{"id":"https://openalex.org/W3131071804","doi":"https://doi.org/10.1007/s00521-021-05810-4","title":"A novel fault diagnosis method for analog circuits with noise immunity and generalization ability","display_name":"A novel fault diagnosis method for analog circuits with noise immunity and generalization ability","publication_year":2021,"publication_date":"2021-02-20","ids":{"openalex":"https://openalex.org/W3131071804","doi":"https://doi.org/10.1007/s00521-021-05810-4","mag":"3131071804"},"language":"en","primary_location":{"id":"doi:10.1007/s00521-021-05810-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00521-021-05810-4","pdf_url":null,"source":{"id":"https://openalex.org/S147897268","display_name":"Neural Computing and Applications","issn_l":"0941-0643","issn":["0941-0643","1433-3058"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Neural Computing and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065973048","display_name":"Tianyu Gao","orcid":"https://orcid.org/0000-0002-5722-9231"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tianyu Gao","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150001, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150001, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015993488","display_name":"Jingli Yang","orcid":"https://orcid.org/0000-0003-4865-0339"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingli Yang","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150001, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150001, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087981266","display_name":"Shouda Jiang","orcid":"https://orcid.org/0000-0002-5137-821X"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shouda Jiang","raw_affiliation_strings":["Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150001, China"],"affiliations":[{"raw_affiliation_string":"Department of Automatic Test and Control, Harbin Institute of Technology, Harbin, 150001, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5065973048"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.5163,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.81956747,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"33","issue":"16","first_page":"10537","last_page":"10550"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6932799220085144},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.6428422331809998},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6270312070846558},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.617156445980072},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5971601009368896},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5083200335502625},{"id":"https://openalex.org/keywords/dimensionality-reduction","display_name":"Dimensionality reduction","score":0.5043288469314575},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.48985716700553894},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.48553821444511414},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.47052180767059326},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.46213215589523315},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.44482359290122986},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.4178701341152191},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2965611219406128},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.2782723307609558},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1393248736858368}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6932799220085144},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.6428422331809998},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6270312070846558},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.617156445980072},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5971601009368896},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5083200335502625},{"id":"https://openalex.org/C70518039","wikidata":"https://www.wikidata.org/wiki/Q16000077","display_name":"Dimensionality reduction","level":2,"score":0.5043288469314575},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.48985716700553894},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.48553821444511414},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.47052180767059326},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.46213215589523315},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.44482359290122986},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.4178701341152191},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2965611219406128},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2782723307609558},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1393248736858368},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00521-021-05810-4","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00521-021-05810-4","pdf_url":null,"source":{"id":"https://openalex.org/S147897268","display_name":"Neural Computing and Applications","issn_l":"0941-0643","issn":["0941-0643","1433-3058"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Neural Computing and Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1970328656","https://openalex.org/W1991572937","https://openalex.org/W1997244547","https://openalex.org/W2002106843","https://openalex.org/W2049693449","https://openalex.org/W2049697732","https://openalex.org/W2099383324","https://openalex.org/W2182242529","https://openalex.org/W2324336313","https://openalex.org/W2325207965","https://openalex.org/W2506178836","https://openalex.org/W2517871721","https://openalex.org/W2525089770","https://openalex.org/W2549351519","https://openalex.org/W2554566531","https://openalex.org/W2738900493","https://openalex.org/W2772840959","https://openalex.org/W2776271218","https://openalex.org/W2779098947","https://openalex.org/W2789290713","https://openalex.org/W2795765414","https://openalex.org/W2805966918","https://openalex.org/W2884028024","https://openalex.org/W2887015612","https://openalex.org/W2901123560","https://openalex.org/W2901240338","https://openalex.org/W2909732287","https://openalex.org/W2913495039","https://openalex.org/W2942030754","https://openalex.org/W2949084777","https://openalex.org/W2982344404","https://openalex.org/W3042879895"],"related_works":["https://openalex.org/W2159052453","https://openalex.org/W3013693939","https://openalex.org/W2566616303","https://openalex.org/W3131327266","https://openalex.org/W4310873165","https://openalex.org/W2355395139","https://openalex.org/W2002563186","https://openalex.org/W4285596704","https://openalex.org/W2120026622","https://openalex.org/W2477004454"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4}],"updated_date":"2026-03-17T09:09:15.849793","created_date":"2025-10-10T00:00:00"}