624183655},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2726060748100281},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08190175890922546},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10489-009-0168-9","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10489-009-0168-9","pdf_url":null,"source":{"id":"https://openalex.org/S74726891","display_name":"Applied Intelligence","issn_l":"0924-669X","issn":["0924-669X","1573-7497"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Intelligence","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W109846207","https://openalex.org/W1505296333","https://openalex.org/W1518726324","https://openalex.org/W1542438852","https://openalex.org/W1967470818","https://openalex.org/W1994586029","https://openalex.org/W1995972921","https://openalex.org/W2044855549","https://openalex.org/W2071095161","https://openalex.org/W2073847200","https://openalex.org/W2079488265","https://openalex.org/W2082236085","https://openalex.org/W2101265792","https://openalex.org/W2110282784","https://openalex.org/W2119503819","https://openalex.org/W2131369594","https://openalex.org/W2134696661","https://openalex.org/W2140614032","https://openalex.org/W2143515036","https://openalex.org/W2330820318","https://openalex.org/W3085162807"],"related_works":["https://openalex.org/W1979703647","https://openalex.org/W2796831252","https://openalex.org/W2917828100","https://openalex.org/W2361830001","https://openalex.org/W2146075642","https://openalex.org/W1529487987","https://openalex.org/W1483525138","https://openalex.org/W2093118422","https://openalex.org/W2359225346","https://openalex.org/W1571475181"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}