{"id":"https://openalex.org/W1964876000","doi":"https://doi.org/10.1007/s00138-012-0425-5","title":"Defect detection in periodic patterns using a multi-band-pass filter","display_name":"Defect detection in periodic patterns using a multi-band-pass filter","publication_year":2012,"publication_date":"2012-05-10","ids":{"openalex":"https://openalex.org/W1964876000","doi":"https://doi.org/10.1007/s00138-012-0425-5","mag":"1964876000"},"language":"en","primary_location":{"id":"doi:10.1007/s00138-012-0425-5","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s00138-012-0425-5","pdf_url":"https://link.springer.com/content/pdf/10.1007/s00138-012-0425-5.pdf","source":{"id":"https://openalex.org/S27728525","display_name":"Machine Vision and Applications","issn_l":"0932-8092","issn":["0932-8092","1432-1769"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Machine Vision and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s00138-012-0425-5.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111999092","display_name":"Zong-Da Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094216","display_name":"National Synchrotron Radiation Research Center","ror":"https://ror.org/00k575643","country_code":"TW","type":"facility","lineage":["https://openalex.org/I4210094216","https://openalex.org/I4210128167"]},{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Zong-Da Tsai","raw_affiliation_strings":["The Department of Power Mechanical Engineering, National Tsing Hua University, 101 Sec. 2, Kuang-Fu Road, 30013, Hsinchu, Taiwan, ROC","The National Synchrotron Radiation Research Center, 101, Hsin-Ann Rd., Science-Base Industrial Park, 30076, Hsinchu, Taiwan, ROC"],"affiliations":[{"raw_affiliation_string":"The Department of Power Mechanical Engineering, National Tsing Hua University, 101 Sec. 2, Kuang-Fu Road, 30013, Hsinchu, Taiwan, ROC","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"The National Synchrotron Radiation Research Center, 101, Hsin-Ann Rd., Science-Base Industrial Park, 30076, Hsinchu, Taiwan, ROC","institution_ids":["https://openalex.org/I4210094216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043925049","display_name":"Ming-Hwei Perng","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Hwei Perng","raw_affiliation_strings":["The Department of Power Mechanical Engineering, National Tsing Hua University, 101 Sec. 2, Kuang-Fu Road, 30013, Hsinchu, Taiwan, ROC"],"affiliations":[{"raw_affiliation_string":"The Department of Power Mechanical Engineering, National Tsing Hua University, 101 Sec. 2, Kuang-Fu Road, 30013, Hsinchu, Taiwan, ROC","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5111999092"],"corresponding_institution_ids":["https://openalex.org/I25846049","https://openalex.org/I4210094216"],"apc_list":{"value":2490,"currency":"EUR","value_usd":3090},"apc_paid":{"value":2490,"currency":"EUR","value_usd":3090},"fwci":2.0543,"has_fulltext":true,"cited_by_count":17,"citation_normalized_percentile":{"value":0.87148757,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"24","issue":"3","first_page":"551","last_page":"565"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.6249587535858154},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.5682501792907715},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5610292553901672},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5279682874679565},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5157282948493958},{"id":"https://openalex.org/keywords/low-pass-filter","display_name":"Low-pass filter","score":0.49612483382225037},{"id":"https://openalex.org/keywords/computational-complexity-theory","display_name":"Computational complexity theory","score":0.4402415156364441},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3627578020095825},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3231164216995239},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3045145273208618},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.06775754690170288}],"concepts":[{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.6249587535858154},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.5682501792907715},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5610292553901672},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5279682874679565},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5157282948493958},{"id":"https://openalex.org/C44682112","wikidata":"https://www.wikidata.org/wiki/Q918242","display_name":"Low-pass filter","level":3,"score":0.49612483382225037},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.4402415156364441},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3627578020095825},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3231164216995239},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3045145273208618},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.06775754690170288},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00138-012-0425-5","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s00138-012-0425-5","pdf_url":"https://link.springer.com/content/pdf/10.1007/s00138-012-0425-5.pdf","source":{"id":"https://openalex.org/S27728525","display_name":"Machine Vision and Applications","issn_l":"0932-8092","issn":["0932-8092","1432-1769"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Machine Vision and Applications","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s00138-012-0425-5","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s00138-012-0425-5","pdf_url":"https://link.springer.com/content/pdf/10.1007/s00138-012-0425-5.pdf","source":{"id":"https://openalex.org/S27728525","display_name":"Machine Vision and Applications","issn_l":"0932-8092","issn":["0932-8092","1432-1769"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Machine Vision and Applications","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1964876000.pdf","grobid_xml":"https://content.openalex.org/works/W1964876000.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W49287587","https://openalex.org/W123426918","https://openalex.org/W1588043677","https://openalex.org/W1766888123","https://openalex.org/W1963970230","https://openalex.org/W1965872453","https://openalex.org/W1968427760","https://openalex.org/W1969003616","https://openalex.org/W1979328687","https://openalex.org/W1983895434","https://openalex.org/W1987056043","https://openalex.org/W1993954744","https://openalex.org/W1995257636","https://openalex.org/W1998515699","https://openalex.org/W2000820311","https://openalex.org/W2001053943","https://openalex.org/W2005219590","https://openalex.org/W2007864695","https://openalex.org/W2011406694","https://openalex.org/W2013927912","https://openalex.org/W2016078606","https://openalex.org/W2034856412","https://openalex.org/W2036939719","https://openalex.org/W2044001825","https://openalex.org/W2054278237","https://openalex.org/W2067173330","https://openalex.org/W2070274015","https://openalex.org/W2077924235","https://openalex.org/W2080773993","https://openalex.org/W2086375288","https://openalex.org/W2089445868","https://openalex.org/W2097946161","https://openalex.org/W2104078550","https://openalex.org/W2134638399","https://openalex.org/W2156915894","https://openalex.org/W2163233725","https://openalex.org/W2169029660","https://openalex.org/W3022908749","https://openalex.org/W4243205489","https://openalex.org/W4255391993"],"related_works":["https://openalex.org/W2532234348","https://openalex.org/W108084911","https://openalex.org/W2182785089","https://openalex.org/W4312178642","https://openalex.org/W2393440248","https://openalex.org/W4387838477","https://openalex.org/W2067193074","https://openalex.org/W2161045342","https://openalex.org/W2943002782","https://openalex.org/W2474346877"],"abstract_inverted_index":{"This":[0],"study":[1],"presents":[2],"a":[3,14,19,38,56,133,155,164],"rapid":[4],"and":[5,116,141],"reliable":[6],"technique":[7,61],"for":[8,111],"the":[9,24,28,43,59,82,87,119,149,169,172,176],"inspection":[10],"of":[11,27,42,45,118,175],"defects":[12,46],"in":[13,37,86,136],"two-dimensional":[15,156],"periodic":[16,178],"image":[17],"using":[18],"multi-band-pass":[20,76,121],"filter.":[21],"More":[22],"importantly,":[23],"blurring":[25,137],"effect":[26],"resultant":[29],"defect":[30],"images":[31],"is":[32,72,104,123,128,132,145,152,180],"significantly":[33,105],"reduced,":[34],"thereby":[35],"resulting":[36],"more":[39],"precise":[40],"estimation":[41],"size":[44],"when":[47,81,107],"compared":[48,108],"with":[49,78,97,109],"methods":[50],"that":[51,130,147,171],"use":[52],"low-pass":[53],"filtering.":[54],"As":[55],"filter-based":[57],"approach,":[58],"present":[60],"does":[62],"not":[63],"require":[64],"an":[65],"alignment":[66],"procedure.":[67],"In":[68],"addition,":[69],"computational":[70,102,142],"time":[71,103],"reduced":[73,106,162],"by":[74],"implementing":[75],"filters":[77,83],"convolution":[79],"masks":[80],"are":[84],"operated":[85],"spatial":[88],"domain.":[89],"Further,":[90],"this":[91],"approach":[92,151],"involves":[93],"mostly":[94],"addition":[95],"operations":[96],"very":[98],"few":[99],"multiplications;":[100],"hence,":[101],"those":[110],"existing":[112],"approaches.":[113],"The":[114],"efficiency":[115],"effectiveness":[117],"proposed":[120,150],"filter":[122],"verified":[124],"through":[125],"examples.":[126],"It":[127,144],"observed":[129],"there":[131],"significant":[134],"reduction":[135],"effects,":[138,140],"leakage":[139],"effort.":[143],"noteworthy":[146],"though":[148],"presented":[153],"as":[154],"filtering":[157,166],"problem,":[158],"it":[159],"can":[160],"be":[161],"to":[163],"one-dimensional":[165],"problem":[167],"under":[168],"assumption":[170],"misorientation":[173],"angle":[174],"inspected":[177],"pattern":[179],"negligibly":[181],"small.":[182]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}