{"id":"https://openalex.org/W7158774112","doi":"https://doi.org/10.1007/s10044-026-01675-2","title":"A lightweight orthogonal hybrid network with feature purification for real-time industrial fabric defect inspection","display_name":"A lightweight orthogonal hybrid network with feature purification for real-time industrial fabric defect inspection","publication_year":2026,"publication_date":"2026-04-28","ids":{"openalex":"https://openalex.org/W7158774112","doi":"https://doi.org/10.1007/s10044-026-01675-2"},"language":"en","primary_location":{"id":"doi:10.1007/s10044-026-01675-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10044-026-01675-2","pdf_url":null,"source":{"id":"https://openalex.org/S45497385","display_name":"Pattern Analysis and Applications","issn_l":"1433-7541","issn":["1433-7541","1433-755X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Analysis and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5134881776","display_name":"Ming Li","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ming Li","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5134888908","display_name":"Jie Hu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jie Hu","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5134912894","display_name":"Zhiqi He","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhiqi He","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5100627713","display_name":"Shengli Zhu","orcid":"https://orcid.org/0000-0002-0190-2626"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shengli Zhu","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.62487299,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"29","issue":"2","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.001500000013038516,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5715000033378601},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.49549999833106995},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.3605000078678131},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.3095000088214874}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.607200026512146},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5715000033378601},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5394999980926514},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.49549999833106995},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.39410001039505005},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3605000078678131},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3149999976158142},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3095000088214874},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.27630001306533813},{"id":"https://openalex.org/C180863505","wikidata":"https://www.wikidata.org/wiki/Q5439687","display_name":"Feature recognition","level":3,"score":0.24330000579357147}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10044-026-01675-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10044-026-01675-2","pdf_url":null,"source":{"id":"https://openalex.org/S45497385","display_name":"Pattern Analysis and Applications","issn_l":"1433-7541","issn":["1433-7541","1433-755X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Analysis and Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.40720781683921814,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2752782242","https://openalex.org/W2884585870","https://openalex.org/W3034368386","https://openalex.org/W3043995050","https://openalex.org/W3121106150","https://openalex.org/W4398208549","https://openalex.org/W4402687168","https://openalex.org/W4402754006","https://openalex.org/W4402857437","https://openalex.org/W4403770406","https://openalex.org/W4404877588","https://openalex.org/W4414334082","https://openalex.org/W4417438791"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-05-01T00:00:00"}