{"id":"https://openalex.org/W2148535985","doi":"https://doi.org/10.1007/s100440050010","title":"From Raster to Vectors: Extracting Visual Information from Line Drawings","display_name":"From Raster to Vectors: Extracting Visual Information from Line Drawings","publication_year":1999,"publication_date":"1999-04-01","ids":{"openalex":"https://openalex.org/W2148535985","doi":"https://doi.org/10.1007/s100440050010","mag":"2148535985"},"language":"en","primary_location":{"id":"doi:10.1007/s100440050010","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s100440050010","pdf_url":null,"source":{"id":"https://openalex.org/S45497385","display_name":"Pattern Analysis and Applications","issn_l":"1433-7541","issn":["1433-7541","1433-755X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Analysis & Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Liu Wenyin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113369","display_name":"Microsoft Research Asia (China)","ror":"https://ror.org/0300m5276","country_code":"CN","type":"company","lineage":["https://openalex.org/I1290206253","https://openalex.org/I4210113369"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liu Wenyin","raw_affiliation_strings":["Microsoft Research, Beijing, PR China, CN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microsoft Research, Beijing, PR China, CN","institution_ids":["https://openalex.org/I4210113369"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081443227","display_name":"Dov Dori","orcid":"https://orcid.org/0000-0002-2393-3124"},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Dov Dori","raw_affiliation_strings":["Faculty of Industrial Engineering and Management, Technion \u2013 Israel Institute of Technology, Haifa, Israel, IL"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Industrial Engineering and Management, Technion \u2013 Israel Institute of Technology, Haifa, Israel, IL","institution_ids":["https://openalex.org/I174306211"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.602,"has_fulltext":false,"cited_by_count":60,"citation_normalized_percentile":{"value":0.85240451,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"2","issue":"1","first_page":"10","last_page":"21"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/line-drawings","display_name":"Line drawings","score":0.7436037063598633},{"id":"https://openalex.org/keywords/raster-graphics","display_name":"Raster graphics","score":0.7402150630950928},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6447851061820984},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5961824655532837},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5731378793716431},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5111985802650452},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.48215171694755554},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.44138142466545105},{"id":"https://openalex.org/keywords/information-retrieval","display_name":"Information retrieval","score":0.3520105481147766},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.2762629985809326},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24915990233421326},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.09591424465179443}],"concepts":[{"id":"https://openalex.org/C2983864324","wikidata":"https://www.wikidata.org/wiki/Q16872183","display_name":"Line drawings","level":2,"score":0.7436037063598633},{"id":"https://openalex.org/C181844469","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster graphics","level":2,"score":0.7402150630950928},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6447851061820984},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5961824655532837},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5731378793716431},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5111985802650452},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.48215171694755554},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.44138142466545105},{"id":"https://openalex.org/C23123220","wikidata":"https://www.wikidata.org/wiki/Q816826","display_name":"Information retrieval","level":1,"score":0.3520105481147766},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.2762629985809326},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24915990233421326},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09591424465179443},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s100440050010","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s100440050010","pdf_url":null,"source":{"id":"https://openalex.org/S45497385","display_name":"Pattern Analysis and Applications","issn_l":"1433-7541","issn":["1433-7541","1433-755X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Analysis & Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1515109071","https://openalex.org/W1554039538","https://openalex.org/W1560188253","https://openalex.org/W1564419782","https://openalex.org/W1608702317","https://openalex.org/W1689342046","https://openalex.org/W1971818412","https://openalex.org/W1976678415","https://openalex.org/W1983419592","https://openalex.org/W1986755021","https://openalex.org/W1988501608","https://openalex.org/W1989545080","https://openalex.org/W1993482509","https://openalex.org/W1996342882","https://openalex.org/W1996992876","https://openalex.org/W2002081749","https://openalex.org/W2004050640","https://openalex.org/W2016130402","https://openalex.org/W2025306868","https://openalex.org/W2030041426","https://openalex.org/W2033169295","https://openalex.org/W2044630651","https://openalex.org/W2079280466","https://openalex.org/W2082666058","https://openalex.org/W2083461522","https://openalex.org/W2089945325","https://openalex.org/W2093298931","https://openalex.org/W2094845328","https://openalex.org/W2102545463","https://openalex.org/W2104241941","https://openalex.org/W2111665814","https://openalex.org/W2114282341","https://openalex.org/W2115712375","https://openalex.org/W2118311394","https://openalex.org/W2131527042","https://openalex.org/W2135162882","https://openalex.org/W2145135145","https://openalex.org/W2156978152","https://openalex.org/W2158008371","https://openalex.org/W2158240273","https://openalex.org/W2161953739"],"related_works":["https://openalex.org/W2383285980","https://openalex.org/W2550922818","https://openalex.org/W2166044122","https://openalex.org/W2055165586","https://openalex.org/W2360568979","https://openalex.org/W2162365431","https://openalex.org/W2023766982","https://openalex.org/W1996226039","https://openalex.org/W2101205476","https://openalex.org/W2392711349"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":5}],"updated_date":"2026-06-16T07:32:37.131356","created_date":"2025-10-10T00:00:00"}