{"id":"https://openalex.org/W2025855399","doi":"https://doi.org/10.1007/s00521-004-0423-2","title":"Neural network-based analog fault diagnosis using testability analysis","display_name":"Neural network-based analog fault diagnosis using testability analysis","publication_year":2004,"publication_date":"2004-11-16","ids":{"openalex":"https://openalex.org/W2025855399","doi":"https://doi.org/10.1007/s00521-004-0423-2","mag":"2025855399"},"language":"en","primary_location":{"id":"doi:10.1007/s00521-004-0423-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00521-004-0423-2","pdf_url":null,"source":{"id":"https://openalex.org/S147897268","display_name":"Neural Computing and Applications","issn_l":"0941-0643","issn":["0941-0643","1433-3058"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Neural Computing and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059517598","display_name":"B. Cannas","orcid":"https://orcid.org/0000-0002-2766-0557"},"institutions":[{"id":"https://openalex.org/I172446870","display_name":"University of Cagliari","ror":"https://ror.org/003109y17","country_code":"IT","type":"education","lineage":["https://openalex.org/I172446870"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Barbara Cannas","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Cagliari, Piazza d\u2019Armi, 09123, Cagliari, Italy","University of Cagliari, Department of Electrical and Electronic Engineering, Piazza d\u2019Armi, 09123 Cagliari, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Cagliari, Piazza d\u2019Armi, 09123, Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]},{"raw_affiliation_string":"University of Cagliari, Department of Electrical and Electronic Engineering, Piazza d\u2019Armi, 09123 Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081934390","display_name":"Alessandra Fanni","orcid":"https://orcid.org/0000-0001-8604-5282"},"institutions":[{"id":"https://openalex.org/I172446870","display_name":"University of Cagliari","ror":"https://ror.org/003109y17","country_code":"IT","type":"education","lineage":["https://openalex.org/I172446870"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandra Fanni","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Cagliari, Piazza d\u2019Armi, 09123, Cagliari, Italy","University of Cagliari, Department of Electrical and Electronic Engineering, Piazza d\u2019Armi, 09123 Cagliari, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Cagliari, Piazza d\u2019Armi, 09123, Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]},{"raw_affiliation_string":"University of Cagliari, Department of Electrical and Electronic Engineering, Piazza d\u2019Armi, 09123 Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007810132","display_name":"S. Manetti","orcid":"https://orcid.org/0000-0002-5798-7147"},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Stefano Manetti","raw_affiliation_strings":["Department of Electronics and Telecommunications, University of Florence, Via S. Marta, 3, 50139, Firenze, Italy","University of Florence, Department of Electronics and Telecommunications, Via S. Marta 3, 50139-Firenze, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Telecommunications, University of Florence, Via S. Marta, 3, 50139, Firenze, Italy","institution_ids":["https://openalex.org/I45084792"]},{"raw_affiliation_string":"University of Florence, Department of Electronics and Telecommunications, Via S. Marta 3, 50139-Firenze, Italy","institution_ids":["https://openalex.org/I45084792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078463546","display_name":"Augusto Montisci","orcid":"https://orcid.org/0000-0003-0008-2985"},"institutions":[{"id":"https://openalex.org/I172446870","display_name":"University of Cagliari","ror":"https://ror.org/003109y17","country_code":"IT","type":"education","lineage":["https://openalex.org/I172446870"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Augusto Montisci","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Cagliari, Piazza d\u2019Armi, 09123, Cagliari, Italy","University of Cagliari, Department of Electrical and Electronic Engineering, Piazza d\u2019Armi, 09123 Cagliari, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Cagliari, Piazza d\u2019Armi, 09123, Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]},{"raw_affiliation_string":"University of Cagliari, Department of Electrical and Electronic Engineering, Piazza d\u2019Armi, 09123 Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074559814","display_name":"Maria Cristina Piccirilli","orcid":"https://orcid.org/0000-0002-9955-1990"},"institutions":[{"id":"https://openalex.org/I45084792","display_name":"University of Florence","ror":"https://ror.org/04jr1s763","country_code":"IT","type":"education","lineage":["https://openalex.org/I45084792"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Maria Cristina Piccirilli","raw_affiliation_strings":["Department of Electronics and Telecommunications, University of Florence, Via S. Marta, 3, 50139, Firenze, Italy","University of Florence, Department of Electronics and Telecommunications, Via S. Marta 3, 50139-Firenze, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Telecommunications, University of Florence, Via S. Marta, 3, 50139, Firenze, Italy","institution_ids":["https://openalex.org/I45084792"]},{"raw_affiliation_string":"University of Florence, Department of Electronics and Telecommunications, Via S. Marta 3, 50139-Firenze, Italy","institution_ids":["https://openalex.org/I45084792"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5059517598"],"corresponding_institution_ids":["https://openalex.org/I172446870"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.7949,"has_fulltext":false,"cited_by_count":36,"citation_normalized_percentile":{"value":0.71747893,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"13","issue":"4","first_page":"288","last_page":"298"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8561561107635498},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.742709755897522},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7254847288131714},{"id":"https://openalex.org/keywords/ambiguity","display_name":"Ambiguity","score":0.6527606248855591},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6346434950828552},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6119122505187988},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5022172927856445},{"id":"https://openalex.org/keywords/computational-science-and-engineering","display_name":"Computational Science and Engineering","score":0.47842246294021606},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.4482382833957672},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4078487753868103},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3809210956096649},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3368457555770874},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2696637511253357},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.20547598600387573},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10882827639579773}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8561561107635498},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.742709755897522},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7254847288131714},{"id":"https://openalex.org/C2780522230","wikidata":"https://www.wikidata.org/wiki/Q1140419","display_name":"Ambiguity","level":2,"score":0.6527606248855591},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6346434950828552},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6119122505187988},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5022172927856445},{"id":"https://openalex.org/C68597687","wikidata":"https://www.wikidata.org/wiki/Q362601","display_name":"Computational Science and Engineering","level":2,"score":0.47842246294021606},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.4482382833957672},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4078487753868103},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3809210956096649},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3368457555770874},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2696637511253357},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.20547598600387573},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10882827639579773},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/s00521-004-0423-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00521-004-0423-2","pdf_url":null,"source":{"id":"https://openalex.org/S147897268","display_name":"Neural Computing and Applications","issn_l":"0941-0643","issn":["0941-0643","1433-3058"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Neural Computing and Applications","raw_type":"journal-article"},{"id":"pmh:oai:flore.unifi.it:2158/8651","is_oa":false,"landing_page_url":"http://hdl.handle.net/2158/8651","pdf_url":null,"source":{"id":"https://openalex.org/S4306402033","display_name":"Florence Research (University of Florence)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45084792","host_organization_name":"University of Florence","host_organization_lineage":["https://openalex.org/I45084792"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:iris.unica.it:11584/102650","is_oa":false,"landing_page_url":"http://hdl.handle.net/11584/102650","pdf_url":null,"source":{"id":"https://openalex.org/S4377196293","display_name":"UNICA IRIS Institutional Research Information System (University of Cagliari)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172446870","host_organization_name":"University of Cagliari","host_organization_lineage":["https://openalex.org/I172446870"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W140221739","https://openalex.org/W1532286644","https://openalex.org/W1545133867","https://openalex.org/W1969926384","https://openalex.org/W1984414914","https://openalex.org/W2017675162","https://openalex.org/W2088576840","https://openalex.org/W2101550795","https://openalex.org/W2101617778","https://openalex.org/W2108921639","https://openalex.org/W2110273585","https://openalex.org/W2111008192","https://openalex.org/W2113753693","https://openalex.org/W2121537291","https://openalex.org/W2121821621","https://openalex.org/W2124528349","https://openalex.org/W2129206880","https://openalex.org/W2129633763","https://openalex.org/W2139134478","https://openalex.org/W2141652275","https://openalex.org/W2168398742","https://openalex.org/W2176520170","https://openalex.org/W2343303969","https://openalex.org/W3017143921"],"related_works":["https://openalex.org/W2353179089","https://openalex.org/W2393524141","https://openalex.org/W2923538289","https://openalex.org/W2365130684","https://openalex.org/W2353125546","https://openalex.org/W2370255574","https://openalex.org/W2470643824","https://openalex.org/W2169676947","https://openalex.org/W2167145637","https://openalex.org/W2385628479"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":6},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-07T08:38:57.713557","created_date":"2025-10-10T00:00:00"}