{"id":"https://openalex.org/W309991581","doi":"https://doi.org/10.1007/s00502-007-0480-1","title":"Investigation and error analysis of a measurement method for determining the resonance frequency of PICCs","display_name":"Investigation and error analysis of a measurement method for determining the resonance frequency of PICCs","publication_year":2007,"publication_date":"2007-11-01","ids":{"openalex":"https://openalex.org/W309991581","doi":"https://doi.org/10.1007/s00502-007-0480-1","mag":"309991581"},"language":"en","primary_location":{"id":"doi:10.1007/s00502-007-0480-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00502-007-0480-1","pdf_url":null,"source":{"id":"https://openalex.org/S36874608","display_name":"e+i Elektrotechnik und Informationstechnik","issn_l":"0932-383X","issn":["0932-383X","1613-7620"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"e & i Elektrotechnik und Informationstechnik","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"W. Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Lin","raw_affiliation_strings":["Institut f\u00fcr Hochfrequenztechnik und Funksysteme, Leibniz Universit\u00e4t Hannover, Hannover, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Hochfrequenztechnik und Funksysteme, Leibniz Universit\u00e4t Hannover, Hannover, Germany","institution_ids":["https://openalex.org/I114112103"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042473372","display_name":"Bernd Geck","orcid":"https://orcid.org/0000-0002-6454-0271"},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Geck","raw_affiliation_strings":["Institut f\u00fcr Hochfrequenztechnik und Funksysteme, Leibniz Universit\u00e4t Hannover, Hannover, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Hochfrequenztechnik und Funksysteme, Leibniz Universit\u00e4t Hannover, Hannover, Germany","institution_ids":["https://openalex.org/I114112103"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018928288","display_name":"H. Eul","orcid":null},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. Eul","raw_affiliation_strings":["Institut f\u00fcr Hochfrequenztechnik und Funksysteme, Leibniz Universit\u00e4t Hannover, Hannover, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Hochfrequenztechnik und Funksysteme, Leibniz Universit\u00e4t Hannover, Hannover, Germany","institution_ids":["https://openalex.org/I114112103"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002718710","display_name":"C. Lansch\u00fctzer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Ch. Lansch\u00fctzer","raw_affiliation_strings":["Schloss Metahof, Infineon Technologies Austria AG, Graz, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Schloss Metahof, Infineon Technologies Austria AG, Graz, Austria","institution_ids":["https://openalex.org/I4210131793"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009917724","display_name":"P. Raggam","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131793","display_name":"Infineon Technologies (Austria)","ror":"https://ror.org/03msng824","country_code":"AT","type":"company","lineage":["https://openalex.org/I137594350","https://openalex.org/I4210131793"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"P. Raggam","raw_affiliation_strings":["Schloss Metahof, Infineon Technologies Austria AG, Graz, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Schloss Metahof, Infineon Technologies Austria AG, Graz, Austria","institution_ids":["https://openalex.org/I4210131793"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":3490,"currency":"USD","value_usd":3490},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.01769311,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"124","issue":"11","first_page":"353","last_page":"358"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9850999712944031,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resonance","display_name":"Resonance (particle physics)","score":0.7152371406555176},{"id":"https://openalex.org/keywords/frequency-analysis","display_name":"Frequency analysis","score":0.564697265625},{"id":"https://openalex.org/keywords/error-analysis","display_name":"Error analysis","score":0.5376215577125549},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.46820977330207825},{"id":"https://openalex.org/keywords/rlc-circuit","display_name":"RLC circuit","score":0.4226500689983368},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.410990834236145},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.38455522060394287},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38303735852241516},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28982433676719666},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.27294260263442993},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22198647260665894},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20510193705558777},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1760312020778656},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15636911988258362},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.08689263463020325},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.08209121227264404},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06491273641586304}],"concepts":[{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.7152371406555176},{"id":"https://openalex.org/C97118885","wikidata":"https://www.wikidata.org/wiki/Q565636","display_name":"Frequency analysis","level":2,"score":0.564697265625},{"id":"https://openalex.org/C3018824978","wikidata":"https://www.wikidata.org/wiki/Q2894891","display_name":"Error analysis","level":2,"score":0.5376215577125549},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.46820977330207825},{"id":"https://openalex.org/C89880566","wikidata":"https://www.wikidata.org/wiki/Q323477","display_name":"RLC circuit","level":4,"score":0.4226500689983368},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.410990834236145},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.38455522060394287},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38303735852241516},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28982433676719666},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.27294260263442993},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22198647260665894},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20510193705558777},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1760312020778656},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15636911988258362},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.08689263463020325},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.08209121227264404},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06491273641586304},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00502-007-0480-1","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00502-007-0480-1","pdf_url":null,"source":{"id":"https://openalex.org/S36874608","display_name":"e+i Elektrotechnik und Informationstechnik","issn_l":"0932-383X","issn":["0932-383X","1613-7620"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"e & i Elektrotechnik und Informationstechnik","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2478208588","https://openalex.org/W4213129614"],"related_works":["https://openalex.org/W2391711312","https://openalex.org/W2360371044","https://openalex.org/W2382259615","https://openalex.org/W1564381903","https://openalex.org/W2027491236","https://openalex.org/W2366670077","https://openalex.org/W2347703721","https://openalex.org/W2374739525","https://openalex.org/W2351545781","https://openalex.org/W1997826558"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}