{"id":"https://openalex.org/W4387409966","doi":"https://doi.org/10.1007/s00500-023-09274-7","title":"Reliability assessment with uncertain thresholds considering degradation and shock","display_name":"Reliability assessment with uncertain thresholds considering degradation and shock","publication_year":2023,"publication_date":"2023-10-06","ids":{"openalex":"https://openalex.org/W4387409966","doi":"https://doi.org/10.1007/s00500-023-09274-7"},"language":"en","primary_location":{"id":"doi:10.1007/s00500-023-09274-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00500-023-09274-7","pdf_url":null,"source":{"id":"https://openalex.org/S65753830","display_name":"Soft Computing","issn_l":"1432-7643","issn":["1432-7643","1433-7479"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Soft Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086856048","display_name":"Chun Wei","orcid":"https://orcid.org/0000-0003-4228-2555"},"institutions":[{"id":"https://openalex.org/I5422934","display_name":"Shanxi Datong University","ror":"https://ror.org/03s8xc553","country_code":"CN","type":"education","lineage":["https://openalex.org/I5422934"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chun Wei","raw_affiliation_strings":["College of Physics and Electronics Science, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Physics and Electronics Science, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China","institution_ids":["https://openalex.org/I5422934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101818273","display_name":"Haiyan Shi","orcid":"https://orcid.org/0000-0002-5719-8893"},"institutions":[{"id":"https://openalex.org/I5422934","display_name":"Shanxi Datong University","ror":"https://ror.org/03s8xc553","country_code":"CN","type":"education","lineage":["https://openalex.org/I5422934"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haiyan Shi","raw_affiliation_strings":["College of Mathematics and Statistics, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China"],"raw_orcid":"https://orcid.org/0000-0002-5719-8893","affiliations":[{"raw_affiliation_string":"College of Mathematics and Statistics, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China","institution_ids":["https://openalex.org/I5422934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062141520","display_name":"Zhiqiang Zhang","orcid":"https://orcid.org/0000-0002-8736-8144"},"institutions":[{"id":"https://openalex.org/I5422934","display_name":"Shanxi Datong University","ror":"https://ror.org/03s8xc553","country_code":"CN","type":"education","lineage":["https://openalex.org/I5422934"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiqiang Zhang","raw_affiliation_strings":["College of Mathematics and Statistics, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mathematics and Statistics, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China","institution_ids":["https://openalex.org/I5422934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075942118","display_name":"Baoliang Liu","orcid":"https://orcid.org/0000-0001-6414-2292"},"institutions":[{"id":"https://openalex.org/I5422934","display_name":"Shanxi Datong University","ror":"https://ror.org/03s8xc553","country_code":"CN","type":"education","lineage":["https://openalex.org/I5422934"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baoliang Liu","raw_affiliation_strings":["College of Mathematics and Statistics, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mathematics and Statistics, Shanxi Datong University, Xingyun Street, Datong, 037009, Shanxi, China","institution_ids":["https://openalex.org/I5422934"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101869010","display_name":"Lei Wei","orcid":"https://orcid.org/0000-0003-3823-821X"},"institutions":[{"id":"https://openalex.org/I5422934","display_name":"Shanxi Datong University","ror":"https://ror.org/03s8xc553","country_code":"CN","type":"education","lineage":["https://openalex.org/I5422934"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Wei","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Shanxi Datong University, Tongquan Road, Datong, 037003, Shanxi, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Shanxi Datong University, Tongquan Road, Datong, 037003, Shanxi, China","institution_ids":["https://openalex.org/I5422934"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5101818273"],"corresponding_institution_ids":["https://openalex.org/I5422934"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.3949,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64939245,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"27","issue":"24","first_page":"18441","last_page":"18450"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8357329368591309},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7852839231491089},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5946323871612549},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.594314694404602},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4837758243083954},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.4566880464553833},{"id":"https://openalex.org/keywords/sample-size-determination","display_name":"Sample size determination","score":0.4373646378517151},{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.4349365830421448},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.42772793769836426},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.42281416058540344},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.28571242094039917},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2312810719013214},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19448760151863098},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15614259243011475},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13222870230674744}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8357329368591309},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7852839231491089},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5946323871612549},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.594314694404602},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4837758243083954},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.4566880464553833},{"id":"https://openalex.org/C129848803","wikidata":"https://www.wikidata.org/wiki/Q2564360","display_name":"Sample size determination","level":2,"score":0.4373646378517151},{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.4349365830421448},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.42772793769836426},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.42281416058540344},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.28571242094039917},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2312810719013214},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19448760151863098},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15614259243011475},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13222870230674744},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00500-023-09274-7","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00500-023-09274-7","pdf_url":null,"source":{"id":"https://openalex.org/S65753830","display_name":"Soft Computing","issn_l":"1432-7643","issn":["1432-7643","1433-7479"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Soft Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2183984443","display_name":null,"funder_award_id":"2021K2","funder_id":"https://openalex.org/F4320322535","funder_display_name":"Shanxi Datong University"},{"id":"https://openalex.org/G3454022735","display_name":null,"funder_award_id":"2020K9","funder_id":"https://openalex.org/F4320322535","funder_display_name":"Shanxi Datong University"}],"funders":[{"id":"https://openalex.org/F4320322535","display_name":"Shanxi Datong University","ror":"https://ror.org/03s8xc553"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1956824178","https://openalex.org/W1989306300","https://openalex.org/W1993152301","https://openalex.org/W2021971251","https://openalex.org/W2078622645","https://openalex.org/W2088078669","https://openalex.org/W2088555868","https://openalex.org/W2116816365","https://openalex.org/W2151176860","https://openalex.org/W2310466376","https://openalex.org/W2476680574","https://openalex.org/W2526576891","https://openalex.org/W2561574304","https://openalex.org/W2803460043","https://openalex.org/W2883241587","https://openalex.org/W2888415761","https://openalex.org/W2896380870","https://openalex.org/W2905239412","https://openalex.org/W2947513710","https://openalex.org/W2979940159","https://openalex.org/W3047619594","https://openalex.org/W3120536968","https://openalex.org/W3169478186","https://openalex.org/W3195999629","https://openalex.org/W3213594874","https://openalex.org/W4206830167","https://openalex.org/W4211007335"],"related_works":["https://openalex.org/W2950573157","https://openalex.org/W2809744190","https://openalex.org/W4225795411","https://openalex.org/W2511013388","https://openalex.org/W4378695326","https://openalex.org/W2044192478","https://openalex.org/W29956273","https://openalex.org/W2356599848","https://openalex.org/W2064861618","https://openalex.org/W2063338624"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}