{"id":"https://openalex.org/W4413237222","doi":"https://doi.org/10.1007/s10044-025-01530-w","title":"SCSP-YOLO: a method for detecting surface defects on strip steel","display_name":"SCSP-YOLO: a method for detecting surface defects on strip steel","publication_year":2025,"publication_date":"2025-08-09","ids":{"openalex":"https://openalex.org/W4413237222","doi":"https://doi.org/10.1007/s10044-025-01530-w"},"language":"en","primary_location":{"id":"doi:10.1007/s10044-025-01530-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10044-025-01530-w","pdf_url":null,"source":{"id":"https://openalex.org/S45497385","display_name":"Pattern Analysis and Applications","issn_l":"1433-7541","issn":["1433-7541","1433-755X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Analysis and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Shiqi Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I149735164","display_name":"Hengyang Normal University","ror":"https://ror.org/006bvjm48","country_code":"CN","type":"education","lineage":["https://openalex.org/I149735164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiqi Jiang","raw_affiliation_strings":["College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China","institution_ids":["https://openalex.org/I149735164"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103046657","display_name":"Yuebing Xu","orcid":"https://orcid.org/0000-0002-0194-974X"},"institutions":[{"id":"https://openalex.org/I149735164","display_name":"Hengyang Normal University","ror":"https://ror.org/006bvjm48","country_code":"CN","type":"education","lineage":["https://openalex.org/I149735164"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuebing Xu","raw_affiliation_strings":["College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China","institution_ids":["https://openalex.org/I149735164"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033520315","display_name":"Hainan Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I149735164","display_name":"Hengyang Normal University","ror":"https://ror.org/006bvjm48","country_code":"CN","type":"education","lineage":["https://openalex.org/I149735164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hainan Lu","raw_affiliation_strings":["College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China","institution_ids":["https://openalex.org/I149735164"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053892249","display_name":"Shuai Wang","orcid":"https://orcid.org/0000-0003-3730-6401"},"institutions":[{"id":"https://openalex.org/I149735164","display_name":"Hengyang Normal University","ror":"https://ror.org/006bvjm48","country_code":"CN","type":"education","lineage":["https://openalex.org/I149735164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Wang","raw_affiliation_strings":["College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Physics and Electronic Engineering, Hengyang Normal University, Hengyang, 421002, Hunan, China","institution_ids":["https://openalex.org/I149735164"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5103046657"],"corresponding_institution_ids":["https://openalex.org/I149735164"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23998362,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"28","issue":"3","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5410654544830322},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4155653119087219},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40780892968177795},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3991687595844269},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.370564341545105},{"id":"https://openalex.org/keywords/biological-system","display_name":"Biological system","score":0.3670666515827179},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3603830933570862},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22428950667381287},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.2175465226173401},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.1952148675918579}],"concepts":[{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5410654544830322},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4155653119087219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40780892968177795},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3991687595844269},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.370564341545105},{"id":"https://openalex.org/C186060115","wikidata":"https://www.wikidata.org/wiki/Q30336093","display_name":"Biological system","level":1,"score":0.3670666515827179},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3603830933570862},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22428950667381287},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.2175465226173401},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.1952148675918579}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s10044-025-01530-w","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10044-025-01530-w","pdf_url":null,"source":{"id":"https://openalex.org/S45497385","display_name":"Pattern Analysis and Applications","issn_l":"1433-7541","issn":["1433-7541","1433-755X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Analysis and Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W1964428975","https://openalex.org/W2049466529","https://openalex.org/W2078087367","https://openalex.org/W2097946161","https://openalex.org/W2102605133","https://openalex.org/W2193145675","https://openalex.org/W2194775991","https://openalex.org/W2293457052","https://openalex.org/W2610691757","https://openalex.org/W2760310524","https://openalex.org/W2794933040","https://openalex.org/W2899263051","https://openalex.org/W2944303778","https://openalex.org/W2963037989","https://openalex.org/W2984761674","https://openalex.org/W3013392207","https://openalex.org/W3093902276","https://openalex.org/W3099211682","https://openalex.org/W3106250896","https://openalex.org/W3124804470","https://openalex.org/W3163646131","https://openalex.org/W3208023024","https://openalex.org/W4229008034","https://openalex.org/W4296211836","https://openalex.org/W4297985211","https://openalex.org/W4303709937","https://openalex.org/W4313327864","https://openalex.org/W4318255578","https://openalex.org/W4322733148","https://openalex.org/W4327652243","https://openalex.org/W4360838197","https://openalex.org/W4376116550","https://openalex.org/W4386076325","https://openalex.org/W4387058784","https://openalex.org/W4388613593","https://openalex.org/W4388807184","https://openalex.org/W4392455563","https://openalex.org/W4393308750","https://openalex.org/W4394571611","https://openalex.org/W4399803078"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}